TID Effects on a Data Acquisition System With Design Diversity Redundancy
This paper describes the results of a total ionizing dose test on a data acquisition system (DAS) protected with a design diversity redundancy technique. The DAS is composed of three analog-to-digital converters (ADCs) and two voters, implementing different levels of diversity (architectural and tem...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2018-01, Vol.65 (1), p.583-590 |
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| container_title | IEEE transactions on nuclear science |
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| creator | Gonzalez, Carlos Julio Vaz, Rafael G. Oliveira, Matheus B. Leorato, Vicente W. Goncalez, Odair L. Balen, Tiago R. |
| description | This paper describes the results of a total ionizing dose test on a data acquisition system (DAS) protected with a design diversity redundancy technique. The DAS is composed of three analog-to-digital converters (ADCs) and two voters, implementing different levels of diversity (architectural and temporal). This system is implemented on a 130-nm commercial mixed-signal (MS) programmable system-on-chip (PSoC 5) from Cypress Semiconductor. The system was tested under 60 Co gamma radiation with a dose rate of 1 krad(Si)/h reaching a total dose of 242 krad(Si). One of the system copies presented a significant degradation on its linearity during the irradiation, while the others kept the functionality with less severe degradation, evidencing the advantage of using diversity to improve resilience in MS redundant systems. Additionally, dynamic parameters of the ADCs are evaluated, and failure mechanisms are discussed. |
| doi_str_mv | 10.1109/TNS.2017.2782689 |
| format | Article |
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Additionally, dynamic parameters of the ADCs are evaluated, and failure mechanisms are discussed.</description><subject>Aerospace electronics</subject><subject>Analog to digital conversion</subject><subject>Analog to digital converters</subject><subject>Computer architecture</subject><subject>Data acquisition</subject><subject>Data acquisition systems</subject><subject>Degradation</subject><subject>Design diversity</subject><subject>Design engineering</subject><subject>Failure mechanisms</subject><subject>Gamma rays</subject><subject>Hardware</subject><subject>Irradiation</subject><subject>Linearity</subject><subject>mixed signal (MS)</subject><subject>programmable system-on-chip (PSoC)</subject><subject>Radiation dosage</subject><subject>radiation effects</subject><subject>Redundancy</subject><subject>Software</subject><subject>Synchronization</subject><subject>System on chip</subject><subject>Voters</subject><subject>γ Radiation</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1LAzEQxYMoWKt3wUvA89ZM9iPJsXRbLRQFW_EYstlZTbG77WZX2P_elBZPw8y8N_P4EXIPbALA1NPmdT3hDMSEC8kzqS7ICNJURpAKeUlGjIGMVKLUNbnxfhvaJGXpiCw3y5zOqwpt52lTU0Nz0xk6tYfeede5MFoPvsMd_XTdN83Ru6-a5u4X27Ae6DuWfV2a2g635KoyPx7vznVMPhbzzewlWr09L2fTVWS5gi4qSrRcKi5EVkkRh7QmTjAVcVYWCbMlWFvwDFRVSQZxwUqmYuAlCouorDLxmDye7u7b5tCj7_S26ds6vNSgpBRcxcEyJuyksm3jfYuV3rduZ9pBA9NHYDoA00dg-gwsWB5OFoeI_3IJUmQh3h87y2X0</recordid><startdate>201801</startdate><enddate>201801</enddate><creator>Gonzalez, Carlos Julio</creator><creator>Vaz, Rafael G.</creator><creator>Oliveira, Matheus B.</creator><creator>Leorato, Vicente W.</creator><creator>Goncalez, Odair L.</creator><creator>Balen, Tiago R.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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| subjects | Aerospace electronics Analog to digital conversion Analog to digital converters Computer architecture Data acquisition Data acquisition systems Degradation Design diversity Design engineering Failure mechanisms Gamma rays Hardware Irradiation Linearity mixed signal (MS) programmable system-on-chip (PSoC) Radiation dosage radiation effects Redundancy Software Synchronization System on chip Voters γ Radiation |
| title | TID Effects on a Data Acquisition System With Design Diversity Redundancy |
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