Efficient Memory Repair Using Cache-Based Redundancy

In modern processes, conventional defect density and variability related yield losses are a major concern for the aggressive memory designs in integrated circuits. Synergistic action for memory repair at the circuit and architectural level is essential to maintain the yields and profitability of pas...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems 2012-12, Vol.20 (12), p.2278-2288
Hauptverfasser:	Axelos, N., Pekmestzi, K., Gizopoulos, D.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Cache Circuit faults Design. Technologies. Operation analysis. Testing Electronics Exact sciences and technology Fault tolerance Integrated circuits Integrated circuits by function (including memories and processors) memory Memory architecture Random access memory Redundancy Reliability repair Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
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