Nature of tip-sample interaction in dynamic mode atomic force microscopy

The dependence curve of the resonance frequency shift of a dynamic mode atomic force microscope (AFM) cantilever on the distance between the tip and the sample is examined. For a system with clean semiconductor sample and a metal-coated tip, the obtained curve exhibited a larger frequency shift comp...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Japanese Journal of Applied Physics 1997-12, Vol.36 (12A), p.7354-7357
Hauptverfasser:	KAGESHIMA, M, IMAYOSHI, T, YAMADA, H, NAKAYAMA, K, SAKAMA, H, KAWAZU, A
Format:	Artikel
Sprache:	eng
Schlagworte:	Atomic force microscopes Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components and techniques
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!