Effect of radiation on the characteristics of MIS structures containing rare-earth oxides

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Veröffentlicht in:	Semiconductors (Woodbury, N.Y.) N.Y.), 1997-07, Vol.31 (7), p.752-755
Hauptverfasser:	Fedorenko, Ya. G., Otavina, L. A., Ledeneva, E. V., Sverdlova, A. M.
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Sprache:	eng
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title	Effect of radiation on the characteristics of MIS structures containing rare-earth oxides
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