Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry
Standard ellipsometry is usually applied for the evaluation of an optical isotropic system, but it is insufficient to analyze light reflected from an anisotropic system such as a liquid crystal (LC) cell. In order to analyze the light reflected from the LC cell, the standard ellipsometry system comb...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2001-05, Vol.40 (5R), p.3288 |
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| container_issue | 5R |
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| container_title | Japanese Journal of Applied Physics |
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| creator | Satoshi Okutani, Satoshi Okutani Munehiro Kimura, Munehiro Kimura Hirokazu Toriumi, Hirokazu Toriumi Ken-ichi Akao, Ken-ichi Akao Toshiyasu Tadokoro, Toshiyasu Tadokoro Tadashi Akahane, Tadashi Akahane |
| description | Standard ellipsometry is usually applied for the evaluation of an optical isotropic system, but it is insufficient to analyze light reflected from an anisotropic system such as a liquid crystal (LC) cell. In order to analyze the light reflected from the LC cell, the standard ellipsometry system combined with the photo elastic modulator was extended to renormalized ellipsometry by introducing the definition of the renormalized reflection coefficients without any modification of the conventional experimental procedure. The experimental results such as the ellipsometric angles versus the rotation angle of the LC cell and the dependence of the ellipsometric angles on the applied electric field were in good agreement with the theoretical results based on renormalized ellipsometry. From these results, it was confirmed that renormalized ellipsometry was quite a useful technique to analyze the totally reflected light from the LC cell. |
| doi_str_mv | 10.1143/JJAP.40.3288 |
| format | Article |
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In order to analyze the light reflected from the LC cell, the standard ellipsometry system combined with the photo elastic modulator was extended to renormalized ellipsometry by introducing the definition of the renormalized reflection coefficients without any modification of the conventional experimental procedure. The experimental results such as the ellipsometric angles versus the rotation angle of the LC cell and the dependence of the ellipsometric angles on the applied electric field were in good agreement with the theoretical results based on renormalized ellipsometry. From these results, it was confirmed that renormalized ellipsometry was quite a useful technique to analyze the totally reflected light from the LC cell.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.40.3288</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2001-05, Vol.40 (5R), p.3288</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c381t-10ee297563b865307305a5efc1af3b2ad28c24bbcfd1d44853d69c2af1bf87eb3</citedby><cites>FETCH-LOGICAL-c381t-10ee297563b865307305a5efc1af3b2ad28c24bbcfd1d44853d69c2af1bf87eb3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Satoshi Okutani, Satoshi Okutani</creatorcontrib><creatorcontrib>Munehiro Kimura, Munehiro Kimura</creatorcontrib><creatorcontrib>Hirokazu Toriumi, Hirokazu Toriumi</creatorcontrib><creatorcontrib>Ken-ichi Akao, Ken-ichi Akao</creatorcontrib><creatorcontrib>Toshiyasu Tadokoro, Toshiyasu Tadokoro</creatorcontrib><creatorcontrib>Tadashi Akahane, Tadashi Akahane</creatorcontrib><title>Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry</title><title>Japanese Journal of Applied Physics</title><description>Standard ellipsometry is usually applied for the evaluation of an optical isotropic system, but it is insufficient to analyze light reflected from an anisotropic system such as a liquid crystal (LC) cell. In order to analyze the light reflected from the LC cell, the standard ellipsometry system combined with the photo elastic modulator was extended to renormalized ellipsometry by introducing the definition of the renormalized reflection coefficients without any modification of the conventional experimental procedure. The experimental results such as the ellipsometric angles versus the rotation angle of the LC cell and the dependence of the ellipsometric angles on the applied electric field were in good agreement with the theoretical results based on renormalized ellipsometry. 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In order to analyze the light reflected from the LC cell, the standard ellipsometry system combined with the photo elastic modulator was extended to renormalized ellipsometry by introducing the definition of the renormalized reflection coefficients without any modification of the conventional experimental procedure. The experimental results such as the ellipsometric angles versus the rotation angle of the LC cell and the dependence of the ellipsometric angles on the applied electric field were in good agreement with the theoretical results based on renormalized ellipsometry. From these results, it was confirmed that renormalized ellipsometry was quite a useful technique to analyze the totally reflected light from the LC cell.</abstract><doi>10.1143/JJAP.40.3288</doi></addata></record> |
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| ispartof | Japanese Journal of Applied Physics, 2001-05, Vol.40 (5R), p.3288 |
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| language | eng |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| title | Analysis of Totally Reflected Light from Liquid Crystal Cell using Renormalized Ellipsometry |
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