Sm(Co,Fe,Cu,Zr)/sub z/ magnets for high-temperature applications: microstructural and micromagnetic analysis
The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)/sub z/ permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning cente...
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| Veröffentlicht in: | IEEE transactions on magnetics 2002-09, Vol.38 (5), p.2943-2945 |
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| container_title | IEEE transactions on magnetics |
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| creator | Matthias, T. Scholz, W. Fidler, J. Schrefl, T. Rong, T.S. Jones, I.P. Harris, I.R. |
| description | The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)/sub z/ permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive. |
| doi_str_mv | 10.1109/TMAG.2002.803313 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_RIE</sourceid><recordid>TN_cdi_crossref_primary_10_1109_TMAG_2002_803313</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1042418</ieee_id><sourcerecordid>10_1109_TMAG_2002_803313</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1088-c3021030e7adad1c6941ff93b23deb4aab3308100f6f78636cbc5fb38be4f1933</originalsourceid><addsrcrecordid>eNpNkDFPwzAQhS0EEqWwI7F4BKlp72I3ddhQRAtSEQNlYYlsx26Nkiayk6H8ehKFgel07-493X2E3CLMESFd7N6eNvMYIJ4LYAzZGZlgyjECSNJzMgFAEaU84ZfkKoTvvuVLhAkpP6r7rJ6tzSzrZl_-YRE6RX8WtJL7o2kDtbWnB7c_RK2pGuNl23lDZdOUTsvW1cfwSCunfR1a3-l-KEsqj8WojRlO94osT8GFa3JhZRnMzV-dks_18y57ibbvm9fsaRtpBCEizSBGYGBWspAF6qT_w9qUqZgVRnEpFWMgEMAmdiUSlmill1YxoQy3mDI2JTDmDocFb2zeeFdJf8oR8oFWPtDKB1r5SKu33I0WZ4z5t85jjoL9Ao5lZ20</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Sm(Co,Fe,Cu,Zr)/sub z/ magnets for high-temperature applications: microstructural and micromagnetic analysis</title><source>IEEE Electronic Library (IEL)</source><creator>Matthias, T. ; Scholz, W. ; Fidler, J. ; Schrefl, T. ; Rong, T.S. ; Jones, I.P. ; Harris, I.R.</creator><creatorcontrib>Matthias, T. ; Scholz, W. ; Fidler, J. ; Schrefl, T. ; Rong, T.S. ; Jones, I.P. ; Harris, I.R.</creatorcontrib><description>The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)/sub z/ permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2002.803313</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Dispersion ; Energy measurement ; Image analysis ; Micromagnetics ; Microstructure ; Permanent magnets ; Spectroscopy ; Thickness measurement ; Transmission electron microscopy ; X-ray imaging</subject><ispartof>IEEE transactions on magnetics, 2002-09, Vol.38 (5), p.2943-2945</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c1088-c3021030e7adad1c6941ff93b23deb4aab3308100f6f78636cbc5fb38be4f1933</citedby><cites>FETCH-LOGICAL-c1088-c3021030e7adad1c6941ff93b23deb4aab3308100f6f78636cbc5fb38be4f1933</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1042418$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1042418$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Matthias, T.</creatorcontrib><creatorcontrib>Scholz, W.</creatorcontrib><creatorcontrib>Fidler, J.</creatorcontrib><creatorcontrib>Schrefl, T.</creatorcontrib><creatorcontrib>Rong, T.S.</creatorcontrib><creatorcontrib>Jones, I.P.</creatorcontrib><creatorcontrib>Harris, I.R.</creatorcontrib><title>Sm(Co,Fe,Cu,Zr)/sub z/ magnets for high-temperature applications: microstructural and micromagnetic analysis</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)/sub z/ permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive.</description><subject>Dispersion</subject><subject>Energy measurement</subject><subject>Image analysis</subject><subject>Micromagnetics</subject><subject>Microstructure</subject><subject>Permanent magnets</subject><subject>Spectroscopy</subject><subject>Thickness measurement</subject><subject>Transmission electron microscopy</subject><subject>X-ray imaging</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2002</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpNkDFPwzAQhS0EEqWwI7F4BKlp72I3ddhQRAtSEQNlYYlsx26Nkiayk6H8ehKFgel07-493X2E3CLMESFd7N6eNvMYIJ4LYAzZGZlgyjECSNJzMgFAEaU84ZfkKoTvvuVLhAkpP6r7rJ6tzSzrZl_-YRE6RX8WtJL7o2kDtbWnB7c_RK2pGuNl23lDZdOUTsvW1cfwSCunfR1a3-l-KEsqj8WojRlO94osT8GFa3JhZRnMzV-dks_18y57ibbvm9fsaRtpBCEizSBGYGBWspAF6qT_w9qUqZgVRnEpFWMgEMAmdiUSlmill1YxoQy3mDI2JTDmDocFb2zeeFdJf8oR8oFWPtDKB1r5SKu33I0WZ4z5t85jjoL9Ao5lZ20</recordid><startdate>200209</startdate><enddate>200209</enddate><creator>Matthias, T.