Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process

As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value,...

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Veröffentlicht in:IEEE transactions on reliability 2015-03, Vol.64 (1), p.463-472
Hauptverfasser: Man Ho Ling, Kwok Leung Tsui, Balakrishnan, Narayanaswamy
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creator Man Ho Ling
Kwok Leung Tsui
Balakrishnan, Narayanaswamy
description As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed.
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fullrecord <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TR_2014_2337071</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6860326</ieee_id><sourcerecordid>10_1109_TR_2014_2337071</sourcerecordid><originalsourceid>FETCH-LOGICAL-c401t-5dc8230454196bb38d7ca7e109b501c1a7f3d7e2358471b702078f4e1733b8343</originalsourceid><addsrcrecordid>eNo9kE1Lw0AQQBdRsFbPHrzsH0g7sx_ZzbFWrUJBrRWPYbOZaCRpZDce8u9NafE0DLw3MI-xa4QZImTz7WYmANVMSGnA4AmboNY2QSPwlE0A0CaZFtk5u4jxe1yVyuyEfSy8p4aC66nkd_QZXOn6utvxxc41Q6wjr7rA-y_ir7-uqfuBdxV3_G2IPbX81sVRG-k9sHJt6_hL6DzFeMnOKtdEujrOKXt_uN8uH5P18-ppuVgnXgH2iS69FRKUVpilRSFtabwzNP5TaECPzlSyNCSktspgYUCAsZUiNFIWVio5ZfPDXR-6GANV-U-oWxeGHCHfd8m3m3zfJT92GY2bg1ET0T-d2hSkSOUfddldEA</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process</title><source>IEEE Electronic Library (IEL)</source><creator>Man Ho Ling ; Kwok Leung Tsui ; Balakrishnan, Narayanaswamy</creator><creatorcontrib>Man Ho Ling ; Kwok Leung Tsui ; Balakrishnan, Narayanaswamy</creatorcontrib><description>As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed.</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/TR.2014.2337071</identifier><identifier>CODEN: IERQAD</identifier><language>eng</language><publisher>IEEE</publisher><subject>Accelerated degradation analysis ; Acceleration ; Approximation methods ; asymptotic confidence interval ; Degradation ; gamma process ; maximum likelihood estimate ; Maximum likelihood estimation ; Reliability ; remaining useful life ; Stress ; system health</subject><ispartof>IEEE transactions on reliability, 2015-03, Vol.64 (1), p.463-472</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c401t-5dc8230454196bb38d7ca7e109b501c1a7f3d7e2358471b702078f4e1733b8343</citedby><cites>FETCH-LOGICAL-c401t-5dc8230454196bb38d7ca7e109b501c1a7f3d7e2358471b702078f4e1733b8343</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6860326$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,778,782,794,27907,27908,54741</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6860326$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Man Ho Ling</creatorcontrib><creatorcontrib>Kwok Leung Tsui</creatorcontrib><creatorcontrib>Balakrishnan, Narayanaswamy</creatorcontrib><title>Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process</title><title>IEEE transactions on reliability</title><addtitle>TR</addtitle><description>As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed.</description><subject>Accelerated degradation analysis</subject><subject>Acceleration</subject><subject>Approximation methods</subject><subject>asymptotic confidence interval</subject><subject>Degradation</subject><subject>gamma process</subject><subject>maximum likelihood estimate</subject><subject>Maximum likelihood estimation</subject><subject>Reliability</subject><subject>remaining useful life</subject><subject>Stress</subject><subject>system health</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kE1Lw0AQQBdRsFbPHrzsH0g7sx_ZzbFWrUJBrRWPYbOZaCRpZDce8u9NafE0DLw3MI-xa4QZImTz7WYmANVMSGnA4AmboNY2QSPwlE0A0CaZFtk5u4jxe1yVyuyEfSy8p4aC66nkd_QZXOn6utvxxc41Q6wjr7rA-y_ir7-uqfuBdxV3_G2IPbX81sVRG-k9sHJt6_hL6DzFeMnOKtdEujrOKXt_uN8uH5P18-ppuVgnXgH2iS69FRKUVpilRSFtabwzNP5TaECPzlSyNCSktspgYUCAsZUiNFIWVio5ZfPDXR-6GANV-U-oWxeGHCHfd8m3m3zfJT92GY2bg1ET0T-d2hSkSOUfddldEA</recordid><startdate>20150301</startdate><enddate>20150301</enddate><creator>Man