Negative magnetoresistance in silicon with manganese-atom complexes [Mn]4

It is experimentally shown that an anomalously high negative magnetoresistance is observed in silicon with manganese-atom complexes [Mn] 4 at room temperature. It is established that the negative magnetoresistance has the largest value at T = 230–240 K, while its value decreases with temperature, an...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2010, Vol.44 (9), p.1145-1148
Hauptverfasser: Bakhadirkhanov, M. K., Ayupov, K. S., Mavlyanov, G. H., Isamov, S. B.
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Sprache:eng
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Zusammenfassung:It is experimentally shown that an anomalously high negative magnetoresistance is observed in silicon with manganese-atom complexes [Mn] 4 at room temperature. It is established that the negative magnetoresistance has the largest value at T = 230–240 K, while its value decreases with temperature, and the inversion of the magnetoresistance sign takes place at T < 170 K; i.e., the positive magnetoresistance is observed. It is established that the negative magnetoresistance and its temperature dependence are substantially affected by the intensity of both integrated and monochromatic light.
ISSN:1063-7826
1090-6479
DOI:10.1134/S106378261009006X