Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method
Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1987, Vol.26 (1), p.L50-L52 |
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container_title | Japanese Journal of Applied Physics |
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creator | KOBAYASHI, T TONOUCHI, M SAKAGUCHI, Y YAMASHITA, T |
description | Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics. |
doi_str_mv | 10.1143/jjap.26.l50 |
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Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.26.l50</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Applied sciences ; Diodes ; Electronics ; Exact sciences and technology ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Japanese Journal of Applied Physics, 1987, Vol.26 (1), p.L50-L52</ispartof><rights>1988 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-ae65d7b1ceba827050651e6a8a38c1c11aee17cdf7e057881ea0756dcdd6253d3</citedby><cites>FETCH-LOGICAL-c355t-ae65d7b1ceba827050651e6a8a38c1c11aee17cdf7e057881ea0756dcdd6253d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4009,27902,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=7563389$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>KOBAYASHI, T</creatorcontrib><creatorcontrib>TONOUCHI, M</creatorcontrib><creatorcontrib>SAKAGUCHI, Y</creatorcontrib><creatorcontrib>YAMASHITA, T</creatorcontrib><title>Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method</title><title>Japanese Journal of Applied Physics</title><description>Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.</description><subject>Applied sciences</subject><subject>Diodes</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. 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Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KOBAYASHI, T</creatorcontrib><creatorcontrib>TONOUCHI, M</creatorcontrib><creatorcontrib>SAKAGUCHI, Y</creatorcontrib><creatorcontrib>YAMASHITA, T</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KOBAYASHI, T</au><au>TONOUCHI, M</au><au>SAKAGUCHI, Y</au><au>YAMASHITA, T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1987</date><risdate>1987</risdate><volume>26</volume><issue>1</issue><spage>L50</spage><epage>L52</epage><pages>L50-L52</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.26.l50</doi></addata></record> |
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source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
subjects | Applied sciences Diodes Electronics Exact sciences and technology Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices |
title | Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method |
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