Ho Ling</creator><creator>Kwok Leung Tsui</creator><creator>Balakrishnan, Narayanaswamy</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20150301</creationdate><title>Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process</title><author>Man Ho Ling ; Kwok Leung Tsui ; Balakrishnan, Narayanaswamy</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c401t-5dc8230454196bb38d7ca7e109b501c1a7f3d7e2358471b702078f4e1733b8343</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Accelerated degradation analysis</topic><topic>Acceleration</topic><topic>Approximation methods</topic><topic>asymptotic confidence interval</topic><topic>Degradation</topic><topic>gamma process</topic><topic>maximum likelihood estimate</topic><topic>Maximum likelihood estimation</topic><topic>Reliability</topic><topic>remaining useful life</topic><topic>Stress</topic><topic>system health</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Man Ho Ling</creatorcontrib><creatorcontrib>Kwok Leung Tsui</creatorcontrib><creatorcontrib>Balakrishnan, Narayanaswamy</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Man Ho Ling</au><au>Kwok Leung Tsui</au><au>Balakrishnan, Narayanaswamy</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process</atitle><jtitle>IEEE transactions on reliability</jtitle><stitle>TR</stitle><date>2015-03-01</date><risdate>2015</risdate><volume>64</volume><issue>1</issue><spage>463</spage><epage>472</epage><pages>463-472</pages><issn>0018-9529</issn><eissn>1558-1721</eissn><coden>IERQAD</coden><abstract>As most systems these days are highly reliable with long lifetimes, failures of systems become rare; consequently, traditional failure time analysis may not be able to provide a precise assessment of the system reliability. In this regard, a degradation measure, as a percentage of the initial value, is an alternate way of describing the system health. This paper presents accelerated degradation analysis that characterizes the health and quality of systems with monotonic and bounded degradation. The maximum likelihood estimates (MLEs) of the model parameters are derived, based on a gamma process, time-scale transformation, and a power link function for associating the covariates. Then, methods of estimating the reliability, the mean and median lifetime, the conditional reliability, and the remaining useful life of systems under normal use conditions are all described. Moreover, approximate confidence intervals for the parameters of interest are developed based on the observed Fisher information matrix. A model validation metric with exact power is introduced. A Monte Carlo simulation study is carried out for evaluating the performance of the proposed methods. For an illustration of the proposed model, and the methods of inference developed here, a numerical example involving light intensity of light emitting diodes (LED) is analyzed.</abstract><pub>IEEE</pub><doi>10.1109/TR.2014.2337071</doi><tpages>10</tpages></addata></record>
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subjects Accelerated degradation analysis
Acceleration
Approximation methods
asymptotic confidence interval
Degradation
gamma process
maximum likelihood estimate
Maximum likelihood estimation
Reliability
remaining useful life
Stress
system health
title Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-17T07%3A53%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Accelerated%20Degradation%20Analysis%20for%20the%20Quality%20of%20a%20System%20Based%20on%20the%20Gamma%20Process&rft.jtitle=IEEE%20transactions%20on%20reliability&rft.au=Man%20Ho%20Ling&rft.date=2015-03-01&rft.volume=64&rft.issue=1&rft.spage=463&rft.epage=472&rft.pages=463-472&rft.issn=0018-9529&rft.eissn=1558-1721&rft.coden=IERQAD&rft_id=info:doi/10.1109/TR.2014.2337071&rft_dat=%3Ccrossref_RIE%3E10_1109_TR_2014_2337071%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6860326&rfr_iscdi=true