Sensitivity of personal computers to voltage sags and short interruptions
This paper discusses the sensitivity of personal computers (PCs) to voltage sags and short interruptions on the basis of the extensive test results. Existing standards and previously published works are reviewed, and a description of a used testing procedure is presented. The following tests were pe...
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Veröffentlicht in: | IEEE transactions on power delivery 2005-01, Vol.20 (1), p.375-383 |
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creator | Djokic, S.Z. Desmet, J. Vanalme, G. Milanovic, J.V. Stockman, K. |
description | This paper discusses the sensitivity of personal computers (PCs) to voltage sags and short interruptions on the basis of the extensive test results. Existing standards and previously published works are reviewed, and a description of a used testing procedure is presented. The following tests were performed: sensitivity to rectangular voltage sags with ideal and nonideal supply characteristics, and sensitivity to voltage sags caused by the starting of large motors. The results obtained emphasize the importance of clear definition of the malfunction criteria for this equipment. |
doi_str_mv | 10.1109/TPWRD.2004.837828 |
format | Article |
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Existing standards and previously published works are reviewed, and a description of a used testing procedure is presented. The following tests were performed: sensitivity to rectangular voltage sags with ideal and nonideal supply characteristics, and sensitivity to voltage sags caused by the starting of large motors. The results obtained emphasize the importance of clear definition of the malfunction criteria for this equipment.</description><subject>Application software</subject><subject>Computer applications</subject><subject>Control systems</subject><subject>Costs</subject><subject>Malfunction criterion</subject><subject>Microcomputers</subject><subject>Personal communication networks</subject><subject>Power engineering computing</subject><subject>Power quality</subject><subject>short interruption</subject><subject>Testing</subject><subject>Voltage fluctuations</subject><subject>voltage sag</subject><subject>voltage-tolerance curve</subject><issn>0885-8977</issn><issn>1937-4208</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2005</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpFkF1LwzAYhYMoOKc_QLzJH2jNm7b5uJT5NRgoOvGyvE3TGdmakmSD_Xs7J3h1OPCcc_EQcg0sB2D6dvn6-Xafc8bKXBVScXVCJqALmZWcqVMyYUpVmdJSnpOLGL_ZCDLNJmT-bvvoktu5tKe-o4MN0fe4psZvhm0aG02e7vw64crSiKtIsW9p_PIhUdePQNgOyfk-XpKzDtfRXv3llHw8Pixnz9ni5Wk-u1tkhosqZU2LXAtrUKC0qsFOcGSgWdcxYVEoBMEa01atsYI3AJVSxoimBMBKlxyLKYHjrwk-xmC7eghug2FfA6sPLupfF_XBRX10MW5ujhtnrf3nC1kByOIH7NhdkQ</recordid><startdate>200501</startdate><enddate>200501</enddate><creator>Djokic, S.Z.</creator><creator>Desmet, J.</creator><creator>Vanalme, G.</creator><creator>Milanovic, J.V.</creator><creator>Stockman, K.</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200501</creationdate><title>Sensitivity of personal computers to voltage sags and short interruptions</title><author>Djokic, S.Z. ; Desmet, J. ; Vanalme, G. ; Milanovic, J.V. ; Stockman, K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c265t-bda296eca6a7e8baf62a0190ff06ea68a160bcd5dce62b11588cc6b411a5942a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Application software</topic><topic>Computer applications</topic><topic>Control systems</topic><topic>Costs</topic><topic>Malfunction criterion</topic><topic>Microcomputers</topic><topic>Personal communication networks</topic><topic>Power engineering computing</topic><topic>Power quality</topic><topic>short interruption</topic><topic>Testing</topic><topic>Voltage fluctuations</topic><topic>voltage sag</topic><topic>voltage-tolerance curve</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Djokic, S.Z.</creatorcontrib><creatorcontrib>Desmet, J.</creatorcontrib><creatorcontrib>Vanalme, G.</creatorcontrib><creatorcontrib>Milanovic, J.V.</creatorcontrib><creatorcontrib>Stockman, K.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on power delivery</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Djokic, S.Z.</au><au>Desmet, J.</au><au>Vanalme, G.</au><au>Milanovic, J.V.</au><au>Stockman, K.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sensitivity of personal computers to voltage sags and short interruptions</atitle><jtitle>IEEE transactions on power delivery</jtitle><stitle>TPWRD</stitle><date>2005-01</date><risdate>2005</risdate><volume>20</volume><issue>1</issue><spage>375</spage><epage>383</epage><pages>375-383</pages><issn>0885-8977</issn><eissn>1937-4208</eissn><coden>ITPDE5</coden><abstract>This paper discusses the sensitivity of personal computers (PCs) to voltage sags and short interruptions on the basis of the extensive test results. Existing standards and previously published works are reviewed, and a description of a used testing procedure is presented. The following tests were performed: sensitivity to rectangular voltage sags with ideal and nonideal supply characteristics, and sensitivity to voltage sags caused by the starting of large motors. The results obtained emphasize the importance of clear definition of the malfunction criteria for this equipment.</abstract><pub>IEEE</pub><doi>10.1109/TPWRD.2004.837828</doi><tpages>9</tpages></addata></record> |
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subjects | Application software Computer applications Control systems Costs Malfunction criterion Microcomputers Personal communication networks Power engineering computing Power quality short interruption Testing Voltage fluctuations voltage sag voltage-tolerance curve |
title | Sensitivity of personal computers to voltage sags and short interruptions |
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