LDMOS Technology for RF Power Amplifiers
We show the status of laterally diffused metal-oxide-semiconductor (LDMOS) technology, which has been the device of choice for RF power applications for more than one decade. LDMOS fulfills the requirements for a wide range of class AB and pulsed applications, such as base station, broadcast, and mi...
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Veröffentlicht in: | IEEE transactions on microwave theory and techniques 2012-06, Vol.60 (6), p.1755-1763 |
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creator | Theeuwen, S. J. C. H. Qureshi, J. H. |
description | We show the status of laterally diffused metal-oxide-semiconductor (LDMOS) technology, which has been the device of choice for RF power applications for more than one decade. LDMOS fulfills the requirements for a wide range of class AB and pulsed applications, such as base station, broadcast, and microwave. We present state-of-the-art RF performance of the LDMOS transistor measured with a load-pull test setup, achieving class-AB drain efficiencies of 70% at 2 GHz for on-wafer and packaged devices. Furthermore, the results for several class-AB and Doherty amplifier implementations constructed with this technology are shown. As an illustration, a three-way Doherty application is demonstrated, which has a 7.5-dB back-off efficiency of 47% at 1.8 GHz with a peak power of 700 W and linearity numbers better than -65 dBc. |
doi_str_mv | 10.1109/TMTT.2012.2193141 |
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fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TMTT_2012_2193141</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6197247</ieee_id><sourcerecordid>2775741631</sourcerecordid><originalsourceid>FETCH-LOGICAL-c326t-506e45fe13f834f02be0dfd166e4ecc826ff166432db57d79e2273a0f308e1e63</originalsourceid><addsrcrecordid>eNpdkMFOwkAQhjdGExF9AOOliRcuxZ3Z7bY9EgQ1gWC0njelndWSwuIuxPD2bgPx4GnyT76ZzHyM3QIfAvD8oZgXxRA54BAhFyDhjPUgSdI4Vyk_Zz3OIYtzmfFLduX9KkSZ8KzHBrPH-eI9Kqj62tjWfh4iY130No1e7Q-5aLTeto1pyPlrdmHK1tPNqfbZx3RSjJ_j2eLpZTyaxZVAtYsTrkgmhkCYTEjDcUm8NjWo0KaqylAZE4IUWC-TtE5zQkxFyY3gGQEp0WeD496ts9978ju9bnxFbVtuyO69Dk_lKkGUHXr_D13ZvduE6zTwDBRIRAwUHKnKWe8dGb11zbp0hwDpzp3u3OnOnT65CzN3x5mGiP54BXmKMhW_i4Jnbg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1081614222</pqid></control><display><type>article</type><title>LDMOS Technology for RF Power Amplifiers</title><source>IEEE Electronic Library (IEL)</source><creator>Theeuwen, S. J. C. H. ; Qureshi, J. H.</creator><creatorcontrib>Theeuwen, S. J. C. H. ; Qureshi, J. H.</creatorcontrib><description>We show the status of laterally diffused metal-oxide-semiconductor (LDMOS) technology, which has been the device of choice for RF power applications for more than one decade. LDMOS fulfills the requirements for a wide range of class AB and pulsed applications, such as base station, broadcast, and microwave. We present state-of-the-art RF performance of the LDMOS transistor measured with a load-pull test setup, achieving class-AB drain efficiencies of 70% at 2 GHz for on-wafer and packaged devices. Furthermore, the results for several class-AB and Doherty amplifier implementations constructed with this technology are shown. As an illustration, a three-way Doherty application is demonstrated, which has a 7.5-dB back-off efficiency of 47% at 1.8 GHz with a peak power of 700 W and linearity numbers better than -65 dBc.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.2012.2193141</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Amplifiers ; Breakdown voltage ; Broadcasting ; Capacitance ; Devices ; Diffusion ; Drains ; Logic gates ; Metals ; Microwave amplifiers ; Microwaves ; MOSFET power amplifiers (PAs) ; Performance evaluation ; power amplifiers ; Radio frequency ; Reliability ; semiconductor device fabrication ; State of the art ; Stations</subject><ispartof>IEEE transactions on microwave theory and techniques, 2012-06, Vol.60 (6), p.1755-1763</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jun 2012</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c326t-506e45fe13f834f02be0dfd166e4ecc826ff166432db57d79e2273a0f308e1e63</citedby><cites>FETCH-LOGICAL-c326t-506e45fe13f834f02be0dfd166e4ecc826ff166432db57d79e2273a0f308e1e63</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6197247$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/6197247$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Theeuwen, S. J. C. H.</creatorcontrib><creatorcontrib>Qureshi, J. H.</creatorcontrib><title>LDMOS Technology for RF Power Amplifiers</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>We show the status of laterally diffused metal-oxide-semiconductor (LDMOS) technology, which has been the device of choice for RF power applications for more than one decade. LDMOS fulfills the requirements for a wide range of class AB and pulsed applications, such as base station, broadcast, and microwave. We present state-of-the-art RF performance of the LDMOS transistor measured with a load-pull test setup, achieving class-AB drain efficiencies of 70% at 2 GHz for on-wafer and packaged devices. Furthermore, the results for several class-AB and Doherty amplifier implementations constructed with this technology are shown. As an illustration, a three-way Doherty application is demonstrated, which has a 7.5-dB back-off efficiency of 47% at 1.8 GHz with a peak power of 700 W and linearity numbers better than -65 dBc.