GaAs Power MESFET's: Design, Fabrication, and Performance

This paper reviews the state of the art of power GaAs MESFET's. Items that will be covered are the operating principles of the device from a material and geometric point of view, the design, fabrication sequences, and material structures used by various laboratories, the factors identified as i...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on microwave theory and techniques 1979-05, Vol.27 (5), p.367-378
Hauptverfasser: Dilorenzo, J.V., Wisseman, W.R.
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 378
container_issue 5
container_start_page 367
container_title IEEE transactions on microwave theory and techniques
container_volume 27
creator Dilorenzo, J.V.
Wisseman, W.R.
description This paper reviews the state of the art of power GaAs MESFET's. Items that will be covered are the operating principles of the device from a material and geometric point of view, the design, fabrication sequences, and material structures used by various laboratories, the factors identified as important to power by workers in the field the performance of the device in terms of frequency effects, power per unit gate-width effects, scaling from small to large gate-width devices, and voltage effects. In addition, the circuit applications of GaAs FET's will be briefly discussed.
doi_str_mv 10.1109/TMTT.1979.1129635
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TMTT_1979_1129635</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1129635</ieee_id><sourcerecordid>28308890</sourcerecordid><originalsourceid>FETCH-LOGICAL-c325t-9c96a4119c2fe09a0fd0faa6a646ab6669701872a61a9766f72e9f2aca3e08a83</originalsourceid><addsrcrecordid>eNqFkE1LAzEQhoMoWKs_QLzsSS9uTfYjyXgrta1CiwXXc5imE1nZ7takRfz3prTg0dPwMs87DA9j14IPhODwUM2raiBAQYwZyLw8YT1RlioFqfgp63EudAqF5ufsIoTPGIuS6x6DKQ5Dsui-ySfz8dtkXN2Fx-SJQv3R3icTXPra4rbuYsB2lSzIu86vsbV0yc4cNoGujrPP3mN79JzOXqcvo-EstXlWblOwILEQAmzmiANyt-IOUaIsJC6llKDiaypDKRCUlE5lBC5DizlxjTrvs9vD3Y3vvnYUtmZdB0tNgy11u2AynXOtgf8P5oXMhVARFAfQ-i4ET85sfL1G_2MEN3ubZm_T7G2ao83YuTl0aiL644_bX-0abjY</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>23463117</pqid></control><display><type>article</type><title>GaAs Power MESFET's: Design, Fabrication, and Performance</title><source>IEEE Electronic Library (IEL)</source><creator>Dilorenzo, J.V. ; Wisseman, W.R.</creator><creatorcontrib>Dilorenzo, J.V. ; Wisseman, W.R.</creatorcontrib><description>This paper reviews the state of the art of power GaAs MESFET's. Items that will be covered are the operating principles of the device from a material and geometric point of view, the design, fabrication sequences, and material structures used by various laboratories, the factors identified as important to power by workers in the field the performance of the device in terms of frequency effects, power per unit gate-width effects, scaling from small to large gate-width devices, and voltage effects. In addition, the circuit applications of GaAs FET's will be briefly discussed.</description><identifier>ISSN: 0018-9480</identifier><identifier>EISSN: 1557-9670</identifier><identifier>DOI: 10.1109/TMTT.1979.1129635</identifier><identifier>CODEN: IETMAB</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit noise ; Equivalent circuits ; Fabrication ; Frequency ; Gallium arsenide ; Instruments ; MESFETs ; Microwave devices ; Microwave FETs ; Voltage</subject><ispartof>IEEE transactions on microwave theory and techniques, 1979-05, Vol.27 (5), p.367-378</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c325t-9c96a4119c2fe09a0fd0faa6a646ab6669701872a61a9766f72e9f2aca3e08a83</citedby><cites>FETCH-LOGICAL-c325t-9c96a4119c2fe09a0fd0faa6a646ab6669701872a61a9766f72e9f2aca3e08a83</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1129635$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1129635$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dilorenzo, J.V.</creatorcontrib><creatorcontrib>Wisseman, W.R.</creatorcontrib><title>GaAs Power MESFET's: Design, Fabrication, and Performance</title><title>IEEE transactions on microwave theory and techniques</title><addtitle>TMTT</addtitle><description>This paper reviews the state of the art of power GaAs MESFET's. Items that will be covered are the operating principles of the device from a material and geometric point of view, the design, fabrication sequences, and material structures used by various laboratories, the factors identified as important to power by workers in the field the performance of the device in terms of frequency effects, power per unit gate-width effects, scaling from small to large gate-width devices, and voltage effects. In addition, the circuit applications of GaAs FET's will be briefly discussed.