A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors
Wide-area fault location (WAFL) refers to the estimation of fault distance on the faulted line using PMU data. A system of linear equations is formulated for WAFL, taking advantage of both voltage and current synchrophasors. This results in a generalized closed-form solution for the fault distance u...
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on power delivery 2022-12, Vol.37 (6), p.1-4 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 4 |
|---|---|
| container_issue | 6 |
| container_start_page | 1 |
| container_title | IEEE transactions on power delivery |
| container_volume | 37 |
| creator | Rezaei Jegarluei, M. El-Gorashi, T. Elmirghani, J. M. H. Azizi, S. |
| description | Wide-area fault location (WAFL) refers to the estimation of fault distance on the faulted line using PMU data. A system of linear equations is formulated for WAFL, taking advantage of both voltage and current synchrophasors. This results in a generalized closed-form solution for the fault distance using the weighted least-squares method. The main contribution of the letter is the rigorous derivation of the equation weights based on the statistical distributions of the superimposed errors, i.e. the differences between the errors of the corresponding pre- and post-fault synchrophasors. The method's effectiveness, robustness against different factors, and superiority over existing methods are demonstrated by extensive simulations and comparison studies conducted on the IEEE 39-bus test system. |
| doi_str_mv | 10.1109/TPWRD.2022.3214746 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TPWRD_2022_3214746</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>9919392</ieee_id><sourcerecordid>2739337698</sourcerecordid><originalsourceid>FETCH-LOGICAL-c269t-a8b8ad81a2157186689a0893b4ffc255e2ba17c9ef8f358b3f62616bebb60b783</originalsourceid><addsrcrecordid>eNo9kMtOwkAUhidGExF9Ad1M4ro4l3YuSwKCJiQawbBsZsoZKSlMnWkX8PSWS1ydxX--_5x8CD1SMqCU6JfF5_JrPGCEsQFnNJWpuEI9qrlMUkbUNeoRpbJEaSlv0V2MG0JISjTpocMQT2EHwVTlAVZ4VPkIq2QS_BbPfdU2pd9h5wNelitIhgEMnpi2avDMF-YU2j0erU0wRQOhPJS7H9ysAY_L2ITSnviIvcPztu7ybX2sx68h-BDv0Y0zVYSHy-yj78nrYvSWzD6m76PhLCmY0E1ilFVmpahhNJNUCaG0IUpzmzpXsCwDZg2VhQanHM-U5U4wQYUFawWxUvE-ej731sH_thCbfOPbsOtO5kxyzbkU-rjFzltF8DEGcHnd_WvCPqckPzrOT47zo-P84riDns5QCQD_gNadec34H89Jec0</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2739337698</pqid></control><display><type>article</type><title>A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors</title><source>IEEE Electronic Library (IEL)</source><creator>Rezaei Jegarluei, M. ; El-Gorashi, T. ; Elmirghani, J. M. H. ; Azizi, S.</creator><creatorcontrib>Rezaei Jegarluei, M. ; El-Gorashi, T. ; Elmirghani, J. M. H. ; Azizi, S.</creatorcontrib><description>Wide-area fault location (WAFL) refers to the estimation of fault distance on the faulted line using PMU data. A system of linear equations is formulated for WAFL, taking advantage of both voltage and current synchrophasors. This results in a generalized closed-form solution for the fault distance using the weighted least-squares method. The main contribution of the letter is the rigorous derivation of the equation weights based on the statistical distributions of the superimposed errors, i.e. the differences between the errors of the corresponding pre- and post-fault synchrophasors. The method's effectiveness, robustness against different factors, and superiority over existing methods are demonstrated by extensive simulations and comparison studies conducted on the IEEE 39-bus test system.