Photo-thermal spectroscopy of thin solid films
A novel photo-thermal spectroscopic method has been developed for determining the optical absorption coefficient of thin films. The temperature rising in the film illuminated with monochromatic light is measured with thin film thermocouples, and the thermo-electric voltage is employed to calculate t...
Gespeichert in:
| Veröffentlicht in: | Japanese Journal of Applied Physics 1983-01, Vol.22 (9), p.L592-L594 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | L594 |
|---|---|
| container_issue | 9 |
| container_start_page | L592 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 22 |
| creator | TANAKA, K SATOH, R ODAJIMA, A |
| description | A novel photo-thermal spectroscopic method has been developed for determining the optical absorption coefficient of thin films. The temperature rising in the film illuminated with monochromatic light is measured with thin film thermocouples, and the thermo-electric voltage is employed to calculate the absorption coefficient. For a 1 µm-thick amorphous As
2
S
3
film, the coefficient can be determined down to 5×10
2
cm
-1
at desired temperatures. |
| doi_str_mv | 10.1143/jjap.22.l592 |
| format | Article |
| fullrecord | <record><control><sourceid>pascalfrancis_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_22_L592</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>9601164</sourcerecordid><originalsourceid>FETCH-LOGICAL-c357t-252b60416f88e3c911fc38e5412b518df151309cda92a866742709224cb505c93</originalsourceid><addsrcrecordid>eNo9T8tOhDAUbYwm4ujOD2DhUrD39gFdTiY6OiFxFrompbQBAgNp2czfWzPG1clJzpOQR6A5AGcvw6CXHDEfhcIrkgDjRcapFNckoRQh4wrxltyFMEQqBYeE5MduXuds7ayf9JiGxZrVz8HMyzmdXbp2_SkN89i3qevHKdyTG6fHYB_-cEO-316_du9Z9bn_2G2rzDBRrBkKbCTlIF1ZWmYUgDOstLERGwFl60AAo8q0WqEupSw4FjSO46YRVBjFNuT5kmvimOCtqxffT9qfa6D179f6cNgea8S6il-j_OkiX3QwenRen0wf_j1KUgDJ2Q_HZlKB</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Photo-thermal spectroscopy of thin solid films</title><source>IOP Publishing Journals</source><source>Institute of Physics (IOP) Journals - HEAL-Link</source><creator>TANAKA, K ; SATOH, R ; ODAJIMA, A</creator><creatorcontrib>TANAKA, K ; SATOH, R ; ODAJIMA, A</creatorcontrib><description>A novel photo-thermal spectroscopic method has been developed for determining the optical absorption coefficient of thin films. The temperature rising in the film illuminated with monochromatic light is measured with thin film thermocouples, and the thermo-electric voltage is employed to calculate the absorption coefficient. For a 1 µm-thick amorphous As
2
S
3
film, the coefficient can be determined down to 5×10
2
cm
-1
at desired temperatures.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/jjap.22.l592</identifier><identifier>CODEN: JJAPA5</identifier><language>eng</language><publisher>Tokyo: Japanese journal of applied physics</publisher><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Exact sciences and technology ; Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation ; Optical properties of specific thin films ; Physics</subject><ispartof>Japanese Journal of Applied Physics, 1983-01, Vol.22 (9), p.L592-L594</ispartof><rights>1984 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c357t-252b60416f88e3c911fc38e5412b518df151309cda92a866742709224cb505c93</citedby><cites>FETCH-LOGICAL-c357t-252b60416f88e3c911fc38e5412b518df151309cda92a866742709224cb505c93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=9601164$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>TANAKA, K</creatorcontrib><creatorcontrib>SATOH, R</creatorcontrib><creatorcontrib>ODAJIMA, A</creatorcontrib><title>Photo-thermal spectroscopy of thin solid films</title><title>Japanese Journal of Applied Physics</title><description>A novel photo-thermal spectroscopic method has been developed for determining the optical absorption coefficient of thin films. The temperature rising in the film illuminated with monochromatic light is measured with thin film thermocouples, and the thermo-electric voltage is employed to calculate the absorption coefficient. For a 1 µm-thick amorphous As
