Effect of Inner Electrode on Reliability of (Zn,Mg)TiO 3 -Based Multilayer Ceramic Capacitor
In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO 3 -based multilayer ceramic capacitor (MLCC) sintered at 925 °C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is i...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2006-07, Vol.45 (7R), p.5859 |
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| creator | Lee, Wen-His Su, Chi-Yi Lee, Ying Chieh Yang, Jackey Yang, Tong PinLin, Shih |
| description | In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO
3
-based multilayer ceramic capacitor (MLCC) sintered at 925 °C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is inversely proportional to Ag content in the Pd/Ag inner electrode. Ag
+1
diffusion into the (Zn,Mg)TiO
3
-based MLCC during cofiring at 925 °C for 2 h and Ag
+1
migration at 140 °C against 200 V are both responsible for the short lifetime of the (Zn,Mg)TiO
3
-based MLCC, particularly the latter factor. A (Zn,Mg)TiO
3
-based MLCC with high Ag content in the inner electrode Ag/Pd=99/01 exhibits the shortest lifetime (13 h), and the effect of Ag
+1
migration is markedly enhanced when the activation energy of the (Zn,Mg)TiO
3
dielectric is greatly lowered due to the excessive formation of oxygen vacancies and the semiconducting Zn
2
TiO
4
phase when Ag
+
substitutes for Zn
+2
during co-firing. |
| doi_str_mv | 10.1143/JJAP.45.5859 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_45_5859</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_45_5859</sourcerecordid><originalsourceid>FETCH-LOGICAL-c150t-d1872f71462c9347726a1947eccc4076fd1a191245c035c05707b98b6a69afd3</originalsourceid><addsrcrecordid>eNotkF1LwzAUhoMoWKd3_oBcKqwzJ81HezlL1Y2NifRKhJKmiUS6diTdRf-9LXpxeHngnJfDg9A9kBUAS5622_X7ivEVT3l2gSJImIwZEfwSRYRQiFlG6TW6CeFnQsEZROirsNboAfcWb7rOeFy0E_q-Mbjv8Idpnapd64Zx3nj47Jb778fSHXCC42cVTIP353ZwrRqn09x4dXQa5-qktBt6f4uurGqDufvPBSpfijJ_i3eH102-3sUaOBniBlJJrQQmqM6mnyUVCjImjdaaESlsAxMDZVyTZBouiayztBZKZMo2yQIt_2q170PwxlYn747KjxWQahZTzWIqxqtZTPILDMZUCQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Effect of Inner Electrode on Reliability of (Zn,Mg)TiO 3 -Based Multilayer Ceramic Capacitor</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>Lee, Wen-His ; Su, Chi-Yi ; Lee, Ying Chieh ; Yang, Jackey ; Yang, Tong ; PinLin, Shih</creator><creatorcontrib>Lee, Wen-His ; Su, Chi-Yi ; Lee, Ying Chieh ; Yang, Jackey ; Yang, Tong ; PinLin, Shih</creatorcontrib><description>In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO
3
-based multilayer ceramic capacitor (MLCC) sintered at 925 °C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is inversely proportional to Ag content in the Pd/Ag inner electrode. Ag
+1
diffusion into the (Zn,Mg)TiO
3
-based MLCC during cofiring at 925 °C for 2 h and Ag
+1
migration at 140 °C against 200 V are both responsible for the short lifetime of the (Zn,Mg)TiO
3
-based MLCC, particularly the latter factor. A (Zn,Mg)TiO
3
-based MLCC with high Ag content in the inner electrode Ag/Pd=99/01 exhibits the shortest lifetime (13 h), and the effect of Ag
+1
migration is markedly enhanced when the activation energy of the (Zn,Mg)TiO
3
dielectric is greatly lowered due to the excessive formation of oxygen vacancies and the semiconducting Zn
2
TiO
4
phase when Ag
+
substitutes for Zn
+2
during co-firing.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.45.5859</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2006-07, Vol.45 (7R), p.5859</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c150t-d1872f71462c9347726a1947eccc4076fd1a191245c035c05707b98b6a69afd3</citedby><cites>FETCH-LOGICAL-c150t-d1872f71462c9347726a1947eccc4076fd1a191245c035c05707b98b6a69afd3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27903,27904</link.rule.ids></links><search><creatorcontrib>Lee, Wen-His</creatorcontrib><creatorcontrib>Su, Chi-Yi</creatorcontrib><creatorcontrib>Lee, Ying Chieh</creatorcontrib><creatorcontrib>Yang, Jackey</creatorcontrib><creatorcontrib>Yang, Tong</creatorcontrib><creatorcontrib>PinLin, Shih</creatorcontrib><title>Effect of Inner Electrode on Reliability of (Zn,Mg)TiO 3 -Based Multilayer Ceramic Capacitor</title><title>Japanese Journal of Applied Physics</title><description>In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO
