Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs
We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by s...
Gespeichert in:
Veröffentlicht in: | IEEE transactions on nuclear science 2004-10, Vol.51 (5), p.2957-2969 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 2969 |
---|---|
container_issue | 5 |
container_start_page | 2957 |
container_title | IEEE transactions on nuclear science |
container_volume | 51 |
creator | Samudrala, P.K. Ramos, J. Katkoori, S. |
description | We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by selectively applying triple modular redundancy (STMR) to these sensitive subcircuits. However, there is an increase in the number of the voter circuits required for the STMR circuits. Virtex has abundant number of tri-state buffers that can be employed to construct SEU immune majority voter circuits. We also present a SEU fault insertion simulator designed to introduce errors representing SEUs in the circuits. STMR method is thoroughly tested on MCNC'91 benchmarks. With a small loss of SEU immunity, the proposed STMR method can greatly reduce the area overhead of the hardened circuit when compared to the state-of-the-art triple modular redundancy (TMR). STMR method along with the readback and reconfiguration feature of Virtex can result in very high SEU immunity. |
doi_str_mv | 10.1109/TNS.2004.834955 |
format | Article |
fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TNS_2004_834955</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1344451</ieee_id><sourcerecordid>28598656</sourcerecordid><originalsourceid>FETCH-LOGICAL-c317t-246316e2e6caca9336b1541e765b9e62a9d4fb75824ed720a57c910af0b20c903</originalsourceid><addsrcrecordid>eNpdkMFLwzAUh4MoOKdnD16CB3GHbkmapMlRxjaFTcVt55Cmr9rRtTNpB_vv7ZggeHq8977f4_EhdEvJkFKiR6vX5ZARwocq5lqIM9SjQqiIikSdox4hVEWaa32JrkLYdC0XRPRQvoQSXFPsATe-2JWAF3XWltZjD1lbZbZyB_y4XC0-Bji1ATIciuqzhAj2UDW43QVouv1kPcBNXYK33TAcquYLQhFwXns8fZ89hWt0kdsywM1v7aP1dLIaP0fzt9nL-GkeuZgmTcS4jKkEBtJZZ3Ucy5QKTiGRItUgmdUZz9NEKMYhSxixInGaEpuTlBGnSdxHD6e7O19_txAasy2Cg7K0FdRtMEwJraSQHXj_D9zUra-634xmRCkpddJBoxPkfB2Ch9zsfLG1_mAoMUfpppNujtLNSXqXuDslCgD4o2POuaDxD1RyfFQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>920886697</pqid></control><display><type>article</type><title>Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs</title><source>IEEE Electronic Library (IEL)</source><creator>Samudrala, P.K. ; Ramos, J. ; Katkoori, S.</creator><creatorcontrib>Samudrala, P.K. ; Ramos, J. ; Katkoori, S.</creatorcontrib><description>We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by selectively applying triple modular redundancy (STMR) to these sensitive subcircuits. However, there is an increase in the number of the voter circuits required for the STMR circuits. Virtex has abundant number of tri-state buffers that can be employed to construct SEU immune majority voter circuits. We also present a SEU fault insertion simulator designed to introduce errors representing SEUs in the circuits. STMR method is thoroughly tested on MCNC'91 benchmarks. With a small loss of SEU immunity, the proposed STMR method can greatly reduce the area overhead of the hardened circuit when compared to the state-of-the-art triple modular redundancy (TMR). STMR method along with the readback and reconfiguration feature of Virtex can result in very high SEU immunity.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2004.834955</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Benchmark testing ; Circuit faults ; Circuit simulation ; Circuit synthesis ; Circuit testing ; Combinational circuits ; Field programmable gate arrays ; Redundancy ; Signal synthesis ; Single event upset</subject><ispartof>IEEE transactions on nuclear science, 2004-10, Vol.51 (5), p.2957-2969</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2004</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c317t-246316e2e6caca9336b1541e765b9e62a9d4fb75824ed720a57c910af0b20c903</citedby><cites>FETCH-LOGICAL-c317t-246316e2e6caca9336b1541e765b9e62a9d4fb75824ed720a57c910af0b20c903</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1344451$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1344451$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Samudrala, P.K.</creatorcontrib><creatorcontrib>Ramos, J.</creatorcontrib><creatorcontrib>Katkoori, S.</creatorcontrib><title>Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by selectively applying triple modular redundancy (STMR) to these sensitive subcircuits. However, there is an increase in the number of the voter circuits required for the STMR circuits. Virtex has abundant number of tri-state buffers that can be employed to construct SEU immune majority voter circuits. We also present a SEU fault insertion simulator designed to introduce errors representing SEUs in the circuits. STMR method is thoroughly tested on MCNC'91 benchmarks. With a small loss of SEU immunity, the proposed STMR method can greatly reduce the area overhead of the hardened circuit when compared to the state-of-the-art triple modular redundancy (TMR). STMR method along with the readback and reconfiguration feature of Virtex can result in very high SEU immunity.