Analysis of smear noise in interline-CCD image sensor with gate-free isolation structure

A gate-free isolation structure for smear noise suppression is proposed for an interline transfer charge-coupled device (IL CCD) image sensor. Analysis of the smear components shows that the signal-to-smear ratio in the proposed structure is 30 dB larger than that in a conventional structure, and is...

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Veröffentlicht in:	Japanese Journal of Applied Physics 1991-12, Vol.30 (12B), p.3621-3626
Hauptverfasser:	ONO, H, OZAKI, T, TANAKA, H, KAWAMOTO, Y
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Electronics Exact sciences and technology Imaging devices Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Online-Zugang:	Volltext
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