Erbium silicided Schottky Source/Drain Silicon Nanowire N-Metal–Oxide–Semiconductor Field-Effect Transistors
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Veröffentlicht in: | Japanese Journal of Applied Physics 2008-04, Vol.47 (4S), p.3277 |
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container_issue | 4S |
container_start_page | 3277 |
container_title | Japanese Journal of Applied Physics |
container_volume | 47 |
creator | Tan, Eu Jin Pey, Kin Leong Singh, Navab Chi, Dong-Zhi Lo, Guo-Qiang Lee, Pooi See Hoe, Keat-Mun Chin, Yoke King Cui, Guang Da |
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doi_str_mv | 10.1143/JJAP.47.3277 |
format | Article |
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language | eng |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | Erbium silicided Schottky Source/Drain Silicon Nanowire N-Metal–Oxide–Semiconductor Field-Effect Transistors |
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