Manifestation of changes in the morphology of thin island films in fluctuations of the absorption of focused beams

The relation between the morphology of a thin island film with fluctuations of the absorption of a laser beam scanned over the film is described. An expression for the spectrum of absorption fluctuations, which are determined by the statistics of mutual arrangement of islands in the field and of the...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Optics and spectroscopy 2010, Vol.108 (1), p.129-132
Hauptverfasser:	Vartanyan, T. A., Przhibel’skiĭ, S. G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Lasers Optical Devices Optics Photonics Physical Optics Physics Physics and Astronomy
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

container_end_page	132
container_issue	1
container_start_page	129
container_title	Optics and spectroscopy
container_volume	108
creator	Vartanyan, T. A. Przhibel’skiĭ, S. G.
description	The relation between the morphology of a thin island film with fluctuations of the absorption of a laser beam scanned over the film is described. An expression for the spectrum of absorption fluctuations, which are determined by the statistics of mutual arrangement of islands in the field and of their sizes, is obtained. It is shown that, as films thicken, absorption fluctuations can decrease and their spectrum narrow. Both phenomena are explained by the correlation between the arrangement and island sizes in films.
doi_str_mv	10.1134/S0030400X10010194
format	Article
fullrecord	<record><control><sourceid>crossref_sprin</sourceid><recordid>TN_cdi_crossref_primary_10_1134_S0030400X10010194</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1134_S0030400X10010194</sourcerecordid><originalsourceid>FETCH-LOGICAL-c288t-2c96a9e626e8f6226ba11c2ebee53c03dc8f2a6ee256b3178c397766ab3868fe3</originalsourceid><addsrcrecordid>eNp9kMtOwzAQRS0EEuXxAez8AwGPnbrOElW8pCIWgMQuctxxkyqJK0-y6N_jtLBCYmVp7jlX1mXsBsQtgMrv3oVQIhfiC4QAAUV-wmYw1zLTBcApm01xNuXn7IJomyAweTFj8dX2jUca7NCEngfPXW37DRJvej7UyLsQd3Vow2Y_hUOdzg21tl9z37TdAfPt6IbxUEBHCLmtKIm_nT64kXDNK7QdXbEzb1vC65_3kn0-Pnwsn7PV29PL8n6VOWnMkElXaFuglhqN11LqygI4iRXiXDmh1s54aTWinOtKwcI4VSwWWttKGW08qksGx14XA1FEX-5i09m4L0GU02jln9GSI48OJTbNEMttGGOfvvmP9A3093Cq</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Manifestation of changes in the morphology of thin island films in fluctuations of the absorption of focused beams</title><source>SpringerLink Journals</source><creator>Vartanyan, T. A. ; Przhibel’skiĭ, S. G.</creator><creatorcontrib>Vartanyan, T. A. ; Przhibel’skiĭ, S. G.</creatorcontrib><description>The relation between the morphology of a thin island film with fluctuations of the absorption of a laser beam scanned over the film is described. An expression for the spectrum of absorption fluctuations, which are determined by the statistics of mutual arrangement of islands in the field and of their sizes, is obtained. It is shown that, as films thicken, absorption fluctuations can decrease and their spectrum narrow. Both phenomena are explained by the correlation between the arrangement and island sizes in films.</description><identifier>ISSN: 0030-400X</identifier><identifier>EISSN: 1562-6911</identifier><identifier>DOI: 10.1134/S0030400X10010194</identifier><language>eng</language><publisher>Dordrecht: SP MAIK Nauka/Interperiodica</publisher><subject>Lasers ; Optical Devices ; Optics ; Photonics ; Physical Optics ; Physics ; Physics and Astronomy</subject><ispartof>Optics and spectroscopy, 2010, Vol.108 (1), p.129-132</ispartof><rights>Pleiades Publishing, Ltd. 2010</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c288t-2c96a9e626e8f6226ba11c2ebee53c03dc8f2a6ee256b3178c397766ab3868fe3</citedby><cites>FETCH-LOGICAL-c288t-2c96a9e626e8f6226ba11c2ebee53c03dc8f2a6ee256b3178c397766ab3868fe3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S0030400X10010194$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S0030400X10010194$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Vartanyan, T. A.</creatorcontrib><creatorcontrib>Przhibel’skiĭ, S. G.