Negative magnetoresistance in silicon with manganese-atom complexes [Mn]4
It is experimentally shown that an anomalously high negative magnetoresistance is observed in silicon with manganese-atom complexes [Mn] 4 at room temperature. It is established that the negative magnetoresistance has the largest value at T = 230–240 K, while its value decreases with temperature, an...
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Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2010, Vol.44 (9), p.1145-1148 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | It is experimentally shown that an anomalously high negative magnetoresistance is observed in silicon with manganese-atom complexes [Mn]
4
at room temperature. It is established that the negative magnetoresistance has the largest value at
T
= 230–240 K, while its value decreases with temperature, and the inversion of the magnetoresistance sign takes place at
T
< 170 K; i.e., the positive magnetoresistance is observed. It is established that the negative magnetoresistance and its temperature dependence are substantially affected by the intensity of both integrated and monochromatic light. |
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ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S106378261009006X |