</description><subject>Circuit noise</subject><subject>Equivalent circuits</subject><subject>Fabrication</subject><subject>Frequency</subject><subject>Gallium arsenide</subject><subject>Instruments</subject><subject>MESFETs</subject><subject>Microwave devices</subject><subject>Microwave FETs</subject><subject>Voltage</subject><issn>0018-9480</issn><issn>1557-9670</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1979</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LAzEQhoMoWKs_QLzsSS9uTfYjyXgrta1CiwXXc5imE1nZ7takRfz3prTg0dPwMs87DA9j14IPhODwUM2raiBAQYwZyLw8YT1RlioFqfgp63EudAqF5ufsIoTPGIuS6x6DKQ5Dsui-ySfz8dtkXN2Fx-SJQv3R3icTXPra4rbuYsB2lSzIu86vsbV0yc4cNoGujrPP3mN79JzOXqcvo-EstXlWblOwILEQAmzmiANyt-IOUaIsJC6llKDiaypDKRCUlE5lBC5DizlxjTrvs9vD3Y3vvnYUtmZdB0tNgy11u2AynXOtgf8P5oXMhVARFAfQ-i4ET85sfL1G_2MEN3ubZm_T7G2ao83YuTl0aiL644_bX-0abjY</recordid><startdate>19790501</startdate><enddate>19790501</enddate><creator>Dilorenzo, J.V.</creator><creator>Wisseman, W.R.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><scope>7SP</scope></search><sort><creationdate>19790501</creationdate><title>GaAs Power MESFET's: Design, Fabrication, and Performance</title><author>Dilorenzo, J.V. ; Wisseman, W.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c325t-9c96a4119c2fe09a0fd0faa6a646ab6669701872a61a9766f72e9f2aca3e08a83</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1979</creationdate><topic>Circuit noise</topic><topic>Equivalent circuits</topic><topic>Fabrication</topic><topic>Frequency</topic><topic>Gallium arsenide</topic><topic>Instruments</topic><topic>MESFETs</topic><topic>Microwave devices</topic><topic>Microwave FETs</topic><topic>Voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dilorenzo, J.V.</creatorcontrib><creatorcontrib>Wisseman, W.R.</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Electronics &amp; Communications Abstracts</collection><jtitle>IEEE transactions on microwave theory and techniques</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dilorenzo, J.V.</au><au>Wisseman, W.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>GaAs Power MESFET's: Design, Fabrication, and Performance</atitle><jtitle>IEEE transactions on microwave theory and techniques</jtitle><stitle>TMTT</stitle><date>1979-05-01</date><risdate>1979</risdate><volume>27</volume><issue>5</issue><spage>367</spage><epage>378</epage><pages>367-378</pages><issn>0018-9480</issn><eissn>1557-9670</eissn><coden>IETMAB</coden><abstract>This paper reviews the state of the art of power GaAs MESFET's. Items that will be covered are the operating principles of the device from a material and geometric point of view, the design, fabrication sequences, and material structures used by various laboratories, the factors identified as important to power by workers in the field the performance of the device in terms of frequency effects, power per unit gate-width effects, scaling from small to large gate-width devices, and voltage effects. In addition, the circuit applications of GaAs FET's will be briefly discussed.</abstract><pub>IEEE</pub><doi>10.1109/TMTT.1979.1129635</doi><tpages>12</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 0018-9480
ispartof IEEE transactions on microwave theory and techniques, 1979-05, Vol.27 (5), p.367-378
issn 0018-9480
1557-9670
language eng
recordid cdi_crossref_primary_10_1109_TMTT_1979_1129635
source IEEE Electronic Library (IEL)
subjects Circuit noise
Equivalent circuits
Fabrication
Frequency
Gallium arsenide
Instruments
MESFETs
Microwave devices
Microwave FETs
Voltage
title GaAs Power MESFET's: Design, Fabrication, and Performance
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T11%3A58%3A03IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=GaAs%20Power%20MESFET's:%20Design,%20Fabrication,%20and%20Performance&rft.jtitle=IEEE%20transactions%20on%20microwave%20theory%20and%20techniques&rft.au=Dilorenzo,%20J.V.&rft.date=1979-05-01&rft.volume=27&rft.issue=5&rft.spage=367&rft.epage=378&rft.pages=367-378&rft.issn=0018-9480&rft.eissn=1557-9670&rft.coden=IETMAB&rft_id=info:doi/10.1109/TMTT.1979.1129635&rft_dat=%3Cproquest_RIE%3E28308890%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=23463117&rft_id=info:pmid/&rft_ieee_id=1129635&rfr_iscdi=true