Probabilistic assessment of equipment trips due to voltage sags
This paper discusses the uncertainty involved in the behavior of sensitive equipment used in various industrial processes and the methodology to incorporate this effect in quantifying the equipment trips due to voltage sags over a specified time period. The exact and more precise counting of equipme...
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Veröffentlicht in: | IEEE transactions on power delivery 2006-04, Vol.21 (2), p.711-718 |
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description | This paper discusses the uncertainty involved in the behavior of sensitive equipment used in various industrial processes and the methodology to incorporate this effect in quantifying the equipment trips due to voltage sags over a specified time period. The exact and more precise counting of equipment trips is essential for the accurate economic assessment of power quality. Existing standards and previously published test results on the sensitivity of this equipment against voltage sags are critically reviewed and possible ranges for variation in equipment sensitivity are investigated. Four different probable behaviors within respective ranges were considered for the stochastic assessment of equipment trips due to voltage sags. This study is performed on a generic power system. |
doi_str_mv | 10.1109/TPWRD.2005.855447 |
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The exact and more precise counting of equipment trips is essential for the accurate economic assessment of power quality. Existing standards and previously published test results on the sensitivity of this equipment against voltage sags are critically reviewed and possible ranges for variation in equipment sensitivity are investigated. Four different probable behaviors within respective ranges were considered for the stochastic assessment of equipment trips due to voltage sags. This study is performed on a generic power system.</description><identifier>ISSN: 0885-8977</identifier><identifier>EISSN: 1937-4208</identifier><identifier>DOI: 10.1109/TPWRD.2005.855447</identifier><identifier>CODEN: ITPDE5</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Applied sciences ; Assessments ; Circuit faults ; Counting ; Disturbances. Regulation. Protection ; Economics ; Electrical engineering. Electrical power engineering ; Electrical power engineering ; Equipment costs ; Exact sciences and technology ; Frequency ; Performance analysis ; Performance evaluation ; Power generation economics ; Power networks and lines ; Power quality ; Probability theory ; Programmable control ; Testing. Reliability. Quality control ; Uncertainty ; Variable speed drives ; Voltage fluctuations ; Voltage sags ; voltage-tolerance curves</subject><ispartof>IEEE transactions on power delivery, 2006-04, Vol.21 (2), p.711-718</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c385t-5b639604b8ae1002eebe67d5e4ba3b0a600cec1b56d8a8aad33eeecd877942593</citedby><cites>FETCH-LOGICAL-c385t-5b639604b8ae1002eebe67d5e4ba3b0a600cec1b56d8a8aad33eeecd877942593</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1610682$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1610682$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17652651$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Gupta, C.P.</creatorcontrib><creatorcontrib>Milanovic, J.V.</creatorcontrib><title>Probabilistic assessment of equipment trips due to voltage sags</title><title>IEEE transactions on power delivery</title><addtitle>TPWRD</addtitle><description>This paper discusses the uncertainty involved in the behavior of sensitive equipment used in various industrial processes and the methodology to incorporate this effect in quantifying the equipment trips due to voltage sags over a specified time period. The exact and more precise counting of equipment trips is essential for the accurate economic assessment of power quality. Existing standards and previously published test results on the sensitivity of this equipment against voltage sags are critically reviewed and possible ranges for variation in equipment sensitivity are investigated. Four different probable behaviors within respective ranges were considered for the stochastic assessment of equipment trips due to voltage sags. This study is performed on a generic power system.