Dynamics of Josephson tunnel junctions with a finite-width Riedel peak
The basic properties of high-current-density Josephson tunnel junctions are calculated from the microscopic theory taking into account a finite width 2δ of the Riedel peak. The calculated I-V curves for the finite values of the normalized capacitance β c , the Riedel peak halfwidth δ, and the parame...
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Veröffentlicht in: | IEEE transactions on magnetics 1983-05, Vol.19 (3), p.629-632 |
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creator | Zorin, A. Likharev, K. Turovets, S. |
description | The basic properties of high-current-density Josephson tunnel junctions are calculated from the microscopic theory taking into account a finite width 2δ of the Riedel peak. The calculated I-V curves for the finite values of the normalized capacitance β c , the Riedel peak halfwidth δ, and the parameter α of pair current suppression are in good agreement with published experimental results for the high-current-density tunnel junctions Pb(In)-oxide-Pb. The hysteresis parameter I R /I c calculated from the microscopic theory as a function of the normalized capacitance β c is compared with the dependence following from the RSJ and the RSJN models. In addition, the low-frequency spectral density S v (0) of the voltage fluctuations across the junction is numerically found and compared with that following from the simple shot-noise model. |
doi_str_mv | 10.1109/TMAG.1983.1062475 |
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The calculated I-V curves for the finite values of the normalized capacitance β c , the Riedel peak halfwidth δ, and the parameter α of pair current suppression are in good agreement with published experimental results for the high-current-density tunnel junctions Pb(In)-oxide-Pb. The hysteresis parameter I R /I c calculated from the microscopic theory as a function of the normalized capacitance β c is compared with the dependence following from the RSJ and the RSJN models. In addition, the low-frequency spectral density S v (0) of the voltage fluctuations across the junction is numerically found and compared with that following from the simple shot-noise model.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.1983.1062475</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Capacitance ; Electrodes ; Fluctuations ; Frequency ; Hysteresis ; Microscopy ; Physics ; Shape ; Tunneling ; Voltage</subject><ispartof>IEEE transactions on magnetics, 1983-05, Vol.19 (3), p.629-632</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c294t-89aebf166de93e11803c6c0d3e594cd11c00b57b648876f979dd1576ae6f691e3</citedby><cites>FETCH-LOGICAL-c294t-89aebf166de93e11803c6c0d3e594cd11c00b57b648876f979dd1576ae6f691e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1062475$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,778,782,794,27911,27912,54745</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1062475$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Zorin, A.</creatorcontrib><creatorcontrib>Likharev, K.</creatorcontrib><creatorcontrib>Turovets, S.</creatorcontrib><title>Dynamics of Josephson tunnel junctions with a finite-width Riedel peak</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>The basic properties of high-current-density Josephson tunnel junctions are calculated from the microscopic theory taking into account a finite width 2δ of the Riedel peak. The calculated I-V curves for the finite values of the normalized capacitance β c , the Riedel peak halfwidth δ, and the parameter α of pair current suppression are in good agreement with published experimental results for the high-current-density tunnel junctions Pb(In)-oxide-Pb. The hysteresis parameter I R /I c calculated from the microscopic theory as a function of the normalized capacitance β c is compared with the dependence following from the RSJ and the RSJN models. In addition, the low-frequency spectral density S v (0) of the voltage fluctuations across the junction is numerically found and compared with that following from the simple shot-noise model.</description><subject>Capacitance</subject><subject>Electrodes</subject><subject>Fluctuations</subject><subject>Frequency</subject><subject>Hysteresis</subject><subject>Microscopy</subject><subject>Physics</subject><subject>Shape</subject><subject>Tunneling</subject><subject>Voltage</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNpNkLFOwzAURS0EEqXwAYglE1uCX-I49lgVWkBFSKjMlmu_qC6pE-JEVf-eVOnA9HT1zr3DIeQeaAJA5dP6Y7ZMQIosAcpTVuQXZAKSQUwpl5dkQimIWDLOrslNCLshshzohCyej17vnQlRXUbvdcBmG2ofdb33WEW73pvO1T5EB9dtIx2VzrsO44OzQ_xyaAeoQf1zS65KXQW8O98p-V68rOev8epz-TafrWKTStbFQmrclMC5RZkhgKCZ4YbaDHPJjAUwlG7yYsOZEAUvZSGthbzgGnnJJWA2JY_jbtPWvz2GTu1dMFhV2mPdB5WKVICEYgBhBE1bh9BiqZrW7XV7VEDVyZg6GVMnY-psbOg8jB2HiP_48fsHy8RnQA</recordid><startdate>19830501</startdate><enddate>19830501</enddate><creator>Zorin, A.</creator><creator>Likharev, K.</creator><creator>Turovets, S.</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19830501</creationdate><title>Dynamics of Josephson tunnel junctions with a finite-width Riedel peak</title><author>Zorin, A. ; Likharev, K. ; Turovets, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c294t-89aebf166de93e11803c6c0d3e594cd11c00b57b648876f979dd1576ae6f691e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Capacitance</topic><topic>Electrodes</topic><topic>Fluctuations</topic><topic>Frequency</topic><topic>Hysteresis</topic><topic>Microscopy</topic><topic>Physics</topic><topic>Shape</topic><topic>Tunneling</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Zorin, A.</creatorcontrib><creatorcontrib>Likharev, K.</creatorcontrib><creatorcontrib>Turovets, S.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Zorin, A.</au><au>Likharev, K.</au><au>Turovets, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dynamics of Josephson tunnel junctions with a finite-width Riedel peak</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1983-05-01</date><risdate>1983</risdate><volume>19</volume><issue>3</issue><spage>629</spage><epage>632</epage><pages>629-632</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>The basic properties of high-current-density Josephson tunnel junctions are calculated from the microscopic theory taking into account a finite width 2δ of the Riedel peak. The calculated I-V curves for the finite values of the normalized capacitance β c , the Riedel peak halfwidth δ, and the parameter α of pair current suppression are in good agreement with published experimental results for the high-current-density tunnel junctions Pb(In)-oxide-Pb. The hysteresis parameter I R /I c calculated from the microscopic theory as a function of the normalized capacitance β c is compared with the dependence following from the RSJ and the RSJN models. In addition, the low-frequency spectral density S v (0) of the voltage fluctuations across the junction is numerically found and compared with that following from the simple shot-noise model.</abstract><pub>IEEE</pub><doi>10.1109/TMAG.1983.1062475</doi><tpages>4</tpages></addata></record> |
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subjects | Capacitance Electrodes Fluctuations Frequency Hysteresis Microscopy Physics Shape Tunneling Voltage |
title | Dynamics of Josephson tunnel junctions with a finite-width Riedel peak |
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