High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110°C
We present results from excimer laser processed poly-silicon thin film transistors fabricated on a plastic substrate. Except for the temperature rise during excimer laser irradiation for crystallization, the highest processing temperature that the substrate was subjected to was 110°C. Transistor fie...
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Veröffentlicht in: | Japanese Journal of Applied Physics 2000-03, Vol.39 (3A), p.L179 |
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container_issue | 3A |
container_start_page | L179 |
container_title | Japanese Journal of Applied Physics |
container_volume | 39 |
creator | Gosain, Dharam Pal Noguchi, Takashi Usui, Setsuo |
description | We present results from excimer laser processed poly-silicon
thin film transistors fabricated on a plastic substrate. Except for
the temperature rise during excimer laser irradiation for
crystallization, the highest processing temperature that the
substrate was subjected to was 110°C. Transistor field-effect
mobility of 250 cm
2
/V·s and sub-threshold swing of
0.16 V/decade were measured in these devices. These are the best
characteristics reported to date for a thin film transistor (TFT) on
a plastic substrate. The performance is attributed to our optimized
laser crystallization process of helium sputtered Si films,
laser-assisted low-temperature doping processes, and transient
annealing. |
doi_str_mv | 10.1143/JJAP.39.L179 |
format | Article |
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thin film transistors fabricated on a plastic substrate. Except for
the temperature rise during excimer laser irradiation for
crystallization, the highest processing temperature that the
substrate was subjected to was 110°C. Transistor field-effect
mobility of 250 cm
2
/V·s and sub-threshold swing of
0.16 V/decade were measured in these devices. These are the best
characteristics reported to date for a thin film transistor (TFT) on
a plastic substrate. The performance is attributed to our optimized
laser crystallization process of helium sputtered Si films,
laser-assisted low-temperature doping processes, and transient
annealing.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.39.L179</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 2000-03, Vol.39 (3A), p.L179</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c148t-632d1313d014e195e8233d78cceff2c82f25c23f9521c4133eb02a226aaef1443</citedby><cites>FETCH-LOGICAL-c148t-632d1313d014e195e8233d78cceff2c82f25c23f9521c4133eb02a226aaef1443</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Gosain, Dharam Pal</creatorcontrib><creatorcontrib>Noguchi, Takashi</creatorcontrib><creatorcontrib>Usui, Setsuo</creatorcontrib><title>High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110°C</title><title>Japanese Journal of Applied Physics</title><description>We present results from excimer laser processed poly-silicon
thin film transistors fabricated on a plastic substrate. Except for
the temperature rise during excimer laser irradiation for
crystallization, the highest processing temperature that the
substrate was subjected to was 110°C. Transistor field-effect
mobility of 250 cm
2
/V·s and sub-threshold swing of
0.16 V/decade were measured in these devices. These are the best
characteristics reported to date for a thin film transistor (TFT) on
a plastic substrate. The performance is attributed to our optimized
laser crystallization process of helium sputtered Si films,
laser-assisted low-temperature doping processes, and transient
annealing.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNotkEFOwzAURC0EEqWw4wD_AKT4-ztpsqwqSqmKqERYR45jt4Y0qWx30VtxBk5GI1iN5o00i8fYPfIJoqTH1Wq2mVAxWeO0uGAjJDlNJM_SSzbiXGAiCyGu2U0In-eapRJH7Gvptjt47WvXuniCcuc6WLh2D6VXXXAh9j7AQtXeaRVNA30HCjatCtFpeD_WIfozBxUH7HttQnDdFkqzP5jzcvQGeguI_Od7fsuurGqDufvPMftYPJXzZbJ-e36Zz9aJRpnHJCPRICE1HKXBIjW5IGqmudbGWqFzYUWqBdkiFaglEpmaCyVEppSxKCWN2cPfr_Z9CN7Y6uDdXvlThbwaRFWDqIqKahBFv-WYW-8</recordid><startdate>20000315</startdate><enddate>20000315</enddate><creator>Gosain, Dharam Pal</creator><creator>Noguchi, Takashi</creator><creator>Usui, Setsuo</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20000315</creationdate><title>High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110°C</title><author>Gosain, Dharam Pal ; Noguchi, Takashi ; Usui, Setsuo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c148t-632d1313d014e195e8233d78cceff2c82f25c23f9521c4133eb02a226aaef1443</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gosain, Dharam Pal</creatorcontrib><creatorcontrib>Noguchi, Takashi</creatorcontrib><creatorcontrib>Usui, Setsuo</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gosain, Dharam Pal</au><au>Noguchi, Takashi</au><au>Usui, Setsuo</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110°C</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>2000-03-15</date><risdate>2000</risdate><volume>39</volume><issue>3A</issue><spage>L179</spage><pages>L179-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><abstract>We present results from excimer laser processed poly-silicon
thin film transistors fabricated on a plastic substrate. Except for
the temperature rise during excimer laser irradiation for
crystallization, the highest processing temperature that the
substrate was subjected to was 110°C. Transistor field-effect
mobility of 250 cm
2
/V·s and sub-threshold swing of
0.16 V/decade were measured in these devices. These are the best
characteristics reported to date for a thin film transistor (TFT) on
a plastic substrate. The performance is attributed to our optimized
laser crystallization process of helium sputtered Si films,
laser-assisted low-temperature doping processes, and transient
annealing.</abstract><doi>10.1143/JJAP.39.L179</doi></addata></record> |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
title | High Mobility Thin Film Transistors Fabricated on a Plastic Substrate at a Processing Temperature of 110°C |
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