Non-destructive read out operation of SFQ memory cells: Simulations and experimental results
Single flux quantum two junction interferometers appear as attractive memory cells for constituting dense and low dissipating arrays. In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are d...
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Veröffentlicht in: | IEEE transactions on magnetics 1983-05, Vol.19 (3), p.1262-1265 |
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creator | Matheron, G. Migny, Ph |
description | Single flux quantum two junction interferometers appear as attractive memory cells for constituting dense and low dissipating arrays. In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are defined, various possible designs are studied through static and dynamic simulations, experimental results for one of them are given. Finally, memory array concepts involving statistical analysis on electrical parameters spreads are proposed. |
doi_str_mv | 10.1109/TMAG.1983.1062344 |
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In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are defined, various possible designs are studied through static and dynamic simulations, experimental results for one of them are given. Finally, memory array concepts involving statistical analysis on electrical parameters spreads are proposed.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.1983.1062344</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>IEEE</publisher><subject>Circuit analysis computing ; Fabrication ; Frequency ; Interferometers ; Laboratories ; Nonvolatile memory ; Prototypes ; Statistical analysis ; Switches ; Voltage</subject><ispartof>IEEE transactions on magnetics, 1983-05, Vol.19 (3), p.1262-1265</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c294t-14fde3433ff659793d4b427b25b6b3e8ae54bc6923992730cceeb2d86a62f2133</citedby><cites>FETCH-LOGICAL-c294t-14fde3433ff659793d4b427b25b6b3e8ae54bc6923992730cceeb2d86a62f2133</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1062344$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27923,27924,54757</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1062344$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Matheron, G.</creatorcontrib><creatorcontrib>Migny, Ph</creatorcontrib><title>Non-destructive read out operation of SFQ memory cells: Simulations and experimental results</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>Single flux quantum two junction interferometers appear as attractive memory cells for constituting dense and low dissipating arrays. In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are defined, various possible designs are studied through static and dynamic simulations, experimental results for one of them are given. Finally, memory array concepts involving statistical analysis on electrical parameters spreads are proposed.</description><subject>Circuit analysis computing</subject><subject>Fabrication</subject><subject>Frequency</subject><subject>Interferometers</subject><subject>Laboratories</subject><subject>Nonvolatile memory</subject><subject>Prototypes</subject><subject>Statistical analysis</subject><subject>Switches</subject><subject>Voltage</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1983</creationdate><recordtype>article</recordtype><recordid>eNpNkE9Lw0AQxRdRsFY_gHjZk7fU_TPZZr2VYqtQFWm9CcsmmUAkydbdROy3NzE9eBqGee_x5kfINWczzpm-2z0v1jOuEznjTAkJcEImXAOPGFP6lEwY40mkQcE5uQjhs18h5mxCPl5cE-UYWt9lbfmN1KPNqeta6vbobVu6hrqCbldvtMba-QPNsKrCPd2WdVf93QO1TU7xp9eXNTatrfqQ0FVtuCRnha0CXh3nlLyvHnbLx2jzun5aLjZRJjS0EYciRwlSFoWK9VzLHFIQ81TEqUolJhZjSDOlhdRazCXLMsRU5ImyShSCSzklt2Pu3ruvrn_G1GUYetoGXReMSEBArKEX8lGYeReCx8Ls-87WHwxnZuBoBo5m4GiOHHvPzegpEfGffrz-Av2Ub7w</recordid><startdate>19830501</startdate><enddate>19830501</enddate><creator>Matheron, G.</creator><creator>Migny, Ph</creator><general>IEEE</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>19830501</creationdate><title>Non-destructive read out operation of SFQ memory cells: Simulations and experimental results</title><author>Matheron, G. ; Migny, Ph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c294t-14fde3433ff659793d4b427b25b6b3e8ae54bc6923992730cceeb2d86a62f2133</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1983</creationdate><topic>Circuit analysis computing</topic><topic>Fabrication</topic><topic>Frequency</topic><topic>Interferometers</topic><topic>Laboratories</topic><topic>Nonvolatile memory</topic><topic>Prototypes</topic><topic>Statistical analysis</topic><topic>Switches</topic><topic>Voltage</topic><toplevel>online_resources</toplevel><creatorcontrib>Matheron, G.</creatorcontrib><creatorcontrib>Migny, Ph</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on magnetics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Matheron, G.</au><au>Migny, Ph</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Non-destructive read out operation of SFQ memory cells: Simulations and experimental results</atitle><jtitle>IEEE transactions on magnetics</jtitle><stitle>TMAG</stitle><date>1983-05-01</date><risdate>1983</risdate><volume>19</volume><issue>3</issue><spage>1262</spage><epage>1265</epage><pages>1262-1265</pages><issn>0018-9464</issn><eissn>1941-0069</eissn><coden>IEMGAQ</coden><abstract>Single flux quantum two junction interferometers appear as attractive memory cells for constituting dense and low dissipating arrays. In this paper an investigation of cell parameters leading to Non-Destructive Read Out (NDRO) operation and non volatile storage is presented. Basic requirements are defined, various possible designs are studied through static and dynamic simulations, experimental results for one of them are given. Finally, memory array concepts involving statistical analysis on electrical parameters spreads are proposed.</abstract><pub>IEEE</pub><doi>10.1109/TMAG.1983.1062344</doi><tpages>4</tpages></addata></record> |
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subjects | Circuit analysis computing Fabrication Frequency Interferometers Laboratories Nonvolatile memory Prototypes Statistical analysis Switches Voltage |
title | Non-destructive read out operation of SFQ memory cells: Simulations and experimental results |
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