</creatorcontrib><title>Manifestation of changes in the morphology of thin island films in fluctuations of the absorption of focused beams</title><title>Optics and spectroscopy</title><addtitle>Opt. Spectrosc</addtitle><description>The relation between the morphology of a thin island film with fluctuations of the absorption of a laser beam scanned over the film is described. An expression for the spectrum of absorption fluctuations, which are determined by the statistics of mutual arrangement of islands in the field and of their sizes, is obtained. It is shown that, as films thicken, absorption fluctuations can decrease and their spectrum narrow. Both phenomena are explained by the correlation between the arrangement and island sizes in films.</description><subject>Lasers</subject><subject>Optical Devices</subject><subject>Optics</subject><subject>Photonics</subject><subject>Physical Optics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><issn>0030-400X</issn><issn>1562-6911</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2010</creationdate><recordtype>article</recordtype><recordid>eNp9kMtOwzAQRS0EEuXxAez8AwGPnbrOElW8pCIWgMQuctxxkyqJK0-y6N_jtLBCYmVp7jlX1mXsBsQtgMrv3oVQIhfiC4QAAUV-wmYw1zLTBcApm01xNuXn7IJomyAweTFj8dX2jUca7NCEngfPXW37DRJvej7UyLsQd3Vow2Y_hUOdzg21tl9z37TdAfPt6IbxUEBHCLmtKIm_nT64kXDNK7QdXbEzb1vC65_3kn0-Pnwsn7PV29PL8n6VOWnMkElXaFuglhqN11LqygI4iRXiXDmh1s54aTWinOtKwcI4VSwWWttKGW08qksGx14XA1FEX-5i09m4L0GU02jln9GSI48OJTbNEMttGGOfvvmP9A3093Cq</recordid><startdate>2010</startdate><enddate>2010</enddate><creator>Vartanyan, T. A.</creator><creator>Przhibel’skiĭ, S. G.</creator><general>SP MAIK Nauka/Interperiodica</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>2010</creationdate><title>Manifestation of changes in the morphology of thin island films in fluctuations of the absorption of focused beams</title><author>Vartanyan, T. A. ; Przhibel’skiĭ, S. G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-2c96a9e626e8f6226ba11c2ebee53c03dc8f2a6ee256b3178c397766ab3868fe3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2010</creationdate><topic>Lasers</topic><topic>Optical Devices</topic><topic>Optics</topic><topic>Photonics</topic><topic>Physical Optics</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vartanyan, T. A.</creatorcontrib><creatorcontrib>Przhibel’skiĭ, S. G.</creatorcontrib><collection>CrossRef</collection><jtitle>Optics and spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vartanyan, T. A.</au><au>Przhibel’skiĭ, S. G.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Manifestation of changes in the morphology of thin island films in fluctuations of the absorption of focused beams</atitle><jtitle>Optics and spectroscopy</jtitle><stitle>Opt. Spectrosc</stitle><date>2010</date><risdate>2010</risdate><volume>108</volume><issue>1</issue><spage>129</spage><epage>132</epage><pages>129-132</pages><issn>0030-400X</issn><eissn>1562-6911</eissn><abstract>The relation between the morphology of a thin island film with fluctuations of the absorption of a laser beam scanned over the film is described. An expression for the spectrum of absorption fluctuations, which are determined by the statistics of mutual arrangement of islands in the field and of their sizes, is obtained. It is shown that, as films thicken, absorption fluctuations can decrease and their spectrum narrow. Both phenomena are explained by the correlation between the arrangement and island sizes in films.</abstract><cop>Dordrecht</cop><pub>SP MAIK Nauka/Interperiodica</pub><doi>10.1134/S0030400X10010194</doi><tpages>4</tpages></addata></record>
fulltext	fulltext
identifier	ISSN: 0030-400X
ispartof	Optics and spectroscopy, 2010, Vol.108 (1), p.129-132
issn	0030-400X 1562-6911
language	eng
recordid	cdi_crossref_primary_10_1134_S0030400X10010194
source	SpringerLink Journals
subjects	Lasers Optical Devices Optics Photonics Physical Optics Physics Physics and Astronomy
title	Manifestation of changes in the morphology of thin island films in fluctuations of the absorption of focused beams
url	https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-10T10%3A52%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_sprin&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Manifestation%20of%20changes%20in%20the%20morphology%20of%20thin%20island%20films%20in%20fluctuations%20of%20the%20absorption%20of%20focused%20beams&rft.jtitle=Optics%20and%20spectroscopy&rft.au=Vartanyan,%20T.%20A.&rft.date=2010&rft.volume=108&rft.issue=1&rft.spage=129&rft.epage=132&rft.pages=129-132&rft.issn=0030-400X&rft.eissn=1562-6911&rft_id=info:doi/10.1134/S0030400X10010194&rft_dat=%3Ccrossref_sprin%3E10_1134_S0030400X10010194%3C/crossref_sprin%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true