High Performance 880 nm (GaAl)As/GaAs Oxide Stripe Lasers with Very Low Degradation Rates at Temperatures up to 120°C
A practical (GaAl)As/GaAs oxide stripe laser has been developed which has i) very low degradation rates (about 10 -5 h -1 at 100°C to 120°C heat sink temperature) even at 880 nm, ii) high characteristic temperature ( T 0 =200 K to 240 K), iii) stable, linear characteristics up to high optical output...
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Veröffentlicht in: | Japanese Journal of Applied Physics 1981, Vol.20 (9), p.L693 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | A practical (GaAl)As/GaAs oxide stripe laser has been developed which has i) very low degradation rates (about 10
-5
h
-1
at 100°C to 120°C heat sink temperature) even at 880 nm, ii) high characteristic temperature (
T
0
=200 K to 240 K), iii) stable, linear characteristics up to high optical output and temperatures. The high-temperature degradation data at 5 mW per mirror are comparable to those of high-quality (GaAl)As IRED-s. |
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ISSN: | 0021-4922 1347-4065 |
DOI: | 10.1143/JJAP.20.L693 |