Characteristics of YBCO Josephson junction prepared by a focused ion beam technique
In order to clarify the formation and working mechanism of the YBCO Josephson junction, the dependence of the junction characteristics on the oxygen pressure during YBCO deposition was observed. An MgO substrate was damaged by a focused ion beam (FIB) and then a YBCO film was deposited on the substr...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1996, Vol.35 (1A), p.90-92 |
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Format: | Artikel |
Sprache: | eng |
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