Josephson Effects in Niobium Variable-Thickness Bridges

Oblique deposition and anodization technique have been used to fabricate niobium variable-thickness bridges of length ∼0.2 µm. Very sharp microwave-induced steps are observed and the height changes periodically as the microwave power increases. The bridges are found to show Josephson effects in a wi...

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Veröffentlicht in:Japanese Journal of Applied Physics 1981-01, Vol.20 (1), p.L19
1. Verfasser: Goto, Toshinari
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description Oblique deposition and anodization technique have been used to fabricate niobium variable-thickness bridges of length ∼0.2 µm. Very sharp microwave-induced steps are observed and the height changes periodically as the microwave power increases. The bridges are found to show Josephson effects in a wide temperature range and have large I c R n products which are favorable in practical Josephson devices.
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fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1143_JJAP_20_L19</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1143_JJAP_20_L19</sourcerecordid><originalsourceid>FETCH-LOGICAL-c370t-fc022a13468348848f1095abb901adb4b867e4adf58efa6517e204624a1634f3</originalsourceid><addsrcrecordid>eNotzzFPwzAUBGALgUQoTPyB7MjhPdtxnLFUpRBFwBCxWnZiU0ObVHYZ-Pekgul0y-k-Qm4RCkTB75tm-VYwKFqsz0iGXFRUgCzPSQbAkIqasUtyldLnXGUpMCNVMyV32KZpzNfeu_6Y8jDmL2Gy4Xufv5sYjN052m1D_zW6lPKHGIYPl67JhTe75G7-c0G6x3W3eqLt6-Z5tWxpzys4Ut8DY2Y-IhUXSgnlEerSWFsDmsEKq2TlhBl8qZw3ssTKMRCSCYOSC88X5O5vto9TStF5fYhhb-KPRtAnsj6RNQM9k_kvqpRISw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Josephson Effects in Niobium Variable-Thickness Bridges</title><source>Institute of Physics Journals</source><creator>Goto, Toshinari</creator><creatorcontrib>Goto, Toshinari</creatorcontrib><description>Oblique deposition and anodization technique have been used to fabricate niobium variable-thickness bridges of length ∼0.2 µm. Very sharp microwave-induced steps are observed and the height changes periodically as the microwave power increases. The bridges are found to show Josephson effects in a wide temperature range and have large I c R n products which are favorable in practical Josephson devices.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.1143/JJAP.20.L19</identifier><language>eng</language><ispartof>Japanese Journal of Applied Physics, 1981-01, Vol.20 (1), p.L19</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c370t-fc022a13468348848f1095abb901adb4b867e4adf58efa6517e204624a1634f3</citedby><cites>FETCH-LOGICAL-c370t-fc022a13468348848f1095abb901adb4b867e4adf58efa6517e204624a1634f3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Goto, Toshinari</creatorcontrib><title>Josephson Effects in Niobium Variable-Thickness Bridges</title><title>Japanese Journal of Applied Physics</title><description>Oblique deposition and anodization technique have been used to fabricate niobium variable-thickness bridges of length ∼0.2 µm. Very sharp microwave-induced steps are observed and the height changes periodically as the microwave power increases. The bridges are found to show Josephson effects in a wide temperature range and have large I c R n products which are favorable in practical Josephson devices.</description><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1981</creationdate><recordtype>article</recordtype><recordid>eNotzzFPwzAUBGALgUQoTPyB7MjhPdtxnLFUpRBFwBCxWnZiU0ObVHYZ-Pekgul0y-k-Qm4RCkTB75tm-VYwKFqsz0iGXFRUgCzPSQbAkIqasUtyldLnXGUpMCNVMyV32KZpzNfeu_6Y8jDmL2Gy4Xufv5sYjN052m1D_zW6lPKHGIYPl67JhTe75G7-c0G6x3W3eqLt6-Z5tWxpzys4Ut8DY2Y-IhUXSgnlEerSWFsDmsEKq2TlhBl8qZw3ssTKMRCSCYOSC88X5O5vto9TStF5fYhhb-KPRtAnsj6RNQM9k_kvqpRISw</recordid><startdate>19810101</startdate><enddate>19810101</enddate><creator>Goto, Toshinari</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19810101</creationdate><title>Josephson Effects in Niobium Variable-Thickness Bridges</title><author>Goto, Toshinari</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c370t-fc022a13468348848f1095abb901adb4b867e4adf58efa6517e204624a1634f3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1981</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Goto, Toshinari</creatorcontrib><collection>CrossRef</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Goto, Toshinari</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Josephson Effects in Niobium Variable-Thickness Bridges</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><date>1981-01-01</date><risdate>1981</risdate><volume>20</volume><issue>1</issue><spage>L19</spage><pages>L19-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><abstract>Oblique deposition and anodization technique have been used to fabricate niobium variable-thickness bridges of length ∼0.2 µm. Very sharp microwave-induced steps are observed and the height changes periodically as the microwave power increases. The bridges are found to show Josephson effects in a wide temperature range and have large I c R n products which are favorable in practical Josephson devices.</abstract><doi>10.1143/JJAP.20.L19</doi></addata></record>
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title Josephson Effects in Niobium Variable-Thickness Bridges
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T20%3A43%3A13IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Josephson%20Effects%20in%20Niobium%20Variable-Thickness%20Bridges&rft.jtitle=Japanese%20Journal%20of%20Applied%20Physics&rft.au=Goto,%20Toshinari&rft.date=1981-01-01&rft.volume=20&rft.issue=1&rft.spage=L19&rft.pages=L19-&rft.issn=0021-4922&rft.eissn=1347-4065&rft_id=info:doi/10.1143/JJAP.20.L19&rft_dat=%3Ccrossref%3E10_1143_JJAP_20_L19%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true