Lockstep Dual-Core ARM A9: Implementation and Resilience Analysis Under Heavy Ion-Induced Soft Errors

This paper presents a dual-core lockstep (DCLS) implementation to protect hard-core processors against radiation-induced soft errors. The proposed DCLS is applied to an Advanced RISC Machine Cortex-A9 embedded processor. Different software optimizations were evaluated to assess their impact on perfo...

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Veröffentlicht in:	IEEE transactions on nuclear science 2018-08, Vol.65 (8), p.1783-1790
Hauptverfasser:	Barros de Oliveira, Adria, Severino Rodrigues, Gennaro, Lima Kastensmidt, Fernanda, Added, Nemitala, Macchione, Eduardo L. A., Aguiar, Vitor A. P., Medina, Nilberto H., Silveira, Marcilei A. G.
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuit faults Context Embedded processors reliability Embedded systems fault injection Fault tolerance Field programmable gate arrays Heavy ions lockstep Microprocessors Optimization Program processors Radiation Radiation effects radiation experiments Registers soft error Soft errors System reliability
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