Investigation of dielectric aging in layered ferroelectrics
The specific features of long-term relaxation of the polarization in the Na 0.5 Bi 8.5 Ti 2 Nb 4 O 27 and Na 0.5 Bi 8.5 Ti 2 Ta 4 O 27 ceramic materials with different prehistories are investigated. It is established that, for the Na 0.5 Bi 8.5 Ti 2 Nb 4 O 27 and Na 0.5 Bi 8.5 Ti 2 Ta 4 O 27 ceramic...
Gespeichert in:
Veröffentlicht in: | Physics of the solid state 2009-07, Vol.51 (7), p.1440-1442 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 1442 |
---|---|
container_issue | 7 |
container_start_page | 1440 |
container_title | Physics of the solid state |
container_volume | 51 |
creator | Kochergin, Yu. V. Burkhanov, A. I. Bormanis, K. Kalvane, A. Dambekalne, M. |
description | The specific features of long-term relaxation of the polarization in the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials with different prehistories are investigated. It is established that, for the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials, a change in the measurement conditions, including heating or cooling to the temperature
T
a
under investigation, leads to a change in the time dependence
ε
′(
t
) describing the dielectric aging of the material at
T
a
= const. The results obtained are discussed from the viewpoint of the possible existence of defect complexes in disordered ferroelectrics. |
doi_str_mv | 10.1134/S1063783409070270 |
format | Article |
fullrecord | <record><control><sourceid>crossref_sprin</sourceid><recordid>TN_cdi_crossref_primary_10_1134_S1063783409070270</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1134_S1063783409070270</sourcerecordid><originalsourceid>FETCH-LOGICAL-c218t-193beb379c3f8bbd0734a8c4d3c6484debde6cbccda3cfb04c69c762e81dd3fc3</originalsourceid><addsrcrecordid>eNp9j81KBDEQhIMouK4-gLd5gdH0JCYZPMniz8KCB_U8JJ3OkGXMSDIK-_bOsnoSPFVB9ddUMXYJ_ApAyOsX4EpoIyRvueaN5kdsAbOvlVT8eO-VqPf5KTsrZcs5ANy0C3a7Tl9UptjbKY6pGkPlIw2EU45Y2T6mvoqpGuyOMvkqUM7jb1zO2UmwQ6GLH12yt4f719VTvXl-XK_uNjU2YKYaWuHICd2iCMY5z7WQ1qD0ApU00pPzpNAheiswOC5RtahVQwa8FwHFksHhL-axlEyh-8jx3eZdB7zbr-_-rJ-Z5sCU-Tb1lLvt-JnTXPMf6BtWEV2j</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Investigation of dielectric aging in layered ferroelectrics</title><source>Springer Nature - Complete Springer Journals</source><creator>Kochergin, Yu. V. ; Burkhanov, A. I. ; Bormanis, K. ; Kalvane, A. ; Dambekalne, M.</creator><creatorcontrib>Kochergin, Yu. V. ; Burkhanov, A. I. ; Bormanis, K. ; Kalvane, A. ; Dambekalne, M.</creatorcontrib><description>The specific features of long-term relaxation of the polarization in the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials with different prehistories are investigated. It is established that, for the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials, a change in the measurement conditions, including heating or cooling to the temperature
T
a
under investigation, leads to a change in the time dependence
ε
′(
t
) describing the dielectric aging of the material at
T
a
= const. The results obtained are discussed from the viewpoint of the possible existence of defect complexes in disordered ferroelectrics.</description><identifier>ISSN: 1063-7834</identifier><identifier>EISSN: 1090-6460</identifier><identifier>DOI: 10.1134/S1063783409070270</identifier><language>eng</language><publisher>Dordrecht: SP MAIK Nauka/Interperiodica</publisher><subject>2008 ; June 9–14 ; Physics ; Physics and Astronomy ; Proceeding of the XVIII All-Russia Conference on Physics of Ferroelectrics (VKS-XVIII) (St. Petersburg ; Russia ; Solid State Physics</subject><ispartof>Physics of the solid state, 2009-07, Vol.51 (7), p.1440-1442</ispartof><rights>Pleiades Publishing, Ltd. 2009</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c218t-193beb379c3f8bbd0734a8c4d3c6484debde6cbccda3cfb04c69c762e81dd3fc3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S1063783409070270$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S1063783409070270$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Kochergin, Yu. V.</creatorcontrib><creatorcontrib>Burkhanov, A. I.</creatorcontrib><creatorcontrib>Bormanis, K.</creatorcontrib><creatorcontrib>Kalvane, A.</creatorcontrib><creatorcontrib>Dambekalne, M.</creatorcontrib><title>Investigation of dielectric aging in layered ferroelectrics</title><title>Physics of the solid state</title><addtitle>Phys. Solid State</addtitle><description>The specific features of long-term relaxation of the polarization in the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials with different prehistories are investigated. It is established that, for the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials, a change in the measurement conditions, including heating or cooling to the temperature
T
a
