Adaptive Proactive Reconfiguration: A Technique for Process-Variability- and Aging-Aware SRAM Cache Design

Nanoscale circuits are subject to a wide range of new limiting phenomena making essential to investigate new design strategies at the circuit and architecture level to improve its performance and reliability. Proactive reconfiguration is an emerging technique oriented to extend the system lifetime o...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2015-09, Vol.23 (9), p.1951-1955
Hauptverfasser:	Pouyan, Peyman, Amat, Esteve, Rubio, Antonio
Format:	Artikel
Sprache:	eng
Schlagworte:	Adaptive proactive reconfiguration Aging aging sensor Circuits electrònics Enginyeria electrònica Memòria d'accés aleatori Microelectrònica Monitoring process variation Random access memory reliability SRAM cells static random access memory (SRAM) Temperature measurement Transistors Very large scale integration Àrees temàtiques de la UPC
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