</creator><creator>Scholz, W.</creator><creator>Fidler, J.</creator><creator>Schrefl, T.</creator><creator>Rong, T.S.</creator><creator>Jones, I.P.</creator><creator>Harris, I.R.</creator><general>IEEE</general><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>200209</creationdate><title>Sm(Co,Fe,Cu,Zr)/sub z/ magnets for high-temperature applications: microstructural and micromagnetic analysis</title><author>Matthias, T. ; Scholz, W. ; Fidler, J. ; Schrefl, T. ; Rong, T.S. ; Jones, I.P. ; Harris, I.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1088-c3021030e7adad1c6941ff93b23deb4aab3308100f6f78636cbc5fb38be4f1933</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2002</creationdate><topic>Dispersion</topic><topic>Energy measurement</topic><topic>Image analysis</topic><topic>Micromagnetics</topic><topic>Microstructure</topic><topic>Permanent magnets</topic><topic>Spectroscopy</topic><topic>Thickness measurement</topic><topic>Transmission electron microscopy</topic><topic>X-ray imaging</topic><toplevel>online_resources</toplevel><creatorcontrib>Matthias, T.</creatorcontrib><creatorcontrib>Scholz, W.</creatorcontrib><creatorcontrib>Fidler, J.</creatorcontrib><creatorcontrib>Schrefl, T.</creatorcontrib><creatorcontrib>Rong, T.S.</creatorcontrib><creatorcontrib>Jones, I.P.</creatorcontrib><creatorcontrib>Harris, I.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Matthias, T.</au><au>Scholz, W.</au><au>Fidler, J.</au><au>Schrefl, T.</au><au>Rong, T.S.</au><au>Jones, I.P.</au><au>Harris, I.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Sm(Co,Fe,Cu,Zr)/sub z/ magnets for high-temperature applications: microstructural and micromagnetic analysis</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>2002-09</date><risdate>2002</risdate><volume>38</volume><issue>5</issue><spage>2943</spage><epage>2945</epage><pages>2943-2945</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>The microstructure and the microchemistry of Sm(Co,Fe,Cu,Zr)/sub z/ permanent magnets determine the domain wall pinning behavior. This work combines nanoanalytical investigations of the precipitation structure with micromagnetic simulations. A cellular precipitation structure, provides pinning centers. Measurements of the thickness of these precipitates by means of transmission electron microscopic image analysis and energy dispersive X-ray spectroscopy reveals that the average thickness is 15-18 nm, which is more than the calculated minimum value of 10 nm. Investigations of the elemental distribution across the precipitates show that the pinning behavior is repulsive.</abstract><pub>IEEE</pub><doi>10.1109/TMAG.2002.803313</doi><tpages>3</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Dispersion Energy measurement Image analysis Micromagnetics Microstructure Permanent magnets Spectroscopy Thickness measurement Transmission electron microscopy X-ray imaging |
| title | Sm(Co,Fe,Cu,Zr)/sub z/ magnets for high-temperature applications: microstructural and micromagnetic analysis |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T07%3A23%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Sm(Co,Fe,Cu,Zr)/sub%20z/%20magnets%20for%20high-temperature%20applications:%20microstructural%20and%20micromagnetic%20analysis&rft.jtitle=IEEE%20transactions%20on%20magnetics&rft.au=Matthias,%20T.&rft.date=2002-09&rft.volume=38&rft.issue=5&rft.spage=2943&rft.epage=2945&rft.pages=2943-2945&rft.issn=0018-9464&rft.eissn=1941-0069&rft.coden=IEMGAQ&rft_id=info:doi/10.1109/TMAG.2002.803313&rft_dat=%3Ccrossref_RIE%3E10_1109_TMAG_2002_803313%3C/crossref_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1042418&rfr_iscdi=true |