Mixing efficiency of SIS junctions
To evaluate new SIS technologies as low noise mixers we have investigated theoretically the frequency down-conversion efficiency of SIS junctions with IV curves which closely resemble experimentally observed curves. Leakage current and IV curve "sharpness" of the current rise at eV = \Delt...
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| Veröffentlicht in: | IEEE transactions on magnetics 1983-05, Vol.19 (3), p.605-607 |
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| container_title | IEEE transactions on magnetics |
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| creator | Sollner, T. Powell, S. |
| description | To evaluate new SIS technologies as low noise mixers we have investigated theoretically the frequency down-conversion efficiency of SIS junctions with IV curves which closely resemble experimentally observed curves. Leakage current and IV curve "sharpness" of the current rise at eV = \Delta_{1} + \Delta_{2} are included as parameters. We have applied a 3-port version of the quantum mixing theory to study the importance of these parameters on conversion efficiency. The results suggest that the leakage conductance should be less than 10% of the normal conductance, that the voltage width of the current rise should be less than 10% of the gap voltage, and that the optimum frequency of operation is near 10% of the gap frequency, eV_{gap}/h . |
| doi_str_mv | 10.1109/TMAG.1983.1062485 |
| format | Article |
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Leakage current and IV curve "sharpness" of the current rise at eV = \Delta_{1} + \Delta_{2} are included as parameters. We have applied a 3-port version of the quantum mixing theory to study the importance of these parameters on conversion efficiency. The results suggest that the leakage conductance should be less than 10% of the normal conductance, that the voltage width of the current rise should be less than 10% of the gap voltage, and that the optimum frequency of operation is near 10% of the gap frequency, eV_{gap}/h .</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.1983.1062485</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Frequency conversion ; Josephson junctions ; Leakage current ; Millimeter wave technology ; Quantum computing ; Quantum mechanics ; Superconducting device noise ; Superconducting devices ; Superconductivity ; Voltage</subject><ispartof>IEEE transactions on magnetics, 1983-05, Vol.19 (3), p.605-607</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-a6725a45dfee0943a8cfc6f9ebd2ac31043e10190c9a009b5e690835058a29603</citedby><cites>FETCH-LOGICAL-c364t-a6725a45dfee0943a8cfc6f9ebd2ac31043e10190c9a009b5e690835058a29603</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1062485$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1062485$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Sollner, T.</creatorcontrib><creatorcontrib>Powell, S.</creatorcontrib><title>Mixing efficiency of SIS junctions</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>To evaluate new SIS technologies as low noise mixers we have investigated theoretically the frequency down-conversion efficiency of SIS junctions with IV curves which closely resemble experimentally observed curves. Leakage current and IV curve "sharpness" of the current rise at eV = \Delta_{1} + \Delta_{2} are included as parameters. We have applied a 3-port version of the quantum mixing theory to study the importance of these parameters on conversion efficiency. The results suggest that the leakage conductance should be less than 10% of the normal conductance, that the voltage width of the current rise should be less than 10% of the gap voltage, and that the optimum frequency of operation is near 10% of the gap frequency, eV_{gap}/h .</description><subject>Frequency conversion</subject><subject>Josephson junctions</subject><subject>Leakage current</subject><subject>Millimeter wave technology</subject><subject>Quantum computing</subject><subject>Quantum mechanics</subject><subject>Superconducting device noise</subject><subject>Superconducting devices</subject><subject>Superconductivity</subject><subject>Voltage</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNpNkE1PAjEURRujiSP6A4ybiQt3g-9NP2iXhCiSQFyA66aUV1MyzOB0SOTfCxkWrl5u3rl3cRh7RBgignldLcbTIRrNhwiqFFpesQyNwAJAmWuWAaAujFDilt2ltD1FIREy9ryIv7H-zimE6CPV_pg3IV_Olvn2UPsuNnW6ZzfBVYkeLnfAvt7fVpOPYv45nU3G88JzJbrCqVEpnZCbQARGcKd98CoYWm9K5zmC4ISABrxxAGYtSRnQXILUrjQK-IC99Lv7tvk5UOrsLiZPVeVqag7JlpqbkZblCcQe9G2TUkvB7tu4c-3RItizDXu2Yc827MXGqfPUdyIR_eP77x_5HFk1</recordid><startdate>19830501</startdate><enddate>19830501</enddate><creator>Sollner, T.</creator><creator>Powell, S.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19830501</creationdate><title>Mixing efficiency of SIS junctions</title><author>Sollner, T. ; Powell, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-a6725a45dfee0943a8cfc6f9ebd2ac31043e10190c9a009b5e690835058a29603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Frequency conversion</topic><topic>Josephson junctions</topic><topic>Leakage current</topic><topic>Millimeter wave technology</topic><topic>Quantum computing</topic><topic>Quantum mechanics</topic><topic>Superconducting device noise</topic><topic>Superconducting devices</topic><topic>Superconductivity</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Sollner, T.</creatorcontrib><creatorcontrib>Powell, S.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Sollner, T.</au><au>Powell, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Mixing efficiency of SIS junctions</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1983-05-01</date><risdate>1983</risdate><volume>19</volume><issue>3</issue><spage>605</spage><epage>607</epage><pages>605-607</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>To evaluate new SIS technologies as low noise mixers we have investigated theoretically the frequency down-conversion efficiency of SIS junctions with IV curves which closely resemble experimentally observed curves. Leakage current and IV curve "sharpness" of the current rise at eV = \Delta_{1} + \Delta_{2} are included as parameters. We have applied a 3-port version of the quantum mixing theory to study the importance of these parameters on conversion efficiency. The results suggest that the leakage conductance should be less than 10% of the normal conductance, that the voltage width of the current rise should be less than 10% of the gap voltage, and that the optimum frequency of operation is near 10% of the gap frequency, eV_{gap}/h .</abstract><pub>IEEE</pub><doi>10.1109/TMAG.1983.1062485</doi><tpages>3</tpages></addata></record> |
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| ispartof | IEEE transactions on magnetics, 1983-05, Vol.19 (3), p.605-607 |
| issn | 0018-9464 1941-0069 |
| language | eng |
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| source | IEEE Electronic Library (IEL) |
| subjects | Frequency conversion Josephson junctions Leakage current Millimeter wave technology Quantum computing Quantum mechanics Superconducting device noise Superconducting devices Superconductivity Voltage |
| title | Mixing efficiency of SIS junctions |
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