Effect of a Ti interlayer in evaporated Co―Cr/Fe―Ni double-layer film
The effect of a Ti interlayer in an evaporated Co–Cr/Fe–Ni double-layer film on structural and magnetic properties and recording and playback characteristics has been investigated. The inplane coercivity of the Fe–Ni underlayer decreases, and the saturation magnetization and the perpendicular coerci...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 1987-12, Vol.26 (12), p.2051-2056 |
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| container_end_page | 2056 |
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| container_issue | 12 |
| container_start_page | 2051 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 26 |
| creator | TANAKA, T KANAYAMA, E KATAHIRA, T SAITO, I KAWAZOE, K MASUYA, H |
| description | The effect of a Ti interlayer in an evaporated Co–Cr/Fe–Ni double-layer film on structural and magnetic properties and recording and playback characteristics has been investigated. The inplane coercivity of the Fe–Ni underlayer decreases, and the saturation magnetization and the perpendicular coercivity of the Co–Cr layer increase as a result of the presence of a Ti interlayer. The recording output voltage is found to increase as a result of the presence of a Ti interlayer from 10 to 40 nm thick. In films with an Fe–Ni underlayer having a small coercivity of about 80 A/m, the effect of the Ti interlayer as a spacing between the pole tip of a single-pole head and the Fe–Ni underlayer is observed: a higher output voltage and recording sensitivity, and a better overwrite
S
/
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are obtained for films with a thinner Ti interlayer in the thickness range from 10 to 40 nm. |
| doi_str_mv | 10.1143/jjap.26.2051 |
| format | Article |
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S
/
N
are obtained for films with a thinner Ti interlayer in the thickness range from 10 to 40 nm.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.26.2051</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Analysing. Testing. Standards ; Applied sciences ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Cross-disciplinary physics: materials science; rheology ; Exact sciences and technology ; Magnetic properties and materials ; Magnetic properties of surface, thin films and multilayers ; Materials science ; Measurement of properties and materials state ; Metals, semimetals and alloys ; Metals. Metallurgy ; Nondestructive testing ; Physics ; Specific materials</subject><ispartof>Japanese Journal of Applied Physics, 1987-12, Vol.26 (12), p.2051-2056</ispartof><rights>1989 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c357t-103e0faf396524da3bc94145ef3b5b193ddfc2aff9cb28ae0f2720a49d156ad93</citedby><cites>FETCH-LOGICAL-c357t-103e0faf396524da3bc94145ef3b5b193ddfc2aff9cb28ae0f2720a49d156ad93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=6987575$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>TANAKA, T</creatorcontrib><creatorcontrib>KANAYAMA, E</creatorcontrib><creatorcontrib>KATAHIRA, T</creatorcontrib><creatorcontrib>SAITO, I</creatorcontrib><creatorcontrib>KAWAZOE, K</creatorcontrib><creatorcontrib>MASUYA, H</creatorcontrib><title>Effect of a Ti interlayer in evaporated Co―Cr/Fe―Ni double-layer film</title><title>Japanese Journal of Applied Physics</title><description>The effect of a Ti interlayer in an evaporated Co–Cr/Fe–Ni double-layer film on structural and magnetic properties and recording and playback characteristics has been investigated. The inplane coercivity of the Fe–Ni underlayer decreases, and the saturation magnetization and the perpendicular coercivity of the Co–Cr layer increase as a result of the presence of a Ti interlayer. The recording output voltage is found to increase as a result of the presence of a Ti interlayer from 10 to 40 nm thick. In films with an Fe–Ni underlayer having a small coercivity of about 80 A/m, the effect of the Ti interlayer as a spacing between the pole tip of a single-pole head and the Fe–Ni underlayer is observed: a higher output voltage and recording sensitivity, and a better overwrite
S
/
N
are obtained for films with a thinner Ti interlayer in the thickness range from 10 to 40 nm.</description><subject>Analysing. Testing. Standards</subject><subject>Applied sciences</subject><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Cross-disciplinary physics: materials science; rheology</subject><subject>Exact sciences and technology</subject><subject>Magnetic properties and materials</subject><subject>Magnetic properties of surface, thin films and multilayers</subject><subject>Materials science</subject><subject>Measurement of properties and materials state</subject><subject>Metals, semimetals and alloys</subject><subject>Metals. Metallurgy</subject><subject>Nondestructive testing</subject><subject>Physics</subject><subject>Specific materials</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1987</creationdate><recordtype>article</recordtype><recordid>eNo9kM9Kw0AYxBdRsFZvPsAePJp2_6d7LKHVlqIe6jl82d0PUtIm7EahN1_CF_RJTKl4mhn4zRyGkHvOJpwrOd3toJsIMxFM8wsy4lLlmWJGX5IRY4JnygpxTW5S2g3RaMVHZLVADK6nLVKg25rWhz7EBo4hDpaGT-jaCH3wtGh_vr6LOF2GQV9q6tuPqgnZGcW62d-SK4Qmhbs_HZP35WJbPGeb16dVMd9kTuq8zziTgSGgtEYL5UFWziqudEBZ6Ypb6T06AYjWVWIGAytywUBZz7UBb-WYPJ53XWxTigHLLtZ7iMeSs_J0Q7lez99KYcrTDQP-cMY7SA4ajHBwdfrvGDvLda7lL6AkXpg</recordid><startdate>19871201</startdate><enddate>19871201</enddate><creator>TANAKA, T</creator><creator>KANAYAMA, E</creator><creator>KATAHIRA, T</creator><creator>SAITO, I</creator><creator>KAWAZOE, K</creator><creator>MASUYA, H</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19871201</creationdate><title>Effect of a Ti interlayer in evaporated Co―Cr/Fe―Ni double-layer film</title><author>TANAKA, T ; KANAYAMA, E ; KATAHIRA, T ; SAITO, I ; KAWAZOE, K ; MASUYA, H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-103e0faf396524da3bc94145ef3b5b193ddfc2aff9cb28ae0f2720a49d156ad93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1987</creationdate><topic>Analysing. Testing. Standards</topic><topic>Applied sciences</topic><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Cross-disciplinary physics: materials science; rheology</topic><topic>Exact sciences and technology</topic><topic>Magnetic properties and materials</topic><topic>Magnetic properties of surface, thin films and multilayers</topic><topic>Materials science</topic><topic>Measurement of properties and materials state</topic><topic>Metals, semimetals and alloys</topic><topic>Metals. Metallurgy</topic><topic>Nondestructive testing</topic><topic>Physics</topic><topic>Specific materials</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>TANAKA, T</creatorcontrib><creatorcontrib>KANAYAMA, E</creatorcontrib><creatorcontrib>KATAHIRA, T</creatorcontrib><creatorcontrib>SAITO, I</creatorcontrib><creatorcontrib>KAWAZOE, K</creatorcontrib><creatorcontrib>MASUYA, H</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>TANAKA, T</au><au>KANAYAMA, E</au><au>KATAHIRA, T</au><au>SAITO, I</au><au>KAWAZOE, K</au><au>MASUYA, H</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of a Ti interlayer in evaporated Co―Cr/Fe―Ni double-layer film</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1987-12-01</date><risdate>1987</risdate><volume>26</volume><issue>12</issue><spage>2051</spage><epage>2056</epage><pages>2051-2056</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>The effect of a Ti interlayer in an evaporated Co–Cr/Fe–Ni double-layer film on structural and magnetic properties and recording and playback characteristics has been investigated. The inplane coercivity of the Fe–Ni underlayer decreases, and the saturation magnetization and the perpendicular coercivity of the Co–Cr layer increase as a result of the presence of a Ti interlayer. The recording output voltage is found to increase as a result of the presence of a Ti interlayer from 10 to 40 nm thick. In films with an Fe–Ni underlayer having a small coercivity of about 80 A/m, the effect of the Ti interlayer as a spacing between the pole tip of a single-pole head and the Fe–Ni underlayer is observed: a higher output voltage and recording sensitivity, and a better overwrite
S
/
N
are obtained for films with a thinner Ti interlayer in the thickness range from 10 to 40 nm.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.26.2051</doi><tpages>6</tpages></addata></record> |
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| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 1987-12, Vol.26 (12), p.2051-2056 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_26_2051 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Analysing. Testing. Standards Applied sciences Condensed matter: electronic structure, electrical, magnetic, and optical properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Magnetic properties and materials Magnetic properties of surface, thin films and multilayers Materials science Measurement of properties and materials state Metals, semimetals and alloys Metals. Metallurgy Nondestructive testing Physics Specific materials |
| title | Effect of a Ti interlayer in evaporated Co―Cr/Fe―Ni double-layer film |
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