Influence of Shunt Reactors on Switching Surges
On the basis of transient network analyzer studies this paper discusses the influence of EHV shunt reactors on the overvoltages occurring during breaker operations on transmission systems. The comparative importance of line losses and reactor losses on the decay of the trapped charge voltages that o...
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| Veröffentlicht in: | IEEE transactions on power apparatus and systems 1970-11, Vol.PAS-89 (8), p.1727-1736 |
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| container_end_page | 1736 |
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| container_issue | 8 |
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| container_title | IEEE transactions on power apparatus and systems |
| container_volume | PAS-89 |
| creator | Clerici, Alessandro Ruckstuhl, G. Vian, A. |
| description | On the basis of transient network analyzer studies this paper discusses the influence of EHV shunt reactors on the overvoltages occurring during breaker operations on transmission systems. The comparative importance of line losses and reactor losses on the decay of the trapped charge voltages that oscillate with frequencies dictated by line capacitances and shunt reactor inductances is analyzed. Emphasis is placed on the influence on these oscillations of different types of faults and line asymmetries. |
| doi_str_mv | 10.1109/TPAS.1970.292756 |
| format | Article |
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The comparative importance of line losses and reactor losses on the decay of the trapped charge voltages that oscillate with frequencies dictated by line capacitances and shunt reactor inductances is analyzed. Emphasis is placed on the influence on these oscillations of different types of faults and line asymmetries.</description><identifier>ISSN: 0018-9510</identifier><identifier>EISSN: 2995-6323</identifier><identifier>DOI: 10.1109/TPAS.1970.292756</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Control systems ; Frequency ; Inductors ; Power system transients ; Shunt (electrical) ; Surges ; System testing ; Transient analysis ; Voltage control</subject><ispartof>IEEE transactions on power apparatus and systems, 1970-11, Vol.PAS-89 (8), p.1727-1736</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c263t-91f000a95d7a9ff510a01538f5dfcca9e21ca6a58e1ddfa1bf77c07beb312de83</citedby><cites>FETCH-LOGICAL-c263t-91f000a95d7a9ff510a01538f5dfcca9e21ca6a58e1ddfa1bf77c07beb312de83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4074256$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,777,781,793,27905,27906,54739</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4074256$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Clerici, Alessandro</creatorcontrib><creatorcontrib>Ruckstuhl, G.</creatorcontrib><creatorcontrib>Vian, A.</creatorcontrib><title>Influence of Shunt Reactors on Switching Surges</title><title>IEEE transactions on power apparatus and systems</title><addtitle>T-PAS</addtitle><description>On the basis of transient network analyzer studies this paper discusses the influence of EHV shunt reactors on the overvoltages occurring during breaker operations on transmission systems. The comparative importance of line losses and reactor losses on the decay of the trapped charge voltages that oscillate with frequencies dictated by line capacitances and shunt reactor inductances is analyzed. Emphasis is placed on the influence on these oscillations of different types of faults and line asymmetries.</description><subject>Capacitance</subject><subject>Control systems</subject><subject>Frequency</subject><subject>Inductors</subject><subject>Power system transients</subject><subject>Shunt (electrical)</subject><subject>Surges</subject><subject>System testing</subject><subject>Transient analysis</subject><subject>Voltage control</subject><issn>0018-9510</issn><issn>2995-6323</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1970</creationdate><recordtype>article</recordtype><recordid>eNo9j09LwzAYxoMoWKd3wUu-QLv3TZamOY6hbjBQ7DyXNH2zVWYrTYv47W2peHoOzz9-jN0jJIhglofXdZ6g0ZAII7RKL1gkjFFxKoW8ZBEAZrFRCNfsJoQPAAkpYsSWu8afB2oc8dbz_DQ0PX8j6_q2C7xteP5d9-5UN0eeD92Rwi278vYc6O5PF-z96fGw2cb7l-fdZr2PnUhlHxv0AGCNqrQ13o-_FlDJzKvKO2cNCXQ2tSojrCpvsfRaO9AllRJFRZlcMJh3XdeG0JEvvrr603Y_BUIxARcTcDEBFzPwWHmYKzUR_cdXoFdidH8BUKxSBg</recordid><startdate>197011</startdate><enddate>197011</enddate><creator>Clerici, Alessandro</creator><creator>Ruckstuhl, G.</creator><creator>Vian, A.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>197011</creationdate><title>Influence of Shunt Reactors on Switching Surges</title><author>Clerici, Alessandro ; Ruckstuhl, G. ; Vian, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c263t-91f000a95d7a9ff510a01538f5dfcca9e21ca6a58e1ddfa1bf77c07beb312de83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1970</creationdate><topic>Capacitance</topic><topic>Control systems</topic><topic>Frequency</topic><topic>Inductors</topic><topic>Power system transients</topic><topic>Shunt (electrical)</topic><topic>Surges</topic><topic>System testing</topic><topic>Transient analysis</topic><topic>Voltage control</topic><toplevel>online_resources</toplevel><creatorcontrib>Clerici, Alessandro</creatorcontrib><creatorcontrib>Ruckstuhl, G.</creatorcontrib><creatorcontrib>Vian, A.</creatorcontrib><collection>CrossRef</collection><jtitle>IEEE transactions on power apparatus and systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Clerici, Alessandro</au><au>Ruckstuhl, G.</au><au>Vian, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of Shunt Reactors on Switching Surges</atitle><jtitle>IEEE transactions on power apparatus and systems</jtitle><stitle>T-PAS</stitle><date>1970-11</date><risdate>1970</risdate><volume>PAS-89</volume><issue>8</issue><spage>1727</spage><epage>1736</epage><pages>1727-1736</pages><issn>0018-9510</issn><eissn>2995-6323</eissn><abstract>On the basis of transient network analyzer studies this paper discusses the influence of EHV shunt reactors on the overvoltages occurring during breaker operations on transmission systems. The comparative importance of line losses and reactor losses on the decay of the trapped charge voltages that oscillate with frequencies dictated by line capacitances and shunt reactor inductances is analyzed. Emphasis is placed on the influence on these oscillations of different types of faults and line asymmetries.</abstract><pub>IEEE</pub><doi>10.1109/TPAS.1970.292756</doi><tpages>10</tpages></addata></record> |
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| identifier | ISSN: 0018-9510 |
| ispartof | IEEE transactions on power apparatus and systems, 1970-11, Vol.PAS-89 (8), p.1727-1736 |
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| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Capacitance Control systems Frequency Inductors Power system transients Shunt (electrical) Surges System testing Transient analysis Voltage control |
| title | Influence of Shunt Reactors on Switching Surges |
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