Open & Short Circuit Reliability of Systems of Identical Items
The paper is about reliability and risk analysis of systems of s-identical, s-independent items in terms of their probabilities of failure in open and short circuit. It is importantly assumed that the system is operational while at least one (or as a special case, more) operational item is connected...
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Veröffentlicht in: | IEEE transactions on reliability 1986-12, Vol.35 (5), p.532-538 |
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container_title | IEEE transactions on reliability |
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creator | Jenney, B. W. Sherwin, D. J. |
description | The paper is about reliability and risk analysis of systems of s-identical, s-independent items in terms of their probabilities of failure in open and short circuit. It is importantly assumed that the system is operational while at least one (or as a special case, more) operational item is connected physically to the input and output of the system either directly or through other good or shorted items and there is no overall system short-circuit. Two or more items so connected, whether in physical series or parallel or any combination have the same effect as a single item, and such redundancy does not alter the item failure probabilities. The probabilities could be those arising from identical, s-independent distributions (iid) over a fixed period with fixed starting conditions or alternatively probabilities of failure upon switching on. The work applies therefore to systems of adjustable or self-adjusting items such as amplifiers, rheostats, or fluid control valves, but not, for example, to systems of fixed resistors if the output values of voltage and current are important. Methods are developed for finding the most reliable physical arrangements of 2, 3, 4, items given the item failure probabilities. These display symmetry arising from the equivalence of the reliability block diagrams for items in physical series failing short and items in physical parallel failing open and vice versa. Three or four items are often sufficient to meet reliability requirements. |
doi_str_mv | 10.1109/TR.1986.4335539 |
format | Article |
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W. ; Sherwin, D. J.</creator><creatorcontrib>Jenney, B. W. ; Sherwin, D. J.</creatorcontrib><description>The paper is about reliability and risk analysis of systems of s-identical, s-independent items in terms of their probabilities of failure in open and short circuit. It is importantly assumed that the system is operational while at least one (or as a special case, more) operational item is connected physically to the input and output of the system either directly or through other good or shorted items and there is no overall system short-circuit. Two or more items so connected, whether in physical series or parallel or any combination have the same effect as a single item, and such redundancy does not alter the item failure probabilities. The probabilities could be those arising from identical, s-independent distributions (iid) over a fixed period with fixed starting conditions or alternatively probabilities of failure upon switching on. The work applies therefore to systems of adjustable or self-adjusting items such as amplifiers, rheostats, or fluid control valves, but not, for example, to systems of fixed resistors if the output values of voltage and current are important. Methods are developed for finding the most reliable physical arrangements of 2, 3, 4, items given the item failure probabilities. These display symmetry arising from the equivalence of the reliability block diagrams for items in physical series failing short and items in physical parallel failing open and vice versa. Three or four items are often sufficient to meet reliability requirements.</description><identifier>ISSN: 0018-9529</identifier><identifier>EISSN: 1558-1721</identifier><identifier>DOI: 10.1109/TR.1986.4335539</identifier><identifier>CODEN: IERQAD</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Circuits ; Control systems ; Displays ; Equations ; Exact sciences and technology ; Operational research and scientific management ; Operational research. Management science ; Redundancy ; Reliability ; Reliability theory. Replacement problems ; Resistors ; Risk analysis ; Valves ; Voltage control</subject><ispartof>IEEE transactions on reliability, 1986-12, Vol.35 (5), p.532-538</ispartof><rights>1987 INIST-CNRS</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c288t-24b2dd01be92bfaea7d6335d23e03e724cca3bbf953aacb368bfe7e800c306d13</citedby><cites>FETCH-LOGICAL-c288t-24b2dd01be92bfaea7d6335d23e03e724cca3bbf953aacb368bfe7e800c306d13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4335539$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4335539$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=8166911$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Jenney, B. W.</creatorcontrib><creatorcontrib>Sherwin, D. J.</creatorcontrib><title>Open & Short Circuit Reliability of Systems of Identical Items</title><title>IEEE transactions on reliability</title><addtitle>TR</addtitle><description>The paper is about reliability and risk analysis of systems of s-identical, s-independent items in terms of their probabilities of failure in open and short circuit. It is importantly assumed that the system is operational while at least one (or as a special case, more) operational item is connected physically to the input and output of the system either directly or through other good or shorted items and there is no overall system short-circuit. Two or more items so connected, whether in physical series or parallel or any combination have the same effect as a single item, and such redundancy does not alter the item failure probabilities. The probabilities could be those arising from identical, s-independent distributions (iid) over a fixed period with fixed starting conditions or alternatively probabilities of failure upon switching on. The work applies therefore to systems of adjustable or self-adjusting items such as amplifiers, rheostats, or fluid control valves, but not, for example, to systems of fixed resistors if the output values of voltage and current are important. Methods are developed for finding the most reliable physical arrangements of 2, 3, 4, items given the item failure probabilities. These display symmetry arising from the equivalence of the reliability block diagrams for items in physical series failing short and items in physical parallel failing open and vice versa. Three or four items are often sufficient to meet reliability requirements.