Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials

Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, a wide variety of unconventional materials can be analyzed, including moderately volatile liqu...

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Veröffentlicht in:Surface science spectra 2019-06, Vol.26 (1)
Hauptverfasser: Patel, Dhananjay I., Roychowdhury, Tuhin, Jain, Varun, Shah, Dhruv, Avval, Tahereh G., Chatterjee, Shiladitya, Bahr, Stephan, Dietrich, Paul, Meyer, Michael, Thißen, Andreas, Linford, Matthew R.
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Sprache:eng
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