Charge Losses of N-Doped Trench Cells

N-doped trench cells exhibit increased charge losses during the refresh time interval when the cell plate voltage is reduced below 2.5 V. This effect is attributed to tunneling of electrons from the valence band of the n-region into the conduction band thus contributing to the leakage current of the...

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Veröffentlicht in:	Japanese Journal of Applied Physics 1988-11, Vol.27 (11A), p.L2223
Hauptverfasser:	Risch, Lothar, Maly, Rotraud, Bergner, Wolfgang, Kircher, Roland
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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