</description><subject>Applied sciences</subject><subject>Circuits</subject><subject>Control systems</subject><subject>Displays</subject><subject>Equations</subject><subject>Exact sciences and technology</subject><subject>Operational research and scientific management</subject><subject>Operational research. Management science</subject><subject>Redundancy</subject><subject>Reliability</subject><subject>Reliability theory. Replacement problems</subject><subject>Resistors</subject><subject>Risk analysis</subject><subject>Valves</subject><subject>Voltage control</subject><issn>0018-9529</issn><issn>1558-1721</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1986</creationdate><recordtype>article</recordtype><recordid>eNo9j81LwzAYxoMoOKdnD15yEG_t8ib9SC6CjKmDwWCb55KkbzDSrSOph_73tmzu9H4-D8-PkEdgKQBTs90mBSWLNBMiz4W6IhPIc5lAyeGaTBgDmaicq1tyF-PPMGaZkhPyuj7igb7Q7XcbOjr3wf76jm6w8dr4xnc9bR3d9rHDfRzbZY2Hzlvd0OW4uic3TjcRH851Sr7eF7v5Z7Jafyznb6vEcim7hGeG1zUDg4obp1GXdTHErLlAJrDkmbVaGONULrS2RhTSOCxRMmYFK2oQUzI7-drQxhjQVcfg9zr0FbBqxK92m2rEr874g-L5pDjqOMR1QR-sjxeZhKJQMBo_nd48Il6u_yZ_QDtiyw</recordid><startdate>19861201</startdate><enddate>19861201</enddate><creator>Jenney, B. W.</creator><creator>Sherwin, D. J.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19861201</creationdate><title>Open & Short Circuit Reliability of Systems of Identical Items</title><author>Jenney, B. W. ; Sherwin, D. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c288t-24b2dd01be92bfaea7d6335d23e03e724cca3bbf953aacb368bfe7e800c306d13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1986</creationdate><topic>Applied sciences</topic><topic>Circuits</topic><topic>Control systems</topic><topic>Displays</topic><topic>Equations</topic><topic>Exact sciences and technology</topic><topic>Operational research and scientific management</topic><topic>Operational research. Management science</topic><topic>Redundancy</topic><topic>Reliability</topic><topic>Reliability theory. Replacement problems</topic><topic>Resistors</topic><topic>Risk analysis</topic><topic>Valves</topic><topic>Voltage control</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jenney, B. W.</creatorcontrib><creatorcontrib>Sherwin, D. J.</creatorcontrib><collection>Pascal-Francis</collection><collection>CrossRef</collection><jtitle>IEEE transactions on reliability</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Jenney, B. W.</au><au>Sherwin, D. J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Open & Short Circuit Reliability of Systems of Identical Items</atitle><jtitle>IEEE transactions on reliability</jtitle><stitle>TR</stitle><date>1986-12-01</date><risdate>1986</risdate><volume>35</volume><issue>5</issue><spage>532</spage><epage>538</epage><pages>532-538</pages><issn>0018-9529</issn><eissn>1558-1721</eissn><coden>IERQAD</coden><abstract>The paper is about reliability and risk analysis of systems of s-identical, s-independent items in terms of their probabilities of failure in open and short circuit. It is importantly assumed that the system is operational while at least one (or as a special case, more) operational item is connected physically to the input and output of the system either directly or through other good or shorted items and there is no overall system short-circuit. Two or more items so connected, whether in physical series or parallel or any combination have the same effect as a single item, and such redundancy does not alter the item failure probabilities. The probabilities could be those arising from identical, s-independent distributions (iid) over a fixed period with fixed starting conditions or alternatively probabilities of failure upon switching on. The work applies therefore to systems of adjustable or self-adjusting items such as amplifiers, rheostats, or fluid control valves, but not, for example, to systems of fixed resistors if the output values of voltage and current are important. Methods are developed for finding the most reliable physical arrangements of 2, 3, 4, items given the item failure probabilities. These display symmetry arising from the equivalence of the reliability block diagrams for items in physical series failing short and items in physical parallel failing open and vice versa. Three or four items are often sufficient to meet reliability requirements.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TR.1986.4335539</doi><tpages>7</tpages></addata></record> |
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ispartof | IEEE transactions on reliability, 1986-12, Vol.35 (5), p.532-538 |
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language | eng |
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source | IEEE Electronic Library (IEL) |
subjects | Applied sciences Circuits Control systems Displays Equations Exact sciences and technology Operational research and scientific management Operational research. Management science Redundancy Reliability Reliability theory. Replacement problems Resistors Risk analysis Valves Voltage control |
title | Open & Short Circuit Reliability of Systems of Identical Items |
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