Atomically resolved image of cleaved GaAs(110) surface observed with an ultrahigh vacuum atomic force microscope
The first demonstration of atomic-resolution imaging of a GaAs(110) surface with an ultrahigh vacuum atomic force microscope (UHV AFM) is performed. A rectangular lattice with spacing of 5.7±0.5 Å×4.0±0.4 Å is resolved. This result suggests that the UHV AFM has potential capability for investigating...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1994, Vol.33 (1A), p.L52-L54 |
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| Format: | Artikel |
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| container_end_page | L54 |
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| container_issue | 1A |
| container_start_page | L52 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 33 |
| creator | OHTA, M SUGAWARA, Y HONTANI, K MORITA, S OSAKA, F SUZUKI, M NAGAOKA, H MISHIMA, S OKADA, T |
| description | The first demonstration of atomic-resolution imaging of a GaAs(110) surface with an ultrahigh vacuum atomic force microscope (UHV AFM) is performed. A rectangular lattice with spacing of 5.7±0.5 Å×4.0±0.4 Å is resolved. This result suggests that the UHV AFM has potential capability for investigating semiconductor surfaces having dangling bonds on an atomic scale. |
| doi_str_mv | 10.1143/jjap.33.l52 |
| format | Article |
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A rectangular lattice with spacing of 5.7±0.5 Å×4.0±0.4 Å is resolved. 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A rectangular lattice with spacing of 5.7±0.5 Å×4.0±0.4 Å is resolved. This result suggests that the UHV AFM has potential capability for investigating semiconductor surfaces having dangling bonds on an atomic scale.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.33.l52</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 1994, Vol.33 (1A), p.L52-L54 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_33_L52 |
| source | Institute of Physics Journals |
| subjects | Condensed matter: structure, mechanical and thermal properties Electron, ion, and scanning probe microscopy Exact sciences and technology Physics Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | Atomically resolved image of cleaved GaAs(110) surface observed with an ultrahigh vacuum atomic force microscope |
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