</description><identifier>ISSN: 0885-8977</identifier><identifier>EISSN: 1937-4208</identifier><identifier>DOI: 10.1109/TPWRD.2022.3214746</identifier><identifier>CODEN: ITPDE5</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Circuit faults ; Current measurement ; Errors ; Fault location ; Least squares method ; Linear equations ; Mathematical models ; measurement error ; Measurement errors ; Phasor measurement units ; Statistical distributions ; superimposed circuit ; synchrophasors ; Wide-area fault location (WAFL)</subject><ispartof>IEEE transactions on power delivery, 2022-12, Vol.37 (6), p.1-4</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2022</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c269t-a8b8ad81a2157186689a0893b4ffc255e2ba17c9ef8f358b3f62616bebb60b783</citedby><cites>FETCH-LOGICAL-c269t-a8b8ad81a2157186689a0893b4ffc255e2ba17c9ef8f358b3f62616bebb60b783</cites><orcidid>0000-0001-9744-1790 ; 0000-0002-9274-1177 ; 0000-0002-6770-7161 ; 0000-0002-3319-9103</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9919392$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/9919392$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Rezaei Jegarluei, M.</creatorcontrib><creatorcontrib>El-Gorashi, T.</creatorcontrib><creatorcontrib>Elmirghani, J. M. H.</creatorcontrib><creatorcontrib>Azizi, S.</creatorcontrib><title>A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors</title><title>IEEE transactions on power delivery</title><addtitle>TPWRD</addtitle><description>Wide-area fault location (WAFL) refers to the estimation of fault distance on the faulted line using PMU data. A system of linear equations is formulated for WAFL, taking advantage of both voltage and current synchrophasors. This results in a generalized closed-form solution for the fault distance using the weighted least-squares method. The main contribution of the letter is the rigorous derivation of the equation weights based on the statistical distributions of the superimposed errors, i.e. the differences between the errors of the corresponding pre- and post-fault synchrophasors. The method's effectiveness, robustness against different factors, and superiority over existing methods are demonstrated by extensive simulations and comparison studies conducted on the IEEE 39-bus test system.</description><subject>Circuit faults</subject><subject>Current measurement</subject><subject>Errors</subject><subject>Fault location</subject><subject>Least squares method</subject><subject>Linear equations</subject><subject>Mathematical models</subject><subject>measurement error</subject><subject>Measurement errors</subject><subject>Phasor measurement units</subject><subject>Statistical distributions</subject><subject>superimposed circuit</subject><subject>synchrophasors</subject><subject>Wide-area fault location (WAFL)</subject><issn>0885-8977</issn><issn>1937-4208</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2022</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMtOwkAUhidGExF9Ad1M4ro4l3YuSwKCJiQawbBsZsoZKSlMnWkX8PSWS1ydxX--_5x8CD1SMqCU6JfF5_JrPGCEsQFnNJWpuEI9qrlMUkbUNeoRpbJEaSlv0V2MG0JISjTpocMQT2EHwVTlAVZ4VPkIq2QS_BbPfdU2pd9h5wNelitIhgEMnpi2avDMF-YU2j0erU0wRQOhPJS7H9ysAY_L2ITSnviIvcPztu7ybX2sx68h-BDv0Y0zVYSHy-yj78nrYvSWzD6m76PhLCmY0E1ilFVmpahhNJNUCaG0IUpzmzpXsCwDZg2VhQanHM-U5U4wQYUFawWxUvE-ej731sH_thCbfOPbsOtO5kxyzbkU-rjFzltF8DEGcHnd_WvCPqckPzrOT47zo-P84riDns5QCQD_gNadec34H89Jec0</recordid><startdate>20221201</startdate><enddate>20221201</enddate><creator>Rezaei Jegarluei, M.</creator><creator>El-Gorashi, T.</creator><creator>Elmirghani, J. M. H.