3
-based multilayer ceramic capacitor (MLCC) sintered at 925 °C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is inversely proportional to Ag content in the Pd/Ag inner electrode. Ag
+1
diffusion into the (Zn,Mg)TiO
3
-based MLCC during cofiring at 925 °C for 2 h and Ag
+1
migration at 140 °C against 200 V are both responsible for the short lifetime of the (Zn,Mg)TiO
3
-based MLCC, particularly the latter factor. A (Zn,Mg)TiO
3
-based MLCC with high Ag content in the inner electrode Ag/Pd=99/01 exhibits the shortest lifetime (13 h), and the effect of Ag
+1
migration is markedly enhanced when the activation energy of the (Zn,Mg)TiO
3
dielectric is greatly lowered due to the excessive formation of oxygen vacancies and the semiconducting Zn
2
TiO
4
phase when Ag
+
substitutes for Zn
+2
during co-firing.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><recordid>eNotkF1LwzAUhoMoWKd3_oBcKqwzJ81HezlL1Y2NifRKhJKmiUS6diTdRf-9LXpxeHngnJfDg9A9kBUAS5622_X7ivEVT3l2gSJImIwZEfwSRYRQiFlG6TW6CeFnQsEZROirsNboAfcWb7rOeFy0E_q-Mbjv8Idpnapd64Zx3nj47Jb778fSHXCC42cVTIP353ZwrRqn09x4dXQa5-qktBt6f4uurGqDufvPBSpfijJ_i3eH102-3sUaOBniBlJJrQQmqM6mnyUVCjImjdaaESlsAxMDZVyTZBouiayztBZKZMo2yQIt_2q170PwxlYn747KjxWQahZTzWIqxqtZTPILDMZUCQ</recordid><startdate>20060707</startdate><enddate>20060707</enddate><creator>Lee, Wen-His</creator><creator>Su, Chi-Yi</creator><creator>Lee, Ying Chieh</creator><creator>Yang, Jackey</creator><creator>Yang, Tong</creator><creator>PinLin, Shih</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20060707</creationdate><title>Effect of Inner Electrode on Reliability of (Zn,Mg)TiO 3 -Based Multilayer Ceramic Capacitor</title><author>Lee, Wen-His ; Su, Chi-Yi ; Lee, Ying Chieh ; Yang, Jackey ; Yang, Tong ; PinLin, Shih</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c150t-d1872f71462c9347726a1947eccc4076fd1a191245c035c05707b98b6a69afd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lee, Wen-His</creatorcontrib><creatorcontrib>Su, Chi-Yi</creatorcontrib><creatorcontrib>Lee, Ying Chieh</creatorcontrib><creatorcontrib>Yang, Jackey</creatorcontrib><creatorcontrib>Yang, Tong</creatorcontrib><creatorcontrib>PinLin, Shih</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lee, Wen-His</au><au>Su, Chi-Yi</au><au>Lee, Ying Chieh</au><au>Yang, Jackey</au><au>Yang, Tong</au><au>PinLin, Shih</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of Inner Electrode on Reliability of (Zn,Mg)TiO 3 -Based Multilayer Ceramic Capacitor</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2006-07-07</date><risdate>2006</risdate><volume>45</volume><issue>7R</issue><spage>5859</spage><pages>5859-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><abstract>In this study, different proportions of silver-palladium alloy acting as the inner electrode were adopted to a (Zn,Mg)TiO
3
-based multilayer ceramic capacitor (MLCC) sintered at 925 °C for 2 h to evaluate the effect of the inner electrode on reliability. The main results show that the lifetime is inversely proportional to Ag content in the Pd/Ag inner electrode. Ag
+1
diffusion into the (Zn,Mg)TiO
3
-based MLCC during cofiring at 925 °C for 2 h and Ag
+1
migration at 140 °C against 200 V are both responsible for the short lifetime of the (Zn,Mg)TiO
3
-based MLCC, particularly the latter factor. A (Zn,Mg)TiO
3
-based MLCC with high Ag content in the inner electrode Ag/Pd=99/01 exhibits the shortest lifetime (13 h), and the effect of Ag
+1
migration is markedly enhanced when the activation energy of the (Zn,Mg)TiO
3
dielectric is greatly lowered due to the excessive formation of oxygen vacancies and the semiconducting Zn
2
TiO
4
phase when Ag
+
substitutes for Zn
+2
during co-firing.</abstract><doi>10.1143/JJAP.45.5859</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 2006-07, Vol.45 (7R), p.5859 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_45_5859 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| title | Effect of Inner Electrode on Reliability of (Zn,Mg)TiO 3 -Based Multilayer Ceramic Capacitor |
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