</description><subject>Applied sciences</subject><subject>Assessments</subject><subject>Circuit faults</subject><subject>Counting</subject><subject>Disturbances. Regulation. Protection</subject><subject>Economics</subject><subject>Electrical engineering. Electrical power engineering</subject><subject>Electrical power engineering</subject><subject>Equipment costs</subject><subject>Exact sciences and technology</subject><subject>Frequency</subject><subject>Performance analysis</subject><subject>Performance evaluation</subject><subject>Power generation economics</subject><subject>Power networks and lines</subject><subject>Power quality</subject><subject>Probability theory</subject><subject>Programmable control</subject><subject>Testing. Reliability. Quality control</subject><subject>Uncertainty</subject><subject>Variable speed drives</subject><subject>Voltage fluctuations</subject><subject>Voltage sags</subject><subject>voltage-tolerance curves</subject><issn>0885-8977</issn><issn>1937-4208</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNp9kE9LxDAQxYMouK5-APFSBPXUdZI0aXIS8T8sKKJ4DGk6K5Huds20gt_erisIHjwNw_zeY95jbJ_DhHOwp08PL4-XEwGgJkapoig32IhbWeaFALPJRmCMyo0ty222Q_QGAAVYGLGzh9RWvopNpC6GzBMh0RwXXdbOMnzv4_J76VJcUlb3mHVt9tE2nX_FjPwr7bKtmW8I937mmD1fXz1d3ObT-5u7i_NpHqRRXa4qLa2GojIeOYBArFCXtcKi8rICrwECBl4pXRtvvK-lRMRQm7K0hVBWjtnJ2neZ2vceqXPzSAGbxi-w7ckZq4WQgsNAHv9LCgPKWG4G8PAP-Nb2aTGkcEbr4W1piwHiayiklijhzC1TnPv06Ti4VfPuu3m3at6tmx80Rz_GnoJvZskvQqRfYamV0IoP3MGai0PW37PmoI2QXxBNjDk</recordid><startdate>20060401</startdate><enddate>20060401</enddate><creator>Gupta, C.P.</creator><creator>Milanovic, J.V.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>KR7</scope><scope>L7M</scope><scope>F28</scope></search><sort><creationdate>20060401</creationdate><title>Probabilistic assessment of equipment trips due to voltage sags</title><author>Gupta, C.P. ; Milanovic, J.V.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c385t-5b639604b8ae1002eebe67d5e4ba3b0a600cec1b56d8a8aad33eeecd877942593</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Applied sciences</topic><topic>Assessments</topic><topic>Circuit faults</topic><topic>Counting</topic><topic>Disturbances. Regulation. Protection</topic><topic>Economics</topic><topic>Electrical engineering. Electrical power engineering</topic><topic>Electrical power engineering</topic><topic>Equipment costs</topic><topic>Exact sciences and technology</topic><topic>Frequency</topic><topic>Performance analysis</topic><topic>Performance evaluation</topic><topic>Power generation economics</topic><topic>Power networks and lines</topic><topic>Power quality</topic><topic>Probability theory</topic><topic>Programmable control</topic><topic>Testing. Reliability. Quality control</topic><topic>Uncertainty</topic><topic>Variable speed drives</topic><topic>Voltage fluctuations</topic><topic>Voltage sags</topic><topic>voltage-tolerance curves</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gupta, C.P.</creatorcontrib><creatorcontrib>Milanovic, J.V.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><jtitle>IEEE transactions on power delivery</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gupta, C.P.</au><au>Milanovic, J.V.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Probabilistic assessment of equipment trips due to voltage sags</atitle><jtitle>IEEE transactions on power delivery</jtitle><stitle>TPWRD</stitle><date>2006-04-01</date><risdate>2006</risdate><volume>21</volume><issue>2</issue><spage>711</spage><epage>718</epage><pages>711-718</pages><issn>0885-8977</issn><eissn>1937-4208</eissn><coden>ITPDE5</coden><abstract>This paper discusses the uncertainty involved in the behavior of sensitive equipment used in various industrial processes and the methodology to incorporate this effect in quantifying the equipment trips due to voltage sags over a specified time period. The exact and more precise counting of equipment trips is essential for the accurate economic assessment of power quality. Existing standards and previously published test results on the sensitivity of this equipment against voltage sags are critically reviewed and possible ranges for variation in equipment sensitivity are investigated. Four different probable behaviors within respective ranges were considered for the stochastic assessment of equipment trips due to voltage sags. This study is performed on a generic power system.</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TPWRD.2005.855447</doi><tpages>8</tpages></addata></record> |
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subjects | Applied sciences Assessments Circuit faults Counting Disturbances. Regulation. Protection Economics Electrical engineering. Electrical power engineering Electrical power engineering Equipment costs Exact sciences and technology Frequency Performance analysis Performance evaluation Power generation economics Power networks and lines Power quality Probability theory Programmable control Testing. Reliability. Quality control Uncertainty Variable speed drives Voltage fluctuations Voltage sags voltage-tolerance curves |
title | Probabilistic assessment of equipment trips due to voltage sags |
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