Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers
This work develops a simple, practical yet easily realizable method for low cost measurement of phase and amplitude distortions in radio frequency power amplifiers (RF PA). Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high...
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| Veröffentlicht in: | IEEE transactions on very large scale integration (VLSI) systems 2012-09, Vol.20 (9), p.1602-1614 |
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| creator | Sen, S. Devarakond, S. Chatterjee, A. |
| description | This work develops a simple, practical yet easily realizable method for low cost measurement of phase and amplitude distortions in radio frequency power amplifiers (RF PA). Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high output power levels, causing out of band interference in the transmitted signal and bit errors in the received signal. Traditional measurements of amplitude and phase distortion in RF PAs require the use of expensive vector network analyzers. In this work, we propose the use of phase-to-amplitude conversion to develop a low cost and accurate test methodology for AM-AM and AM-PM measurement using simple load board test circuitry along with software based difference generation and peak detection mechanisms. Using either simple sine wave stimulus with power sweep or a single amplitude modulated RF stimulus, both distortion effects can be measured with high accuracy for nominal devices as well as over process and voltage variations, while allowing significant reduction in test cost. |
| doi_str_mv | 10.1109/TVLSI.2011.2160376 |
| format | Article |
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Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high output power levels, causing out of band interference in the transmitted signal and bit errors in the received signal. Traditional measurements of amplitude and phase distortion in RF PAs require the use of expensive vector network analyzers. In this work, we propose the use of phase-to-amplitude conversion to develop a low cost and accurate test methodology for AM-AM and AM-PM measurement using simple load board test circuitry along with software based difference generation and peak detection mechanisms. Using either simple sine wave stimulus with power sweep or a single amplitude modulated RF stimulus, both distortion effects can be measured with high accuracy for nominal devices as well as over process and voltage variations, while allowing significant reduction in test cost.</description><identifier>ISSN: 1063-8210</identifier><identifier>EISSN: 1557-9999</identifier><identifier>DOI: 10.1109/TVLSI.2011.2160376</identifier><identifier>CODEN: IEVSE9</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Amplifiers ; Amplitude distortion ; amplitude-to-amplitude modulation (AM-AM) ; amplitude-to-phase modulation (AM-PM) ; Amplitudes ; Applied sciences ; bit error rate (BER) ; Circuit properties ; Design. Technologies. Operation analysis. Testing ; Distortion ; Distortion measurement ; Electric, optical and optoelectronic circuits ; Electronic circuits ; Electronic equipment and fabrication. Passive components, printed wiring boards, connectics ; Electronics ; Exact sciences and technology ; Gain ; Gain measurement ; Integrated circuits ; load board testing ; Low cost ; low-cost measurement ; Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits ; Phase distortion ; Phase measurement ; Power amplifiers ; Power measurement ; Radio frequencies ; Radio frequency ; RF power amplifiers (RF PAs) ; Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices ; Sine waves ; vector network analyzer (VNA) ; Very large scale integration</subject><ispartof>IEEE transactions on very large scale integration (VLSI) systems, 2012-09, Vol.20 (9), p.1602-1614</ispartof><rights>2015 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Sep 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c358t-df7d692d39beb7c1343aaf9441ae1f7e7980033c5e499a588af879afcc02ba253</citedby><cites>FETCH-LOGICAL-c358t-df7d692d39beb7c1343aaf9441ae1f7e7980033c5e499a588af879afcc02ba253</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/5976427$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,778,782,794,27907,27908,54741</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/5976427$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26346796$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Sen, S.</creatorcontrib><creatorcontrib>Devarakond, S.</creatorcontrib><creatorcontrib>Chatterjee, A.</creatorcontrib><title>Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers</title><title>IEEE transactions on very large scale integration (VLSI) systems</title><addtitle>TVLSI</addtitle><description>This work develops a simple, practical yet easily realizable method for low cost measurement of phase and amplitude distortions in radio frequency power amplifiers (RF PA). Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high output power levels, causing out of band interference in the transmitted signal and bit errors in the received signal. Traditional measurements of amplitude and phase distortion in RF PAs require the use of expensive vector network analyzers. In this work, we propose the use of phase-to-amplitude conversion to develop a low cost and accurate test methodology for AM-AM and AM-PM measurement using simple load board test circuitry along with software based difference generation and peak detection mechanisms. Using either simple sine wave stimulus with power sweep or a single amplitude modulated RF stimulus, both distortion effects can be measured with high accuracy for nominal devices as well as over process and voltage variations, while allowing significant reduction in test cost.