</creator><creator>Azizi, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>KR7</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9744-1790</orcidid><orcidid>https://orcid.org/0000-0002-9274-1177</orcidid><orcidid>https://orcid.org/0000-0002-6770-7161</orcidid><orcidid>https://orcid.org/0000-0002-3319-9103</orcidid></search><sort><creationdate>20221201</creationdate><title>A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors</title><author>Rezaei Jegarluei, M. ; El-Gorashi, T. ; Elmirghani, J. M. H. ; Azizi, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c269t-a8b8ad81a2157186689a0893b4ffc255e2ba17c9ef8f358b3f62616bebb60b783</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2022</creationdate><topic>Circuit faults</topic><topic>Current measurement</topic><topic>Errors</topic><topic>Fault location</topic><topic>Least squares method</topic><topic>Linear equations</topic><topic>Mathematical models</topic><topic>measurement error</topic><topic>Measurement errors</topic><topic>Phasor measurement units</topic><topic>Statistical distributions</topic><topic>superimposed circuit</topic><topic>synchrophasors</topic><topic>Wide-area fault location (WAFL)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rezaei Jegarluei, M.</creatorcontrib><creatorcontrib>El-Gorashi, T.</creatorcontrib><creatorcontrib>Elmirghani, J. M. H.</creatorcontrib><creatorcontrib>Azizi, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on power delivery</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Rezaei Jegarluei, M.</au><au>El-Gorashi, T.</au><au>Elmirghani, J. M. H.</au><au>Azizi, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors</atitle><jtitle>IEEE transactions on power delivery</jtitle><stitle>TPWRD</stitle><date>2022-12-01</date><risdate>2022</risdate><volume>37</volume><issue>6</issue><spage>1</spage><epage>4</epage><pages>1-4</pages><issn>0885-8977</issn><eissn>1937-4208</eissn><coden>ITPDE5</coden><abstract>Wide-area fault location (WAFL) refers to the estimation of fault distance on the faulted line using PMU data. A system of linear equations is formulated for WAFL, taking advantage of both voltage and current synchrophasors. This results in a generalized closed-form solution for the fault distance using the weighted least-squares method. The main contribution of the letter is the rigorous derivation of the equation weights based on the statistical distributions of the superimposed errors, i.e. the differences between the errors of the corresponding pre- and post-fault synchrophasors. The method's effectiveness, robustness against different factors, and superiority over existing methods are demonstrated by extensive simulations and comparison studies conducted on the IEEE 39-bus test system.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TPWRD.2022.3214746</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-9744-1790</orcidid><orcidid>https://orcid.org/0000-0002-9274-1177</orcidid><orcidid>https://orcid.org/0000-0002-6770-7161</orcidid><orcidid>https://orcid.org/0000-0002-3319-9103</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 0885-8977 |
| ispartof | IEEE transactions on power delivery, 2022-12, Vol.37 (6), p.1-4 |
| issn | 0885-8977 1937-4208 |
| language | eng |
| recordid | cdi_crossref_primary_10_1109_TPWRD_2022_3214746 |
| source | IEEE Electronic Library (IEL) |
| subjects | Circuit faults Current measurement Errors Fault location Least squares method Linear equations Mathematical models measurement error Measurement errors Phasor measurement units Statistical distributions superimposed circuit synchrophasors Wide-area fault location (WAFL) |
| title | A Generalized Closed-From Solution for Wide-Area Fault Location by Characterizing the Distributions of Superimposed Errors |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T00%3A10%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Generalized%20Closed-From%20Solution%20for%20Wide-Area%20Fault%20Location%20by%20Characterizing%20the%20Distributions%20of%20Superimposed%20Errors&rft.jtitle=IEEE%20transactions%20on%20power%20delivery&rft.au=Rezaei%20Jegarluei,%20M.&rft.date=2022-12-01&rft.volume=37&rft.issue=6&rft.spage=1&rft.epage=4&rft.pages=1-4&rft.issn=0885-8977&rft.eissn=1937-4208&rft.coden=ITPDE5&rft_id=info:doi/10.1109/TPWRD.2022.3214746&rft_dat=%3Cproquest_RIE%3E2739337698%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2739337698&rft_id=info:pmid/&rft_ieee_id=9919392&rfr_iscdi=true |