High Performance 880 nm (GaAl)As/GaAs Oxide Stripe Lasers with Very Low Degradation Rates at Temperatures up to 120°C

A practical (GaAl)As/GaAs oxide stripe laser has been developed which has i) very low degradation rates (about 10 -5 h -1 at 100°C to 120°C heat sink temperature) even at 880 nm, ii) high characteristic temperature ( T 0 =200 K to 240 K), iii) stable, linear characteristics up to high optical output...

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Veröffentlicht in:Japanese Journal of Applied Physics 1981, Vol.20 (9), p.L693
Hauptverfasser: Wolf, H. D., Mettler, K., Zschauer, K.-H.
Format: Artikel
Sprache:eng
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Zusammenfassung:A practical (GaAl)As/GaAs oxide stripe laser has been developed which has i) very low degradation rates (about 10 -5 h -1 at 100°C to 120°C heat sink temperature) even at 880 nm, ii) high characteristic temperature ( T 0 =200 K to 240 K), iii) stable, linear characteristics up to high optical output and temperatures. The high-temperature degradation data at 5 mW per mirror are comparable to those of high-quality (GaAl)As IRED-s.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.20.L693