Nature of tip-sample interaction in dynamic mode atomic force microscopy
The dependence curve of the resonance frequency shift of a dynamic mode atomic force microscope (AFM) cantilever on the distance between the tip and the sample is examined. For a system with clean semiconductor sample and a metal-coated tip, the obtained curve exhibited a larger frequency shift comp...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1997-12, Vol.36 (12A), p.7354-7357 |
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| container_end_page | 7357 |
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| container_issue | 12A |
| container_start_page | 7354 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 36 |
| creator | KAGESHIMA, M IMAYOSHI, T YAMADA, H NAKAYAMA, K SAKAMA, H KAWAZU, A |
| description | The dependence curve of the resonance frequency shift of a dynamic mode atomic force microscope (AFM) cantilever on the distance between the tip and the sample is examined. For a system with clean semiconductor sample and a metal-coated tip, the obtained curve exhibited a larger frequency shift compared to one with a uncoated Si tip, and an increasing deviation from van der Waals characteristics as the separation decreased. This is due to an additional attractive force which becomes dominant at a small separation. This force is considered to play a crucial role in high-resolution imaging of semiconductor surfaces with a dynamic mode AFM. |
| doi_str_mv | 10.1143/JJAP.36.7354 |
| format | Article |
| fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_36_7354</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2137569</sourcerecordid><originalsourceid>FETCH-LOGICAL-c410t-331d1f1ab3566613fd05c9d1561bc2c9ee3e8c284d87d9d3ad4447e74c0996f03</originalsourceid><addsrcrecordid>eNo9kE1LxDAQhoMoWFdv_oAcPNo100nS5rgsuuuyqAc9l2w-oNI2JamH_ntbVjzNM_C-M_AQcg9sDcDx6XDYfKxRrksU_IJkgLzMOZPikmSMFZBzVRTX5Cal73mVgkNG9m96_ImOBk_HZsiT7obW0aYfXdRmbEI_M7VTr7vG0C5YR_UYFvYhGkdniiGZMEy35MrrNrm7v7kiXy_Pn9t9fnzfvW43x9xwYGOOCBY86BMKKSWgt0wYZUFIOJnCKOfQVaaouK1KqyxqyzkvXckNU0p6hivyeL67PE7R-XqITafjVAOrFwv1YqFGWS8W5vjDOT7oZHTro-5Nk_47BWAppMJf-qVcgA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Nature of tip-sample interaction in dynamic mode atomic force microscopy</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>KAGESHIMA, M ; IMAYOSHI, T ; YAMADA, H ; NAKAYAMA, K ; SAKAMA, H ; KAWAZU, A</creator><creatorcontrib>KAGESHIMA, M ; IMAYOSHI, T ; YAMADA, H ; NAKAYAMA, K ; SAKAMA, H ; KAWAZU, A</creatorcontrib><description>The dependence curve of the resonance frequency shift of a dynamic mode atomic force microscope (AFM) cantilever on the distance between the tip and the sample is examined. For a system with clean semiconductor sample and a metal-coated tip, the obtained curve exhibited a larger frequency shift compared to one with a uncoated Si tip, and an increasing deviation from van der Waals characteristics as the separation decreased. This is due to an additional attractive force which becomes dominant at a small separation. This force is considered to play a crucial role in high-resolution imaging of semiconductor surfaces with a dynamic mode AFM.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.36.7354</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Atomic force microscopes ; Exact sciences and technology ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Physics ; Scanning probe microscopes, components and techniques</subject><ispartof>Japanese Journal of Applied Physics, 1997-12, Vol.36 (12A), p.7354-7357</ispartof><rights>1998 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c410t-331d1f1ab3566613fd05c9d1561bc2c9ee3e8c284d87d9d3ad4447e74c0996f03</citedby><cites>FETCH-LOGICAL-c410t-331d1f1ab3566613fd05c9d1561bc2c9ee3e8c284d87d9d3ad4447e74c0996f03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=2137569$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>KAGESHIMA, M</creatorcontrib><creatorcontrib>IMAYOSHI, T</creatorcontrib><creatorcontrib>YAMADA, H</creatorcontrib><creatorcontrib>NAKAYAMA, K</creatorcontrib><creatorcontrib>SAKAMA, H</creatorcontrib><creatorcontrib>KAWAZU, A</creatorcontrib><title>Nature of tip-sample interaction in dynamic mode atomic force microscopy</title><title>Japanese Journal of Applied Physics</title><description>The dependence curve of the resonance frequency shift of a dynamic mode atomic force microscope (AFM) cantilever on the distance between the tip and the sample is examined. For a system with clean semiconductor sample and a metal-coated tip, the obtained curve exhibited a larger frequency shift compared to one with a uncoated Si tip, and an increasing deviation from van der Waals characteristics as the separation decreased. This is due to an additional attractive force which becomes dominant at a small separation. This force is considered to play a crucial role in high-resolution imaging of semiconductor surfaces with a dynamic mode AFM.</description><subject>Atomic force microscopes</subject><subject>Exact sciences and technology</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Physics</subject><subject>Scanning probe microscopes, components and techniques</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1997</creationdate><recordtype>article</recordtype><recordid>eNo9kE1LxDAQhoMoWFdv_oAcPNo100nS5rgsuuuyqAc9l2w-oNI2JamH_ntbVjzNM_C-M_AQcg9sDcDx6XDYfKxRrksU_IJkgLzMOZPikmSMFZBzVRTX5Cal73mVgkNG9m96_ImOBk_HZsiT7obW0aYfXdRmbEI_M7VTr7vG0C5YR_UYFvYhGkdniiGZMEy35MrrNrm7v7kiXy_Pn9t9fnzfvW43x9xwYGOOCBY86BMKKSWgt0wYZUFIOJnCKOfQVaaouK1KqyxqyzkvXckNU0p6hivyeL67PE7R-XqITafjVAOrFwv1YqFGWS8W5vjDOT7oZHTro-5Nk_47BWAppMJf-qVcgA</recordid><startdate>19971201</startdate><enddate>19971201</enddate><creator>KAGESHIMA, M</creator><creator>IMAYOSHI, T</creator><creator>YAMADA, H</creator><creator>NAKAYAMA, K</creator><creator>SAKAMA, H</creator><creator>KAWAZU, A</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19971201</creationdate><title>Nature of tip-sample interaction in dynamic mode atomic force microscopy</title><author>KAGESHIMA, M ; IMAYOSHI, T ; YAMADA, H ; NAKAYAMA, K ; SAKAMA, H ; KAWAZU, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c410t-331d1f1ab3566613fd05c9d1561bc2c9ee3e8c284d87d9d3ad4447e74c0996f03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1997</creationdate><topic>Atomic force microscopes</topic><topic>Exact sciences and technology</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Physics</topic><topic>Scanning probe microscopes, components and techniques</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KAGESHIMA, M</creatorcontrib><creatorcontrib>IMAYOSHI, T</creatorcontrib><creatorcontrib>YAMADA, H</creatorcontrib><creatorcontrib>NAKAYAMA, K</creatorcontrib><creatorcontrib>SAKAMA, H</creatorcontrib><creatorcontrib>KAWAZU, A</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KAGESHIMA, M</au><au>IMAYOSHI, T</au><au>YAMADA, H</au><au>NAKAYAMA, K</au><au>SAKAMA, H</au><au>KAWAZU, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Nature of tip-sample interaction in dynamic mode atomic force microscopy</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1997-12-01</date><risdate>1997</risdate><volume>36</volume><issue>12A</issue><spage>7354</spage><epage>7357</epage><pages>7354-7357</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>The dependence curve of the resonance frequency shift of a dynamic mode atomic force microscope (AFM) cantilever on the distance between the tip and the sample is examined. For a system with clean semiconductor sample and a metal-coated tip, the obtained curve exhibited a larger frequency shift compared to one with a uncoated Si tip, and an increasing deviation from van der Waals characteristics as the separation decreased. This is due to an additional attractive force which becomes dominant at a small separation. This force is considered to play a crucial role in high-resolution imaging of semiconductor surfaces with a dynamic mode AFM.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/JJAP.36.7354</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 1997-12, Vol.36 (12A), p.7354-7357 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_36_7354 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Atomic force microscopes Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Physics Scanning probe microscopes, components and techniques |
| title | Nature of tip-sample interaction in dynamic mode atomic force microscopy |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T00%3A15%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Nature%20of%20tip-sample%20interaction%20in%20dynamic%20mode%20atomic%20force%20microscopy&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=KAGESHIMA,%20M&rft.date=1997-12-01&rft.volume=36&rft.issue=12A&rft.spage=7354&rft.epage=7357&rft.pages=7354-7357&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPA5&rft_id=info:doi/10.1143/JJAP.36.7354&rft_dat=%3Cpascalfrancis_cross%3E2137569%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |