Thermal Conductivity Measurement of Graphene Exfoliated on Silicon Dioxide
We have developed a nanofabricated resistance thermometer device to measure the thermal conductivity of graphene monolayers exfoliated onto silicon dioxide. The measurement results show that the thermal conductivity of the supported graphene is approximately 600 W/m K at room temperature. While this...
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| Veröffentlicht in: | Journal of heat transfer 2011-02, Vol.133 (2) |
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| container_title | Journal of heat transfer |
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| creator | Seol, Jae Hun Moore, Arden L. Shi, Li Jo, Insun Yao, Zhen |
| description | We have developed a nanofabricated resistance thermometer device to measure the thermal conductivity of graphene monolayers exfoliated onto silicon dioxide. The measurement results show that the thermal conductivity of the supported graphene is approximately 600 W/m K at room temperature. While this value is lower than the reported basal plane values for graphite and suspended graphene because of phonon leakage across the graphene-support interface, it is still considerably higher than the values for common thin film electronic materials. Here, we present a detailed discussion of the design and fabrication of the measurement device. Analytical and numerical heat transfer solutions are developed to evaluate the accuracy and uncertainty of this method for thermal conductivity measurement of high-thermal conductivity ultrathin films. |
| doi_str_mv | 10.1115/1.4002608 |
| format | Article |
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The measurement results show that the thermal conductivity of the supported graphene is approximately 600 W/m K at room temperature. While this value is lower than the reported basal plane values for graphite and suspended graphene because of phonon leakage across the graphene-support interface, it is still considerably higher than the values for common thin film electronic materials. Here, we present a detailed discussion of the design and fabrication of the measurement device. Analytical and numerical heat transfer solutions are developed to evaluate the accuracy and uncertainty of this method for thermal conductivity measurement of high-thermal conductivity ultrathin films.</description><identifier>ISSN: 0022-1481</identifier><identifier>EISSN: 1528-8943</identifier><identifier>DOI: 10.1115/1.4002608</identifier><identifier>CODEN: JHTRAO</identifier><language>eng</language><publisher>New York, NY: ASME</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; Exact sciences and technology ; Micro/Nanoscale Heat Transfer ; Nonelectronic thermal conduction and heat-pulse propagation in solids; thermal waves ; Physics ; Transport properties of condensed matter (nonelectronic)</subject><ispartof>Journal of heat transfer, 2011-02, Vol.133 (2)</ispartof><rights>2015 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-a345t-1af85042f156da413160a3590436f745a0dda421860f497eb0d020f50bba41d93</citedby><cites>FETCH-LOGICAL-a345t-1af85042f156da413160a3590436f745a0dda421860f497eb0d020f50bba41d93</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902,38497</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=23916137$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Seol, Jae Hun</creatorcontrib><creatorcontrib>Moore, Arden L.</creatorcontrib><creatorcontrib>Shi, Li</creatorcontrib><creatorcontrib>Jo, Insun</creatorcontrib><creatorcontrib>Yao, Zhen</creatorcontrib><title>Thermal Conductivity Measurement of Graphene Exfoliated on Silicon Dioxide</title><title>Journal of heat transfer</title><addtitle>J. Heat Transfer</addtitle><description>We have developed a nanofabricated resistance thermometer device to measure the thermal conductivity of graphene monolayers exfoliated onto silicon dioxide. The measurement results show that the thermal conductivity of the supported graphene is approximately 600 W/m K at room temperature. While this value is lower than the reported basal plane values for graphite and suspended graphene because of phonon leakage across the graphene-support interface, it is still considerably higher than the values for common thin film electronic materials. Here, we present a detailed discussion of the design and fabrication of the measurement device. 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Heat Transfer</stitle><date>2011-02-01</date><risdate>2011</risdate><volume>133</volume><issue>2</issue><issn>0022-1481</issn><eissn>1528-8943</eissn><coden>JHTRAO</coden><abstract>We have developed a nanofabricated resistance thermometer device to measure the thermal conductivity of graphene monolayers exfoliated onto silicon dioxide. The measurement results show that the thermal conductivity of the supported graphene is approximately 600 W/m K at room temperature. While this value is lower than the reported basal plane values for graphite and suspended graphene because of phonon leakage across the graphene-support interface, it is still considerably higher than the values for common thin film electronic materials. Here, we present a detailed discussion of the design and fabrication of the measurement device. Analytical and numerical heat transfer solutions are developed to evaluate the accuracy and uncertainty of this method for thermal conductivity measurement of high-thermal conductivity ultrathin films.</abstract><cop>New York, NY</cop><pub>ASME</pub><doi>10.1115/1.4002608</doi></addata></record> |
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| source | ASME Transactions Journals (Current) |
| subjects | Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Micro/Nanoscale Heat Transfer Nonelectronic thermal conduction and heat-pulse propagation in solids thermal waves Physics Transport properties of condensed matter (nonelectronic) |
| title | Thermal Conductivity Measurement of Graphene Exfoliated on Silicon Dioxide |
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