A Digital Twin-Based Method for Assembly Deviations Analysis

A Digital Twin-Based Method for Assembly Deviations Analysis

This paper proposes and develops a digital twin-based method for assembly deviation analysis, which considers the impact of product shape deviations and uses assembly data in the product design phase to enhance the performance of assembly deviation analysis. First, the overall product assembly devia...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Journal of computing and information science in engineering 2024-09, Vol.24 (9)
Hauptverfasser: Zhi, Junnan, Cao, Yanlong, Li, Tukun, Liu, Fan, Luo, Jia, Li, Yanling, Jiang, Xiangqian
Format: Artikel
Sprache:eng
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue 9
container_start_page
container_title Journal of computing and information science in engineering
container_volume 24
creator Zhi, Junnan
Cao, Yanlong
Li, Tukun
Liu, Fan
Luo, Jia
Li, Yanling
Jiang, Xiangqian
description This paper proposes and develops a digital twin-based method for assembly deviation analysis, which considers the impact of product shape deviations and uses assembly data in the product design phase to enhance the performance of assembly deviation analysis. First, the overall product assembly deviation analysis process based on twin information is studied. Second, a mating algorithm, which evaluates multi-source assembly information, is proposed and developed. Third, the interaction between adjacent mating feature deviation propagation and an updated iterative mechanism is examined. Finally, a digital twin assembly deviation analysis model based on the new proposed Jacobian-twin approach is established, and validation is conducted through a case study.
doi_str_mv 10.1115/1.4065882
format Article
fullrecord <record><control><sourceid>asme_cross</sourceid><recordid>TN_cdi_crossref_primary_10_1115_1_4065882</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1201341</sourcerecordid><originalsourceid>FETCH-LOGICAL-a140t-9c1e2e4b13ea15150773695b5e2ba1b2a7129bdcbf266a644121ef228a62926b3</originalsourceid><addsrcrecordid>eNotjztPw0AQhE8IJEKgoKe4lsLhdn0PW6IxCS8piCbUpz3nDBc5MfIaovx7gpJqpvg0mk-Ia1ATADB3MNHKmqLAEzGCUuvMKVec7rvJVVYW6M7FBfNKKeWUtSNxX8lZ-kwDtXKxTZvsgTgu5VscvrqlbLpeVsxxHdqdnMXfREPqNiyrDbU7TnwpzhpqOV4dcyw-nh4X05ds_v78Oq3mGYFWQ1bWEDHqAHkkMGCUc7ktTTARA0FAcoBlWNahQWvJag0IsUEsyGKJNuRjcXvYrfuOuY-N_-7TmvqdB-X_tT34o_aevTmwxOvoV91Pvz_LHlBBriH_AzkLUVc</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A Digital Twin-Based Method for Assembly Deviations Analysis</title><source>ASME Transactions Journals</source><creator>Zhi, Junnan ; Cao, Yanlong ; Li, Tukun ; Liu, Fan ; Luo, Jia ; Li, Yanling ; Jiang, Xiangqian</creator><creatorcontrib>Zhi, Junnan ; Cao, Yanlong ; Li, Tukun ; Liu, Fan ; Luo, Jia ; Li, Yanling ; Jiang, Xiangqian</creatorcontrib><description>This paper proposes and develops a digital twin-based method for assembly deviation analysis, which considers the impact of product shape deviations and uses assembly data in the product design phase to enhance the performance of assembly deviation analysis. First, the overall product assembly deviation analysis process based on twin information is studied. Second, a mating algorithm, which evaluates multi-source assembly information, is proposed and developed. Third, the interaction between adjacent mating feature deviation propagation and an updated iterative mechanism is examined. Finally, a digital twin assembly deviation analysis model based on the new proposed Jacobian-twin approach is established, and validation is conducted through a case study.</description><identifier>ISSN: 1530-9827</identifier><identifier>EISSN: 1944-7078</identifier><identifier>DOI: 10.1115/1.4065882</identifier><language>eng</language><publisher>ASME</publisher><ispartof>Journal of computing and information science in engineering, 2024-09, Vol.24 (9)</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-a140t-9c1e2e4b13ea15150773695b5e2ba1b2a7129bdcbf266a644121ef228a62926b3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902,38497</link.rule.ids></links><search><creatorcontrib>Zhi, Junnan</creatorcontrib><creatorcontrib>Cao, Yanlong</creatorcontrib><creatorcontrib>Li, Tukun</creatorcontrib><creatorcontrib>Liu, Fan</creatorcontrib><creatorcontrib>Luo, Jia</creatorcontrib><creatorcontrib>Li, Yanling</creatorcontrib><creatorcontrib>Jiang, Xiangqian</creatorcontrib><title>A Digital Twin-Based Method for Assembly Deviations Analysis</title><title>Journal of computing and information science in engineering</title><addtitle>J. Comput. Inf. Sci. Eng</addtitle><description>This paper proposes and develops a digital twin-based method for assembly deviation analysis, which considers the impact of product shape deviations and uses assembly data in the product design phase to enhance the performance of assembly deviation analysis. First, the overall product assembly deviation analysis process based on twin information is studied. Second, a mating algorithm, which evaluates multi-source assembly information, is proposed and developed. Third, the interaction between adjacent mating feature deviation propagation and an updated iterative mechanism is examined. Finally, a digital twin assembly deviation analysis model based on the new proposed Jacobian-twin approach is established, and validation is conducted through a case study.</description><issn>1530-9827</issn><issn>1944-7078</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2024</creationdate><recordtype>article</recordtype><recordid>eNotjztPw0AQhE8IJEKgoKe4lsLhdn0PW6IxCS8piCbUpz3nDBc5MfIaovx7gpJqpvg0mk-Ia1ATADB3MNHKmqLAEzGCUuvMKVec7rvJVVYW6M7FBfNKKeWUtSNxX8lZ-kwDtXKxTZvsgTgu5VscvrqlbLpeVsxxHdqdnMXfREPqNiyrDbU7TnwpzhpqOV4dcyw-nh4X05ds_v78Oq3mGYFWQ1bWEDHqAHkkMGCUc7ktTTARA0FAcoBlWNahQWvJag0IsUEsyGKJNuRjcXvYrfuOuY-N_-7TmvqdB-X_tT34o_aevTmwxOvoV91Pvz_LHlBBriH_AzkLUVc</recordid><startdate>20240901</startdate><enddate>20240901</enddate><creator>Zhi, Junnan</creator><creator>Cao, Yanlong</creator><creator>Li, Tukun</creator><creator>Liu, Fan</creator><creator>Luo, Jia</creator><creator>Li, Yanling</creator><creator>Jiang, Xiangqian</creator><general>ASME</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20240901</creationdate><title>A Digital Twin-Based Method for Assembly Deviations Analysis</title><author>Zhi, Junnan ; Cao, Yanlong ; Li, Tukun ; Liu, Fan ; Luo, Jia ; Li, Yanling ; Jiang, Xiangqian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-a140t-9c1e2e4b13ea15150773695b5e2ba1b2a7129bdcbf266a644121ef228a62926b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2024</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhi, Junnan</creatorcontrib><creatorcontrib>Cao, Yanlong</creatorcontrib><creatorcontrib>Li, Tukun</creatorcontrib><creatorcontrib>Liu, Fan</creatorcontrib><creatorcontrib>Luo, Jia</creatorcontrib><creatorcontrib>Li, Yanling</creatorcontrib><creatorcontrib>Jiang, Xiangqian</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of computing and information science in engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhi, Junnan</au><au>Cao, Yanlong</au><au>Li, Tukun</au><au>Liu, Fan</au><au>Luo, Jia</au><au>Li, Yanling</au><au>Jiang, Xiangqian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Digital Twin-Based Method for Assembly Deviations Analysis</atitle><jtitle>Journal of computing and information science in engineering</jtitle><stitle>J. Comput. Inf. Sci. Eng</stitle><date>2024-09-01</date><risdate>2024</risdate><volume>24</volume><issue>9</issue><issn>1530-9827</issn><eissn>1944-7078</eissn><abstract>This paper proposes and develops a digital twin-based method for assembly deviation analysis, which considers the impact of product shape deviations and uses assembly data in the product design phase to enhance the performance of assembly deviation analysis. First, the overall product assembly deviation analysis process based on twin information is studied. Second, a mating algorithm, which evaluates multi-source assembly information, is proposed and developed. Third, the interaction between adjacent mating feature deviation propagation and an updated iterative mechanism is examined. Finally, a digital twin assembly deviation analysis model based on the new proposed Jacobian-twin approach is established, and validation is conducted through a case study.</abstract><pub>ASME</pub><doi>10.1115/1.4065882</doi></addata></record>
fulltext fulltext
identifier ISSN: 1530-9827
ispartof Journal of computing and information science in engineering, 2024-09, Vol.24 (9)
issn 1530-9827
1944-7078
language eng
recordid cdi_crossref_primary_10_1115_1_4065882
source ASME Transactions Journals
title A Digital Twin-Based Method for Assembly Deviations Analysis
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-07T16%3A21%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-asme_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Digital%20Twin-Based%20Method%20for%20Assembly%20Deviations%20Analysis&rft.jtitle=Journal%20of%20computing%20and%20information%20science%20in%20engineering&rft.au=Zhi,%20Junnan&rft.date=2024-09-01&rft.volume=24&rft.issue=9&rft.issn=1530-9827&rft.eissn=1944-7078&rft_id=info:doi/10.1115/1.4065882&rft_dat=%3Casme_cross%3E1201341%3C/asme_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true