Double-Crystal X-Ray Diffractometry and Topography Methods in the Analysis of the Real Structure of Crystals

The high efficiency of double-crystal X-ray diffractometry and topography methods in the characterization of crystals during refinement of the crystal-growth technology is demonstrated for the example of diamond bulk crystals and films obtained by the high pressure, high temperature method and by ch...

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Veröffentlicht in:	Surface investigation, x-ray, synchrotron and neutron techniques x-ray, synchrotron and neutron techniques, 2020-11, Vol.14 (6), p.1113-1120
Hauptverfasser:	Romanov, D. A., Prokhorov, I. A., Voloshin, A. E., Kosushkin, V. G., Bolshakov, A. P., Ralchenko, V. G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry and Materials Science Materials Science Surfaces and Interfaces Thin Films
Online-Zugang:	Volltext
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