Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing

We propose a compact test generation method for transition faults based on a conflict avoidance driven scheme. A new measure is proposed to estimate the influence inputs, which is the subset of inputs to be specified, needed for detecting transition faults. The value requirements at the pseudoprimar...

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Veröffentlicht in:IEEE transactions on very large scale integration (VLSI) systems 2014-09, Vol.22 (9), p.1968-1979
Hauptverfasser: Xiang, Dong, Sui, Wenjie, Yin, Boxue, Cheng, Kwang-Ting
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Sprache:eng
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