2
S
3
film, the coefficient can be determined down to 5×10
2
cm
-1
at desired temperatures.</description><subject>Condensed matter: electronic structure, electrical, magnetic, and optical properties</subject><subject>Exact sciences and technology</subject><subject>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</subject><subject>Optical properties of specific thin films</subject><subject>Physics</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNo9T8tOhDAUbYwm4ujOD2DhUrD39gFdTiY6OiFxFrompbQBAgNp2czfWzPG1clJzpOQR6A5AGcvw6CXHDEfhcIrkgDjRcapFNckoRQh4wrxltyFMEQqBYeE5MduXuds7ayf9JiGxZrVz8HMyzmdXbp2_SkN89i3qevHKdyTG6fHYB_-cEO-316_du9Z9bn_2G2rzDBRrBkKbCTlIF1ZWmYUgDOstLERGwFl60AAo8q0WqEupSw4FjSO46YRVBjFNuT5kmvimOCtqxffT9qfa6D179f6cNgea8S6il-j_OkiX3QwenRen0wf_j1KUgDJ2Q_HZlKB</recordid><startdate>19830101</startdate><enddate>19830101</enddate><creator>TANAKA, K</creator><creator>SATOH, R</creator><creator>ODAJIMA, A</creator><general>Japanese journal of applied physics</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19830101</creationdate><title>Photo-thermal spectroscopy of thin solid films</title><author>TANAKA, K ; SATOH, R ; ODAJIMA, A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c357t-252b60416f88e3c911fc38e5412b518df151309cda92a866742709224cb505c93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Condensed matter: electronic structure, electrical, magnetic, and optical properties</topic><topic>Exact sciences and technology</topic><topic>Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation</topic><topic>Optical properties of specific thin films</topic><topic>Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>TANAKA, K</creatorcontrib><creatorcontrib>SATOH, R</creatorcontrib><creatorcontrib>ODAJIMA, A</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>TANAKA, K</au><au>SATOH, R</au><au>ODAJIMA, A</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Photo-thermal spectroscopy of thin solid films</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1983-01-01</date><risdate>1983</risdate><volume>22</volume><issue>9</issue><spage>L592</spage><epage>L594</epage><pages>L592-L594</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPA5</coden><abstract>A novel photo-thermal spectroscopic method has been developed for determining the optical absorption coefficient of thin films. The temperature rising in the film illuminated with monochromatic light is measured with thin film thermocouples, and the thermo-electric voltage is employed to calculate the absorption coefficient. For a 1 µm-thick amorphous As
2
S
3
film, the coefficient can be determined down to 5×10
2
cm
-1
at desired temperatures.</abstract><cop>Tokyo</cop><pub>Japanese journal of applied physics</pub><doi>10.1143/jjap.22.l592</doi></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0021-4922 |
| ispartof | Japanese Journal of Applied Physics, 1983-01, Vol.22 (9), p.L592-L594 |
| issn | 0021-4922 1347-4065 |
| language | eng |
| recordid | cdi_crossref_primary_10_1143_JJAP_22_L592 |
| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation Optical properties of specific thin films Physics |
| title | Photo-thermal spectroscopy of thin solid films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T06%3A38%3A17IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-pascalfrancis_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Photo-thermal%20spectroscopy%20of%20thin%20solid%20films&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=TANAKA,%20K&rft.date=1983-01-01&rft.volume=22&rft.issue=9&rft.spage=L592&rft.epage=L594&rft.pages=L592-L594&rft.issn=0021-4922&rft.eissn=1347-4065&rft.coden=JJAPA5&rft_id=info:doi/10.1143/jjap.22.l592&rft_dat=%3Cpascalfrancis_cross%3E9601164%3C/pascalfrancis_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |