Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method

Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Japanese Journal of Applied Physics 1987, Vol.26 (1), p.L50-L52
Hauptverfasser: KOBAYASHI, T, TONOUCHI, M, SAKAGUCHI, Y, YAMASHITA, T
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page L52
container_issue 1
container_start_page L50
container_title Japanese Journal of Applied Physics
container_volume 26
creator KOBAYASHI, T
TONOUCHI, M
SAKAGUCHI, Y
YAMASHITA, T
description Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.
doi_str_mv 10.1143/jjap.26.l50
format Article
fullrecord <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_26_L50</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>7563389</sourcerecordid><originalsourceid>FETCH-LOGICAL-c355t-ae65d7b1ceba827050651e6a8a38c1c11aee17cdf7e057881ea0756dcdd6253d3</originalsourceid><addsrcrecordid>eNo9kM9PwjAcxRujiYie_Ad68KDRQbuu7TgSggjhV4Kel-_aDopjW9qSyH_vCMbTyyd57-XlIfRISY_ShPX3e2h6seiVnFyhDmWJjBIi-DXqEBLTKBnE8S26837fouAJ7aDtuLEBfiyUeJkv-4vtqr-xzxMY-rdptX7B4VhVprTVFi-mG7xRuzqE7xPWttYGF5A7qyAYjfMTtlUwzh2bFiPfHENL59zBhF2t79FNAaU3D3_aRV_v48_RRzRfTaaj4TxSjPMQgRFcy5wqk0MaS8Lb9dQISIGliipKwRgqlS6kIVymKTVAJBdaaS1izjTrotdLr3K1984UWePsAdwpoyQ7f5TNZsN1Fotszknrfrq4G_AKysJBpaz_j7TNjKUD9gsixGft</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>KOBAYASHI, T ; TONOUCHI, M ; SAKAGUCHI, Y ; YAMASHITA, T</creator><creatorcontrib>KOBAYASHI, T ; TONOUCHI, M ; SAKAGUCHI, Y ; YAMASHITA, T</creatorcontrib><description>Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.26.l50</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Applied sciences ; Diodes ; Electronics ; Exact sciences and technology ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><ispartof>Japanese Journal of Applied Physics, 1987, Vol.26 (1), p.L50-L52</ispartof><rights>1988 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c355t-ae65d7b1ceba827050651e6a8a38c1c11aee17cdf7e057881ea0756dcdd6253d3</citedby><cites>FETCH-LOGICAL-c355t-ae65d7b1ceba827050651e6a8a38c1c11aee17cdf7e057881ea0756dcdd6253d3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,4009,27902,27903,27904</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&amp;idt=7563389$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>KOBAYASHI, T</creatorcontrib><creatorcontrib>TONOUCHI, M</creatorcontrib><creatorcontrib>SAKAGUCHI, Y</creatorcontrib><creatorcontrib>YAMASHITA, T</creatorcontrib><title>Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method</title><title>Japanese Journal of Applied Physics</title><description>Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.</description><subject>Applied sciences</subject><subject>Diodes</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNo9kM9PwjAcxRujiYie_Ad68KDRQbuu7TgSggjhV4Kel-_aDopjW9qSyH_vCMbTyyd57-XlIfRISY_ShPX3e2h6seiVnFyhDmWJjBIi-DXqEBLTKBnE8S26837fouAJ7aDtuLEBfiyUeJkv-4vtqr-xzxMY-rdptX7B4VhVprTVFi-mG7xRuzqE7xPWttYGF5A7qyAYjfMTtlUwzh2bFiPfHENL59zBhF2t79FNAaU3D3_aRV_v48_RRzRfTaaj4TxSjPMQgRFcy5wqk0MaS8Lb9dQISIGliipKwRgqlS6kIVymKTVAJBdaaS1izjTrotdLr3K1984UWePsAdwpoyQ7f5TNZsN1Fotszknrfrq4G_AKysJBpaz_j7TNjKUD9gsixGft</recordid><startdate>1987</startdate><enddate>1987</enddate><creator>KOBAYASHI, T</creator><creator>TONOUCHI, M</creator><creator>SAKAGUCHI, Y</creator><creator>YAMASHITA, T</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>1987</creationdate><title>Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method</title><author>KOBAYASHI, T ; TONOUCHI, M ; SAKAGUCHI, Y ; YAMASHITA, T</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c355t-ae65d7b1ceba827050651e6a8a38c1c11aee17cdf7e057881ea0756dcdd6253d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>Applied sciences</topic><topic>Diodes</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>KOBAYASHI, T</creatorcontrib><creatorcontrib>TONOUCHI, M</creatorcontrib><creatorcontrib>SAKAGUCHI, Y</creatorcontrib><creatorcontrib>YAMASHITA, T</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>KOBAYASHI, T</au><au>TONOUCHI, M</au><au>SAKAGUCHI, Y</au><au>YAMASHITA, T</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1987</date><risdate>1987</risdate><volume>26</volume><issue>1</issue><spage>L50</spage><epage>L52</epage><pages>L50-L52</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>Epitaxial NbN/MgO/Si(GaAs or InP) MIS structures were prepared by the sputtering technique. Introduction of the interrupted-sputtering method facilitated the growth of epitaxial NbN/MgO/Si heterostructures for almost one monolayer MgO layer. GaAs and InP substrates, however, never fostered epitaxial overgrowth of NbN until the MgO layer became thicker than 3 nm. Diodes fabricated from these wafers exhibited good tunneling MIS Schottky characteristics.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.26.l50</doi></addata></record>
fulltext fulltext
identifier ISSN: 0021-4922
ispartof Japanese Journal of Applied Physics, 1987, Vol.26 (1), p.L50-L52
issn 0021-4922
1347-4065
language eng
recordid cdi_crossref_primary_10_1143_JJAP_26_L50
source IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link
subjects Applied sciences
Diodes
Electronics
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
title Epitaxial NbN/MgO/Si(GaAs,InP) tunneling MIS Schottky diode fabricated by interrupted-sputtering method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T12%3A14%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Epitaxial%20NbN/MgO/Si(GaAs,InP)%20tunneling%20MIS%20Schottky%20diode%20fabricated%20by%20interrupted-sputtering%20method&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=KOBAYASHI,%20T&rft.date=1987&rft.volume=26&rft.issue=1&rft.spage=L50&rft.epage=L52&rft.pages=L50-L52&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPA5&rft_id=info:doi/10.1143/jjap.26.l50&rft_dat=%3Cpascalfrancis_cross%3E7563389%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true