Potential Failure Risk of Fault Location for Modular Multilevel Converters Under Light Loads and a Current Reshaping-Based Solution

In the state-of-the-art fault location of modular multilevel converters, capacitor voltage deviations between the faulty and healthy submodules are extensively utilized to identify open-circuit faults. However, there is a potential risk of overlooking the ineffectiveness of the fault location under...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on power electronics 2024-03, Vol.39 (3), p.3601-3612
Hauptverfasser:	Zhang, Yaqian, Zhang, Yi, Zhang, Jianzhong, Deng, Fujin, Blaabjerg, Frede
Format:	Artikel
Sprache:	eng
Schlagworte:	Capacitors Circuit faults Circuits Current injection Deviation Electric potential Fault detection Fault location light load condition modular multilevel converter (MMC) Multilevel converters open-circuit fault location Voltage
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!