</description><subject>Amplifiers</subject><subject>Breakdown voltage</subject><subject>Broadcasting</subject><subject>Capacitance</subject><subject>Devices</subject><subject>Diffusion</subject><subject>Drains</subject><subject>Logic gates</subject><subject>Metals</subject><subject>Microwave amplifiers</subject><subject>Microwaves</subject><subject>MOSFET power amplifiers (PAs)</subject><subject>Performance evaluation</subject><subject>power amplifiers</subject><subject>Radio frequency</subject><subject>Reliability</subject><subject>semiconductor device fabrication</subject><subject>State of the art</subject><subject>Stations</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkMFOwkAQhjdGExF9AOOliRcuxZ3Z7bY9EgQ1gWC0njelndWSwuIuxPD2bgPx4GnyT76ZzHyM3QIfAvD8oZgXxRA54BAhFyDhjPUgSdI4Vyk_Zz3OIYtzmfFLduX9KkSZ8KzHBrPH-eI9Kqj62tjWfh4iY130No1e7Q-5aLTeto1pyPlrdmHK1tPNqfbZx3RSjJ_j2eLpZTyaxZVAtYsTrkgmhkCYTEjDcUm8NjWo0KaqylAZE4IUWC-TtE5zQkxFyY3gGQEp0WeD496ts9978ju9bnxFbVtuyO69Dk_lKkGUHXr_D13ZvduE6zTwDBRIRAwUHKnKWe8dGb11zbp0hwDpzp3u3OnOnT65CzN3x5mGiP54BXmKMhW_i4Jnbg</recordid><startdate>20120601</startdate><enddate>20120601</enddate><creator>Theeuwen, S. J. C. H.</creator><creator>Qureshi, J. H.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20120601</creationdate><title>LDMOS Technology for RF Power Amplifiers</title><author>Theeuwen, S. J. C. H. ; Qureshi, J. H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c326t-506e45fe13f834f02be0dfd166e4ecc826ff166432db57d79e2273a0f308e1e63</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>Amplifiers</topic><topic>Breakdown voltage</topic><topic>Broadcasting</topic><topic>Capacitance</topic><topic>Devices</topic><topic>Diffusion</topic><topic>Drains</topic><topic>Logic gates</topic><topic>Metals</topic><topic>Microwave amplifiers</topic><topic>Microwaves</topic><topic>MOSFET power amplifiers (PAs)</topic><topic>Performance evaluation</topic><topic>power amplifiers</topic><topic>Radio frequency</topic><topic>Reliability</topic><topic>semiconductor device fabrication</topic><topic>State of the art</topic><topic>Stations</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Theeuwen, S. J. C. H.</creatorcontrib><creatorcontrib>Qureshi, J. H.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Theeuwen, S. J. C. H.</au><au>Qureshi, J. H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>LDMOS Technology for RF Power Amplifiers</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>2012-06-01</date><risdate>2012</risdate><volume>60</volume><issue>6</issue><spage>1755</spage><epage>1763</epage><pages>1755-1763</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>We show the status of laterally diffused metal-oxide-semiconductor (LDMOS) technology, which has been the device of choice for RF power applications for more than one decade. LDMOS fulfills the requirements for a wide range of class AB and pulsed applications, such as base station, broadcast, and microwave. We present state-of-the-art RF performance of the LDMOS transistor measured with a load-pull test setup, achieving class-AB drain efficiencies of 70% at 2 GHz for on-wafer and packaged devices. Furthermore, the results for several class-AB and Doherty amplifier implementations constructed with this technology are shown. As an illustration, a three-way Doherty application is demonstrated, which has a 7.5-dB back-off efficiency of 47% at 1.8 GHz with a peak power of 700 W and linearity numbers better than -65 dBc.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TMTT.2012.2193141</doi><tpages>9</tpages></addata></record> |
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subjects | Amplifiers Breakdown voltage Broadcasting Capacitance Devices Diffusion Drains Logic gates Metals Microwave amplifiers Microwaves MOSFET power amplifiers (PAs) Performance evaluation power amplifiers Radio frequency Reliability semiconductor device fabrication State of the art Stations |
title | LDMOS Technology for RF Power Amplifiers |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T19%3A49%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=LDMOS%20Technology%20for%20RF%20Power%20Amplifiers&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Theeuwen,%20S.%20J.%20C.%20H.&rft.date=2012-06-01&rft.volume=60&rft.issue=6&rft.spage=1755&rft.epage=1763&rft.pages=1755-1763&rft.issn=0018-9480&rft.eissn=1557-9670&rft.coden=IETMAB&rft_id=info:doi/10.1109/TMTT.2012.2193141&rft_dat=%3Cproquest_RIE%3E2775741631%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1081614222&rft_id=info:pmid/&rft_ieee_id=6197247&rfr_iscdi=true |