</description><subject>Amplifiers</subject><subject>Amplitude distortion</subject><subject>amplitude-to-amplitude modulation (AM-AM)</subject><subject>amplitude-to-phase modulation (AM-PM)</subject><subject>Amplitudes</subject><subject>Applied sciences</subject><subject>bit error rate (BER)</subject><subject>Circuit properties</subject><subject>Design. Technologies. Operation analysis. Testing</subject><subject>Distortion</subject><subject>Distortion measurement</subject><subject>Electric, optical and optoelectronic circuits</subject><subject>Electronic circuits</subject><subject>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</subject><subject>Electronics</subject><subject>Exact sciences and technology</subject><subject>Gain</subject><subject>Gain measurement</subject><subject>Integrated circuits</subject><subject>load board testing</subject><subject>Low cost</subject><subject>low-cost measurement</subject><subject>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</subject><subject>Phase distortion</subject><subject>Phase measurement</subject><subject>Power amplifiers</subject><subject>Power measurement</subject><subject>Radio frequencies</subject><subject>Radio frequency</subject><subject>RF power amplifiers (RF PAs)</subject><subject>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</subject><subject>Sine waves</subject><subject>vector network analyzer (VNA)</subject><subject>Very large scale integration</subject><issn>1063-8210</issn><issn>1557-9999</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkU9vEzEQxVcIJErhC8DFEkLissFjr_8dQ9pCpUREULiuHO9YuNqsg-2l4tvjkKgH5jKjmd97Guk1zWugCwBqPtz9WH-7XTAKsGAgKVfySXMBQqjW1HpaZyp5qxnQ582LnO8pha4z9KKZtz9tRnIVcomphDiREslyfxhDmQckqzj9xpTrvv1YuYGs40O7irmQDdo8J9zjVEj0ZLlplxtip-E4bTfk2nt0JZMwka83ZBsfMJ1sfah-L5tn3o4ZX537ZfP95vpu9bldf_l0u1quW8eFLu3g1SANG7jZ4U454B231puuA4vgFSqjKeXcCeyMsUJr67Uy1jtH2c4ywS-b9yffQ4q_Zsyl34fscBzthHHOPQCXnQbQtKJv_0Pv45ym-l0PlEktQGheKXaiXIo5J_T9IYW9TX8q1B-T6P8l0R-T6M9JVNG7s7XNzo4-2cmF_KhkkndSmSP35sQFRHw8C6NkxxT_C4NMkIc</recordid><startdate>20120901</startdate><enddate>20120901</enddate><creator>Sen, S.</creator><creator>Devarakond, S.</creator><creator>Chatterjee, A.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20120901</creationdate><title>Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers</title><author>Sen, S. ; Devarakond, S. ; Chatterjee, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c358t-df7d692d39beb7c1343aaf9441ae1f7e7980033c5e499a588af879afcc02ba253</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Amplifiers</topic><topic>Amplitude distortion</topic><topic>amplitude-to-amplitude modulation (AM-AM)</topic><topic>amplitude-to-phase modulation (AM-PM)</topic><topic>Amplitudes</topic><topic>Applied sciences</topic><topic>bit error rate (BER)</topic><topic>Circuit properties</topic><topic>Design. Technologies. Operation analysis. Testing</topic><topic>Distortion</topic><topic>Distortion measurement</topic><topic>Electric, optical and optoelectronic circuits</topic><topic>Electronic circuits</topic><topic>Electronic equipment and fabrication. Passive components, printed wiring boards, connectics</topic><topic>Electronics</topic><topic>Exact sciences and technology</topic><topic>Gain</topic><topic>Gain measurement</topic><topic>Integrated circuits</topic><topic>load board testing</topic><topic>Low cost</topic><topic>low-cost measurement</topic><topic>Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits</topic><topic>Phase distortion</topic><topic>Phase measurement</topic><topic>Power amplifiers</topic><topic>Power measurement</topic><topic>Radio frequencies</topic><topic>Radio frequency</topic><topic>RF power amplifiers (RF PAs)</topic><topic>Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices</topic><topic>Sine waves</topic><topic>vector network analyzer (VNA)</topic><topic>Very large scale integration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sen, S.</creatorcontrib><creatorcontrib>Devarakond, S.</creatorcontrib><creatorcontrib>Chatterjee, A.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on very large scale integration (VLSI) systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sen, S.</au><au>Devarakond, S.</au><au>Chatterjee, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers</atitle><jtitle>IEEE transactions on very large scale integration (VLSI) systems</jtitle><stitle>TVLSI</stitle><date>2012-09-01</date><risdate>2012</risdate><volume>20</volume><issue>9</issue><spage>1602</spage><epage>1614</epage><pages>1602-1614</pages><issn>1063-8210</issn><eissn>1557-9999</eissn><coden>IEVSE9</coden><abstract>This work develops a simple, practical yet easily realizable method for low cost measurement of phase and amplitude distortions in radio frequency power amplifiers (RF PA). Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high output power levels, causing out of band interference in the transmitted signal and bit errors in the received signal. Traditional measurements of amplitude and phase distortion in RF PAs require the use of expensive vector network analyzers. In this work, we propose the use of phase-to-amplitude conversion to develop a low cost and accurate test methodology for AM-AM and AM-PM measurement using simple load board test circuitry along with software based difference generation and peak detection mechanisms. Using either simple sine wave stimulus with power sweep or a single amplitude modulated RF stimulus, both distortion effects can be measured with high accuracy for nominal devices as well as over process and voltage variations, while allowing significant reduction in test cost.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TVLSI.2011.2160376</doi><tpages>13</tpages></addata></record> |
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| subjects | Amplifiers Amplitude distortion amplitude-to-amplitude modulation (AM-AM) amplitude-to-phase modulation (AM-PM) Amplitudes Applied sciences bit error rate (BER) Circuit properties Design. Technologies. Operation analysis. Testing Distortion Distortion measurement Electric, optical and optoelectronic circuits Electronic circuits Electronic equipment and fabrication. Passive components, printed wiring boards, connectics Electronics Exact sciences and technology Gain Gain measurement Integrated circuits load board testing Low cost low-cost measurement Microwave circuits, microwave integrated circuits, microwave transmission lines, submillimeter wave circuits Phase distortion Phase measurement Power amplifiers Power measurement Radio frequencies Radio frequency RF power amplifiers (RF PAs) Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Sine waves vector network analyzer (VNA) Very large scale integration |
| title | Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers |
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