under investigation, leads to a change in the time dependence
ε
′(
t
) describing the dielectric aging of the material at
T
a
= const. The results obtained are discussed from the viewpoint of the possible existence of defect complexes in disordered ferroelectrics.</description><subject>2008</subject><subject>June 9–14</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Proceeding of the XVIII All-Russia Conference on Physics of Ferroelectrics (VKS-XVIII) (St. Petersburg</subject><subject>Russia</subject><subject>Solid State Physics</subject><issn>1063-7834</issn><issn>1090-6460</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2009</creationdate><recordtype>article</recordtype><recordid>eNp9j81KBDEQhIMouK4-gLd5gdH0JCYZPMniz8KCB_U8JJ3OkGXMSDIK-_bOsnoSPFVB9ddUMXYJ_ApAyOsX4EpoIyRvueaN5kdsAbOvlVT8eO-VqPf5KTsrZcs5ANy0C3a7Tl9UptjbKY6pGkPlIw2EU45Y2T6mvoqpGuyOMvkqUM7jb1zO2UmwQ6GLH12yt4f719VTvXl-XK_uNjU2YKYaWuHICd2iCMY5z7WQ1qD0ApU00pPzpNAheiswOC5RtahVQwa8FwHFksHhL-axlEyh-8jx3eZdB7zbr-_-rJ-Z5sCU-Tb1lLvt-JnTXPMf6BtWEV2j</recordid><startdate>20090701</startdate><enddate>20090701</enddate><creator>Kochergin, Yu. V.</creator><creator>Burkhanov, A. I.</creator><creator>Bormanis, K.</creator><creator>Kalvane, A.</creator><creator>Dambekalne, M.</creator><general>SP MAIK Nauka/Interperiodica</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20090701</creationdate><title>Investigation of dielectric aging in layered ferroelectrics</title><author>Kochergin, Yu. V. ; Burkhanov, A. I. ; Bormanis, K. ; Kalvane, A. ; Dambekalne, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c218t-193beb379c3f8bbd0734a8c4d3c6484debde6cbccda3cfb04c69c762e81dd3fc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2009</creationdate><topic>2008</topic><topic>June 9–14</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Proceeding of the XVIII All-Russia Conference on Physics of Ferroelectrics (VKS-XVIII) (St. Petersburg</topic><topic>Russia</topic><topic>Solid State Physics</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kochergin, Yu. V.</creatorcontrib><creatorcontrib>Burkhanov, A. I.</creatorcontrib><creatorcontrib>Bormanis, K.</creatorcontrib><creatorcontrib>Kalvane, A.</creatorcontrib><creatorcontrib>Dambekalne, M.</creatorcontrib><collection>CrossRef</collection><jtitle>Physics of the solid state</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kochergin, Yu. V.</au><au>Burkhanov, A. I.</au><au>Bormanis, K.</au><au>Kalvane, A.</au><au>Dambekalne, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation of dielectric aging in layered ferroelectrics</atitle><jtitle>Physics of the solid state</jtitle><stitle>Phys. Solid State</stitle><date>2009-07-01</date><risdate>2009</risdate><volume>51</volume><issue>7</issue><spage>1440</spage><epage>1442</epage><pages>1440-1442</pages><issn>1063-7834</issn><eissn>1090-6460</eissn><abstract>The specific features of long-term relaxation of the polarization in the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials with different prehistories are investigated. It is established that, for the Na
0.5
Bi
8.5
Ti
2
Nb
4
O
27
and Na
0.5
Bi
8.5
Ti
2
Ta
4
O
27
ceramic materials, a change in the measurement conditions, including heating or cooling to the temperature
T
a
under investigation, leads to a change in the time dependence
ε
′(
t
) describing the dielectric aging of the material at
T
a
= const. The results obtained are discussed from the viewpoint of the possible existence of defect complexes in disordered ferroelectrics.</abstract><cop>Dordrecht</cop><pub>SP MAIK Nauka/Interperiodica</pub><doi>10.1134/S1063783409070270</doi><tpages>3</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1063-7834 |
ispartof | Physics of the solid state, 2009-07, Vol.51 (7), p.1440-1442 |
issn | 1063-7834 1090-6460 |
language | eng |
recordid | cdi_crossref_primary_10_1134_S1063783409070270 |
source | Springer Nature - Complete Springer Journals |
subjects | 2008 June 9–14 Physics Physics and Astronomy Proceeding of the XVIII All-Russia Conference on Physics of Ferroelectrics (VKS-XVIII) (St. Petersburg Russia Solid State Physics |
title | Investigation of dielectric aging in layered ferroelectrics |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T03%3A55%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_sprin&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20of%20dielectric%20aging%20in%20layered%20ferroelectrics&rft.jtitle=Physics%20of%20the%20solid%20state&rft.au=Kochergin,%20Yu.%20V.&rft.date=2009-07-01&rft.volume=51&rft.issue=7&rft.spage=1440&rft.epage=1442&rft.pages=1440-1442&rft.issn=1063-7834&rft.eissn=1090-6460&rft_id=info:doi/10.1134/S1063783409070270&rft_dat=%3Ccrossref_sprin%3E10_1134_S1063783409070270%3C/crossref_sprin%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |