Modification of the LM124 Single Event Transients by Load Resistors

The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the...

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Veröffentlicht in:	IEEE transactions on nuclear science 2010-02, Vol.57 (1), p.358-365
Hauptverfasser:	Franco, F.J., Lopez-Calle, I., Izquierdo, J.G., Agapito, J.A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorption Amplifiers Critical current Distortion Laser irradiation Laser noise Lasers LM124 load effects Loads (forces) Networks operational amplifier Operational amplifiers Optical pulse generation Pulse amplifiers Resistors Shape Simulation single event transients SPICE Testing two-photon absorption
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