Scan-Based Radiation Test Method Using SRAM Dosimeter for Beam Characterization

We performed single event effects (SEE) tests by scanning an SRAM-based dosimeter along both horizontal and vertical axes, in small discrete-steps, in the beamline to characterize fluence spatial uniformity across the beam active area. The dosimeters were designed and populated with 41 SRAM (Static...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on nuclear science 2025, p.1-1
Hauptverfasser:	Khan, Saqib A., Eom, Daeyong, Cho, Changhee, Woo, Seungjoo, Kim, Hyeonju, Chung, Sung S., Kih, Joongsik, Kim, Kiseog, Wender, Stephen, Lee, Keunwoo, Kim, Youngboo
Format:	Artikel
Sprache:	eng
Schlagworte:	Area measurement Beam profile device characterization Graphical models Layout Neutrons Particle beams Radiation effects radiation testing Random access memory Semiconductor device measurement Sensitivity single event effects (SEE) SRAM dosimeter Time measurement
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!