Numerical analysis of the optical response characteristics of thin film transistor addressed liquid crystal displays
A simulation method is proposed to analyze the optical response characteristics of TFT-LCDs. Our method using an equivalent circuit takes into account the time and voltage dependence of the dielectric constant of the TN-LC cell. We obtain good agreement between simulations of the optical response ch...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1990-12, Vol.29 (12), p.L2384-L2387 |
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| container_end_page | L2387 |
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| container_issue | 12 |
| container_start_page | L2384 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 29 |
| creator | NUMANO, Y HAYAMA, M YAMAZAKI, T |
| description | A simulation method is proposed to analyze the optical response characteristics of TFT-LCDs. Our method using an equivalent circuit takes into account the time and voltage dependence of the dielectric constant of the TN-LC cell. We obtain good agreement between simulations of the optical response characteristics of the TN-LC cell and experimental results. The 30 Hz flicker, which appears in the optical rise state of the TFT-LCD, is analyzed by using our method. Our method enables a large amount of calculation of the optical response characteristics of TFT-LCDs at high speed. |
| doi_str_mv | 10.1143/jjap.29.l2384 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 1990-12, Vol.29 (12), p.L2384-L2387 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_29_L2384 |
| source | Institute of Physics Journals |
| subjects | Applied sciences Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
| title | Numerical analysis of the optical response characteristics of thin film transistor addressed liquid crystal displays |
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