Anisotropic diffusion of Si adsorbates on a Si(001) surface

The behavior of Si adsorbates evaporated on a Si(001) surface is studied by tracing their diffusion caused by radiative heating. A reflection electron microscope (REM) is used to observe denuded zones that are created at the terrace edge and grow with heating time. Diffusion constants of Si adsorbat...

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Veröffentlicht in:	Japanese Journal of Applied Physics 1995-07, Vol.34 (7A), p.3637-3641
Hauptverfasser:	DOI, T, ICHIKAWA, M
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Diffusion in solids Diffusion of impurities Diffusion interface formation Exact sciences and technology Physics Solid surfaces and solid-solid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Transport properties of condensed matter (nonelectronic)
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