A Low Walk, High Resolution Timing System for Silicon Detectors
Utilizing times of flight on the order of a nanosecond for heavy particle identification with silicon detectors, it is desirable to reliably distinguish time differences of approximately 100 picoseconds or less. In addition, the required timing circuitry must not substantially deteriorate amplitude...
Gespeichert in:
Veröffentlicht in: | IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968) Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968), 1968, Vol.15 (3), p.500-508 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 508 |
---|---|
container_issue | 3 |
container_start_page | 500 |
container_title | IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968) |
container_volume | 15 |
creator | Sherman, I. S. Roddick, R. G. Metz, A. J. |
description | Utilizing times of flight on the order of a nanosecond for heavy particle identification with silicon detectors, it is desirable to reliably distinguish time differences of approximately 100 picoseconds or less. In addition, the required timing circuitry must not substantially deteriorate amplitude resolution capability. In the system designed for this purpose the detector charge is first collected on the capacitance of the detector and fast, low noise, preamplifier and is later transferred to the charge sensitive preamplifier. The fast signal is processed to obtain good time resolution and low walk. The system has a FWHM time resolution of 40 picoseconds, referred to 5.8 MeV deposited in a 100 pF silicon detector. An actual peak width from 3 MeV deposited in an 80 pF silicon by He3 particles was 165 psec FWHM, which is about twice that expected if more optimum pulse shaping had been employed. The instrumental walk for a 100 to 1 amplitude range is less than 150 picoseconds, and is approximately 100 picoseconds for a 30 to 1 range. The noise added to the slow system is equal to that caused by an additional 17 pF of capacitance at its input, plus an overall increase of 5% or less for commonly used slow pulse shaping. |
doi_str_mv | 10.1109/TNS.1968.4324975 |
format | Article |
fullrecord | <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TNS_1968_4324975</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4324975</ieee_id><sourcerecordid>10_1109_TNS_1968_4324975</sourcerecordid><originalsourceid>FETCH-LOGICAL-c205t-232d9e1c07a2973db181218149a2237115bc3b36b263af03222030cb545f06e53</originalsourceid><addsrcrecordid>eNo9kM1Lw0AQxRdRsFbvgpfFs6kz-5FkT1JatUJRMBGPS7LdtKtpV7IR6X_vllYPwzC8NzOPHyGXCCNEULflczFCleYjwZlQmTwiA5QyT1Bm-TEZAGCeKKHUKTkL4SOOQoIckLsxnfsf-l61nzd05pYr-mqDb7975ze0dGu3WdJiG3q7po3vaOFaZ6Iytb01ve_COTlpqjbYi0MfkreH-3IyS-Yvj0-T8TwxDGSfMM4WyqKBrGIq44sac2SxhKoY4xmirA2veVqzlFcNcMYYcDC1FLKB1Eo-JNf7uz70Tgfj4v9VTLKJMbSQCJCxaIK9yXQ-hM42-qtz66rbagS9o6QjJb2jpA-U4srVfsVZa__tf-ovPSxgXA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>A Low Walk, High Resolution Timing System for Silicon Detectors</title><source>IEEE Electronic Library (IEL)</source><creator>Sherman, I. S. ; Roddick, R. G. ; Metz, A. J.</creator><creatorcontrib>Sherman, I. S. ; Roddick, R. G. ; Metz, A. J. ; Argonne National Lab., Ill</creatorcontrib><description>Utilizing times of flight on the order of a nanosecond for heavy particle identification with silicon detectors, it is desirable to reliably distinguish time differences of approximately 100 picoseconds or less. In addition, the required timing circuitry must not substantially deteriorate amplitude resolution capability. In the system designed for this purpose the detector charge is first collected on the capacitance of the detector and fast, low noise, preamplifier and is later transferred to the charge sensitive preamplifier. The fast signal is processed to obtain good time resolution and low walk. The system has a FWHM time resolution of 40 picoseconds, referred to 5.8 MeV deposited in a 100 pF silicon detector. An actual peak width from 3 MeV deposited in an 80 pF silicon by He3 particles was 165 psec FWHM, which is about twice that expected if more optimum pulse shaping had been employed. The instrumental walk for a 100 to 1 amplitude range is less than 150 picoseconds, and is approximately 100 picoseconds for a 30 to 1 range. The noise added to the slow system is equal to that caused by an additional 17 pF of capacitance at its input, plus an overall increase of 5% or less for commonly used slow pulse shaping.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.1968.4324975</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Circuit noise ; CIRCUITS ; DESIGN ; Detectors ; Instruments ; N26110 -Instrumentation-Radiation Detection Instruments- General Detectors & Monitors ; Preamplifiers ; Pulse shaping methods ; RADIATION DETECTORS, SEMICONDUCTOR (SILICON)/timing system for, design of low-walk high-resolution ; SEMICONDUCTOR COUNTERS ; SEMICONDUCTORS ; Signal processing ; Signal resolution ; SILICON ; SOLID-STATE COUNTERS ; Timing</subject><ispartof>IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968), 1968, Vol.15 (3), p.500-508</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c205t-232d9e1c07a2973db181218149a2237115bc3b36b263af03222030cb545f06e53</citedby><cites>FETCH-LOGICAL-c205t-232d9e1c07a2973db181218149a2237115bc3b36b263af03222030cb545f06e53</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4324975$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,885,4024,27923,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4324975$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttps://www.osti.gov/biblio/4510072$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Sherman, I. S.</creatorcontrib><creatorcontrib>Roddick, R. G.</creatorcontrib><creatorcontrib>Metz, A. J.</creatorcontrib><creatorcontrib>Argonne National Lab., Ill</creatorcontrib><title>A Low Walk, High Resolution Timing System for Silicon Detectors</title><title>IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968)</title><addtitle>TNS</addtitle><description>Utilizing times of flight on the order of a nanosecond for heavy particle identification with silicon detectors, it is desirable to reliably distinguish time differences of approximately 100 picoseconds or less. In addition, the required timing circuitry must not substantially deteriorate amplitude resolution capability. In the system designed for this purpose the detector charge is first collected on the capacitance of the detector and fast, low noise, preamplifier and is later transferred to the charge sensitive preamplifier. The fast signal is processed to obtain good time resolution and low walk. The system has a FWHM time resolution of 40 picoseconds, referred to 5.8 MeV deposited in a 100 pF silicon detector. An actual peak width from 3 MeV deposited in an 80 pF silicon by He3 particles was 165 psec FWHM, which is about twice that expected if more optimum pulse shaping had been employed. The instrumental walk for a 100 to 1 amplitude range is less than 150 picoseconds, and is approximately 100 picoseconds for a 30 to 1 range. The noise added to the slow system is equal to that caused by an additional 17 pF of capacitance at its input, plus an overall increase of 5% or less for commonly used slow pulse shaping.</description><subject>Capacitance</subject><subject>Circuit noise</subject><subject>CIRCUITS</subject><subject>DESIGN</subject><subject>Detectors</subject><subject>Instruments</subject><subject>N26110 -Instrumentation-Radiation Detection Instruments- General Detectors & Monitors</subject><subject>Preamplifiers</subject><subject>Pulse shaping methods</subject><subject>RADIATION DETECTORS, SEMICONDUCTOR (SILICON)/timing system for, design of low-walk high-resolution</subject><subject>SEMICONDUCTOR COUNTERS</subject><subject>SEMICONDUCTORS</subject><subject>Signal processing</subject><subject>Signal resolution</subject><subject>SILICON</subject><subject>SOLID-STATE COUNTERS</subject><subject>Timing</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1968</creationdate><recordtype>article</recordtype><recordid>eNo9kM1Lw0AQxRdRsFbvgpfFs6kz-5FkT1JatUJRMBGPS7LdtKtpV7IR6X_vllYPwzC8NzOPHyGXCCNEULflczFCleYjwZlQmTwiA5QyT1Bm-TEZAGCeKKHUKTkL4SOOQoIckLsxnfsf-l61nzd05pYr-mqDb7975ze0dGu3WdJiG3q7po3vaOFaZ6Iytb01ve_COTlpqjbYi0MfkreH-3IyS-Yvj0-T8TwxDGSfMM4WyqKBrGIq44sac2SxhKoY4xmirA2veVqzlFcNcMYYcDC1FLKB1Eo-JNf7uz70Tgfj4v9VTLKJMbSQCJCxaIK9yXQ-hM42-qtz66rbagS9o6QjJb2jpA-U4srVfsVZa__tf-ovPSxgXA</recordid><startdate>1968</startdate><enddate>1968</enddate><creator>Sherman, I. S.</creator><creator>Roddick, R. G.</creator><creator>Metz, A. J.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>1968</creationdate><title>A Low Walk, High Resolution Timing System for Silicon Detectors</title><author>Sherman, I. S. ; Roddick, R. G. ; Metz, A. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c205t-232d9e1c07a2973db181218149a2237115bc3b36b263af03222030cb545f06e53</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1968</creationdate><topic>Capacitance</topic><topic>Circuit noise</topic><topic>CIRCUITS</topic><topic>DESIGN</topic><topic>Detectors</topic><topic>Instruments</topic><topic>N26110 -Instrumentation-Radiation Detection Instruments- General Detectors & Monitors</topic><topic>Preamplifiers</topic><topic>Pulse shaping methods</topic><topic>RADIATION DETECTORS, SEMICONDUCTOR (SILICON)/timing system for, design of low-walk high-resolution</topic><topic>SEMICONDUCTOR COUNTERS</topic><topic>SEMICONDUCTORS</topic><topic>Signal processing</topic><topic>Signal resolution</topic><topic>SILICON</topic><topic>SOLID-STATE COUNTERS</topic><topic>Timing</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Sherman, I. S.</creatorcontrib><creatorcontrib>Roddick, R. G.</creatorcontrib><creatorcontrib>Metz, A. J.</creatorcontrib><creatorcontrib>Argonne National Lab., Ill</creatorcontrib><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sherman, I. S.</au><au>Roddick, R. G.</au><au>Metz, A. J.</au><aucorp>Argonne National Lab., Ill</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Low Walk, High Resolution Timing System for Silicon Detectors</atitle><jtitle>IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968)</jtitle><stitle>TNS</stitle><date>1968</date><risdate>1968</risdate><volume>15</volume><issue>3</issue><spage>500</spage><epage>508</epage><pages>500-508</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Utilizing times of flight on the order of a nanosecond for heavy particle identification with silicon detectors, it is desirable to reliably distinguish time differences of approximately 100 picoseconds or less. In addition, the required timing circuitry must not substantially deteriorate amplitude resolution capability. In the system designed for this purpose the detector charge is first collected on the capacitance of the detector and fast, low noise, preamplifier and is later transferred to the charge sensitive preamplifier. The fast signal is processed to obtain good time resolution and low walk. The system has a FWHM time resolution of 40 picoseconds, referred to 5.8 MeV deposited in a 100 pF silicon detector. An actual peak width from 3 MeV deposited in an 80 pF silicon by He3 particles was 165 psec FWHM, which is about twice that expected if more optimum pulse shaping had been employed. The instrumental walk for a 100 to 1 amplitude range is less than 150 picoseconds, and is approximately 100 picoseconds for a 30 to 1 range. The noise added to the slow system is equal to that caused by an additional 17 pF of capacitance at its input, plus an overall increase of 5% or less for commonly used slow pulse shaping.</abstract><pub>IEEE</pub><doi>10.1109/TNS.1968.4324975</doi><tpages>9</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISSN: 0018-9499 |
ispartof | IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci., NS-15: No. 3, 500-8(June 1968), 1968, Vol.15 (3), p.500-508 |
issn | 0018-9499 1558-1578 |
language | eng |
recordid | cdi_crossref_primary_10_1109_TNS_1968_4324975 |
source | IEEE Electronic Library (IEL) |
subjects | Capacitance Circuit noise CIRCUITS DESIGN Detectors Instruments N26110 -Instrumentation-Radiation Detection Instruments- General Detectors & Monitors Preamplifiers Pulse shaping methods RADIATION DETECTORS, SEMICONDUCTOR (SILICON)/timing system for, design of low-walk high-resolution SEMICONDUCTOR COUNTERS SEMICONDUCTORS Signal processing Signal resolution SILICON SOLID-STATE COUNTERS Timing |
title | A Low Walk, High Resolution Timing System for Silicon Detectors |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T17%3A40%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Low%20Walk,%20High%20Resolution%20Timing%20System%20for%20Silicon%20Detectors&rft.jtitle=IEEE%20(Inst.%20Elec.%20Electron.%20Eng.),%20Trans.%20Nucl.%20Sci.,%20NS-15:%20No.%203,%20500-8(June%201968)&rft.au=Sherman,%20I.%20S.&rft.aucorp=Argonne%20National%20Lab.,%20Ill&rft.date=1968&rft.volume=15&rft.issue=3&rft.spage=500&rft.epage=508&rft.pages=500-508&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.1968.4324975&rft_dat=%3Ccrossref_RIE%3E10_1109_TNS_1968_4324975%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4324975&rfr_iscdi=true |