Fabrication of low grass, smooth sidewall InGaAsP by methane–hydrogen inductively coupled plasma RIE through a metal lift-off mask patterned by e-beam lithography

An optimized CH4+H2 inductively coupled-plasma reactive-ion-etching process for fabrication of high quality nanophotonic InGaAsP/InP waveguide device has been developed. Important parameters that influence e-beam lithography and etching have been optimized for a simple metal lift-off masked process....

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of vacuum science and technology. B, Nanotechnology & microelectronics Nanotechnology & microelectronics, 2015-09, Vol.33 (5)
Hauptverfasser: Sadasivan, Viswas, Dagar, Shikha, Das, Utpal
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 5
container_start_page
container_title Journal of vacuum science and technology. B, Nanotechnology & microelectronics
container_volume 33
creator Sadasivan, Viswas
Dagar, Shikha
Das, Utpal
description An optimized CH4+H2 inductively coupled-plasma reactive-ion-etching process for fabrication of high quality nanophotonic InGaAsP/InP waveguide device has been developed. Important parameters that influence e-beam lithography and etching have been optimized for a simple metal lift-off masked process. Smooth sidewalls with low grass content has been demonstrated for >3 μm etch depths in InGaAsP/InP using an Al lift-off etch mask.
doi_str_mv 10.1116/1.4929437
format Article
fullrecord <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1116_1_4929437</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1116_1_4929437</sourcerecordid><originalsourceid>FETCH-LOGICAL-c229t-60c4d232aa006cbdfed42f6cab628d6a3755e27d2259b5acbfcf3c9d1822adcf3</originalsourceid><addsrcrecordid>eNo9UM1Kw0AYXETBUnvwDb6rYGp2k2ybYym1FgqK6Dl82Z8musmG3a0lN9_BV_DJfBJTLM7lm8M3w8wQck3jKaWU39FpmrM8TWZnZMQo5xGbZen5P0_5JZl4_xYP4PMsTuIR-b7H0tUCQ21bsBqMPcDOofe34BtrQwW-luqAxsCmXePCP0HZQ6NCha36-fyqeunsTrVQt3IvQv2hTA_C7jujJHQGfYPwvFlBqJzd7yrAoxYNmFqHyGoNDfp36DAE5dpBMpirqFTYDB-hskOUruqvyIVG49XkdMfk9X71snyIto_rzXKxjQRjeYh4LFLJEoY49BOl1EqmTHOBJWdzyTGZZZliM8lYlpcZilILnYhc0jljKAc-Jjd_vsJZ753SRefqBl1f0Lg4LlzQ4rRw8gssLHKo</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Fabrication of low grass, smooth sidewall InGaAsP by methane–hydrogen inductively coupled plasma RIE through a metal lift-off mask patterned by e-beam lithography</title><source>AIP Journals Complete</source><source>Alma/SFX Local Collection</source><creator>Sadasivan, Viswas ; Dagar, Shikha ; Das, Utpal</creator><creatorcontrib>Sadasivan, Viswas ; Dagar, Shikha ; Das, Utpal</creatorcontrib><description>An optimized CH4+H2 inductively coupled-plasma reactive-ion-etching process for fabrication of high quality nanophotonic InGaAsP/InP waveguide device has been developed. Important parameters that influence e-beam lithography and etching have been optimized for a simple metal lift-off masked process. Smooth sidewalls with low grass content has been demonstrated for &gt;3 μm etch depths in InGaAsP/InP using an Al lift-off etch mask.</description><identifier>ISSN: 2166-2746</identifier><identifier>EISSN: 2166-2754</identifier><identifier>DOI: 10.1116/1.4929437</identifier><language>eng</language><ispartof>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics, 2015-09, Vol.33 (5)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c229t-60c4d232aa006cbdfed42f6cab628d6a3755e27d2259b5acbfcf3c9d1822adcf3</citedby><cites>FETCH-LOGICAL-c229t-60c4d232aa006cbdfed42f6cab628d6a3755e27d2259b5acbfcf3c9d1822adcf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Sadasivan, Viswas</creatorcontrib><creatorcontrib>Dagar, Shikha</creatorcontrib><creatorcontrib>Das, Utpal</creatorcontrib><title>Fabrication of low grass, smooth sidewall InGaAsP by methane–hydrogen inductively coupled plasma RIE through a metal lift-off mask patterned by e-beam lithography</title><title>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics</title><description>An optimized CH4+H2 inductively coupled-plasma reactive-ion-etching process for fabrication of high quality nanophotonic InGaAsP/InP waveguide device has been developed. Important parameters that influence e-beam lithography and etching have been optimized for a simple metal lift-off masked process. Smooth sidewalls with low grass content has been demonstrated for &gt;3 μm etch depths in InGaAsP/InP using an Al lift-off etch mask.</description><issn>2166-2746</issn><issn>2166-2754</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNo9UM1Kw0AYXETBUnvwDb6rYGp2k2ybYym1FgqK6Dl82Z8musmG3a0lN9_BV_DJfBJTLM7lm8M3w8wQck3jKaWU39FpmrM8TWZnZMQo5xGbZen5P0_5JZl4_xYP4PMsTuIR-b7H0tUCQ21bsBqMPcDOofe34BtrQwW-luqAxsCmXePCP0HZQ6NCha36-fyqeunsTrVQt3IvQv2hTA_C7jujJHQGfYPwvFlBqJzd7yrAoxYNmFqHyGoNDfp36DAE5dpBMpirqFTYDB-hskOUruqvyIVG49XkdMfk9X71snyIto_rzXKxjQRjeYh4LFLJEoY49BOl1EqmTHOBJWdzyTGZZZliM8lYlpcZilILnYhc0jljKAc-Jjd_vsJZ753SRefqBl1f0Lg4LlzQ4rRw8gssLHKo</recordid><startdate>20150901</startdate><enddate>20150901</enddate><creator>Sadasivan, Viswas</creator><creator>Dagar, Shikha</creator><creator>Das, Utpal</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150901</creationdate><title>Fabrication of low grass, smooth sidewall InGaAsP by methane–hydrogen inductively coupled plasma RIE through a metal lift-off mask patterned by e-beam lithography</title><author>Sadasivan, Viswas ; Dagar, Shikha ; Das, Utpal</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c229t-60c4d232aa006cbdfed42f6cab628d6a3755e27d2259b5acbfcf3c9d1822adcf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sadasivan, Viswas</creatorcontrib><creatorcontrib>Dagar, Shikha</creatorcontrib><creatorcontrib>Das, Utpal</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Sadasivan, Viswas</au><au>Dagar, Shikha</au><au>Das, Utpal</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Fabrication of low grass, smooth sidewall InGaAsP by methane–hydrogen inductively coupled plasma RIE through a metal lift-off mask patterned by e-beam lithography</atitle><jtitle>Journal of vacuum science and technology. B, Nanotechnology &amp; microelectronics</jtitle><date>2015-09-01</date><risdate>2015</risdate><volume>33</volume><issue>5</issue><issn>2166-2746</issn><eissn>2166-2754</eissn><abstract>An optimized CH4+H2 inductively coupled-plasma reactive-ion-etching process for fabrication of high quality nanophotonic InGaAsP/InP waveguide device has been developed. Important parameters that influence e-beam lithography and etching have been optimized for a simple metal lift-off masked process. Smooth sidewalls with low grass content has been demonstrated for &gt;3 μm etch depths in InGaAsP/InP using an Al lift-off etch mask.</abstract><doi>10.1116/1.4929437</doi></addata></record>
fulltext fulltext
identifier ISSN: 2166-2746
ispartof Journal of vacuum science and technology. B, Nanotechnology & microelectronics, 2015-09, Vol.33 (5)
issn 2166-2746
2166-2754
language eng
recordid cdi_crossref_primary_10_1116_1_4929437
source AIP Journals Complete; Alma/SFX Local Collection
title Fabrication of low grass, smooth sidewall InGaAsP by methane–hydrogen inductively coupled plasma RIE through a metal lift-off mask patterned by e-beam lithography
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T11%3A58%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Fabrication%20of%20low%20grass,%20smooth%20sidewall%20InGaAsP%20by%20methane%E2%80%93hydrogen%20inductively%20coupled%20plasma%20RIE%20through%20a%20metal%20lift-off%20mask%20patterned%20by%20e-beam%20lithography&rft.jtitle=Journal%20of%20vacuum%20science%20and%20technology.%20B,%20Nanotechnology%20&%20microelectronics&rft.au=Sadasivan,%20Viswas&rft.date=2015-09-01&rft.volume=33&rft.issue=5&rft.issn=2166-2746&rft.eissn=2166-2754&rft_id=info:doi/10.1116/1.4929437&rft_dat=%3Ccrossref%3E10_1116_1_4929437%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true