</description><subject>Benchmark testing</subject><subject>Circuit faults</subject><subject>Circuit simulation</subject><subject>Circuit synthesis</subject><subject>Circuit testing</subject><subject>Combinational circuits</subject><subject>Field programmable gate arrays</subject><subject>Redundancy</subject><subject>Signal synthesis</subject><subject>Single event upset</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkMFLwzAUh4MoOKdnD16CB3GHbkmapMlRxjaFTcVt55Cmr9rRtTNpB_vv7ZggeHq8977f4_EhdEvJkFKiR6vX5ZARwocq5lqIM9SjQqiIikSdox4hVEWaa32JrkLYdC0XRPRQvoQSXFPsATe-2JWAF3XWltZjD1lbZbZyB_y4XC0-Bji1ATIciuqzhAj2UDW43QVouv1kPcBNXYK33TAcquYLQhFwXns8fZ89hWt0kdsywM1v7aP1dLIaP0fzt9nL-GkeuZgmTcS4jKkEBtJZZ3Ucy5QKTiGRItUgmdUZz9NEKMYhSxixInGaEpuTlBGnSdxHD6e7O19_txAasy2Cg7K0FdRtMEwJraSQHXj_D9zUra-634xmRCkpddJBoxPkfB2Ch9zsfLG1_mAoMUfpppNujtLNSXqXuDslCgD4o2POuaDxD1RyfFQ</recordid><startdate>200410</startdate><enddate>200410</enddate><creator>Samudrala, P.K.</creator><creator>Ramos, J.</creator><creator>Katkoori, S.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7QF</scope><scope>7QL</scope><scope>7QQ</scope><scope>7SC</scope><scope>7SE</scope><scope>7SP</scope><scope>7SR</scope><scope>7T7</scope><scope>7TA</scope><scope>7TB</scope><scope>7U5</scope><scope>7U9</scope><scope>8BQ</scope><scope>8FD</scope><scope>C1K</scope><scope>F28</scope><scope>FR3</scope><scope>H8D</scope><scope>H94</scope><scope>JG9</scope><scope>JQ2</scope><scope>KR7</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><scope>M7N</scope><scope>P64</scope></search><sort><creationdate>200410</creationdate><title>Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs</title><author>Samudrala, P.K. ; Ramos, J. ; Katkoori, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c317t-246316e2e6caca9336b1541e765b9e62a9d4fb75824ed720a57c910af0b20c903</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Benchmark testing</topic><topic>Circuit faults</topic><topic>Circuit simulation</topic><topic>Circuit synthesis</topic><topic>Circuit testing</topic><topic>Combinational circuits</topic><topic>Field programmable gate arrays</topic><topic>Redundancy</topic><topic>Signal synthesis</topic><topic>Single event upset</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Samudrala, P.K.</creatorcontrib><creatorcontrib>Ramos, J.</creatorcontrib><creatorcontrib>Katkoori, S.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Aluminium Industry Abstracts</collection><collection>Bacteriology Abstracts (Microbiology B)</collection><collection>Ceramic Abstracts</collection><collection>Computer and Information Systems Abstracts</collection><collection>Corrosion Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Industrial and Applied Microbiology Abstracts (Microbiology A)</collection><collection>Materials Business File</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Virology and AIDS Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>AIDS and Cancer Research Abstracts</collection><collection>Materials Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Civil Engineering Abstracts</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><collection>Algology Mycology and Protozoology Abstracts (Microbiology C)</collection><collection>Biotechnology and BioEngineering Abstracts</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Samudrala, P.K.</au><au>Ramos, J.</au><au>Katkoori, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2004-10</date><risdate>2004</risdate><volume>51</volume><issue>5</issue><spage>2957</spage><epage>2969</epage><pages>2957-2969</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>We present a design technique for hardening combinational circuits mapped onto Xilinx Virtex FPGAs against single-event upsets (SEUs). The signal probabilities of the lines can be used to detect SEU sensitive subcircuits of a given combinational circuit. The circuit can be hardened against SEUs by selectively applying triple modular redundancy (STMR) to these sensitive subcircuits. However, there is an increase in the number of the voter circuits required for the STMR circuits. Virtex has abundant number of tri-state buffers that can be employed to construct SEU immune majority voter circuits. We also present a SEU fault insertion simulator designed to introduce errors representing SEUs in the circuits. STMR method is thoroughly tested on MCNC'91 benchmarks. With a small loss of SEU immunity, the proposed STMR method can greatly reduce the area overhead of the hardened circuit when compared to the state-of-the-art triple modular redundancy (TMR). STMR method along with the readback and reconfiguration feature of Virtex can result in very high SEU immunity.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TNS.2004.834955</doi><tpages>13</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-9499 |
ispartof | IEEE transactions on nuclear science, 2004-10, Vol.51 (5), p.2957-2969 |
issn | 0018-9499 1558-1578 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TNS_2004_834955 |
source | IEEE Electronic Library (IEL) |
subjects | Benchmark testing Circuit faults Circuit simulation Circuit synthesis Circuit testing Combinational circuits Field programmable gate arrays Redundancy Signal synthesis Single event upset |
title | Selective triple Modular redundancy (STMR) based single-event upset (SEU) tolerant synthesis for FPGAs |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T01%3A37%3A48IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Selective%20triple%20Modular%20redundancy%20(STMR)%20based%20single-event%20upset%20(SEU)%20tolerant%20synthesis%20for%20FPGAs&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Samudrala,%20P.K.&rft.date=2004-10&rft.volume=51&rft.issue=5&rft.spage=2957&rft.epage=2969&rft.pages=2957-2969&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.2004.834955&rft_dat=%3Cproquest_RIE%3E28598656%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=920886697&rft_id=info:pmid/&rft_ieee_id=1344451&rfr_iscdi=true |