Broadband Characterization of Silicate Materials for Potential 5G/6G Applications

This paper provides a broadband dielectric characterization of different silicate substrates up to 115 GHz, to fill the gap of the properties of different kinds of glasses in a broad part of the mm-wave spectrum. Both the internal structure (crystalline or amorphous) and the chemistry of the substra...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	IEEE transactions on instrumentation and measurement 2023-01, Vol.72, p.1-1
Hauptverfasser:	Rodriguez-Cano, Rocio, Perini, Steven, Foley, Brian, Lanagan, Michael
Format:	Artikel
Sprache:	eng
Schlagworte:	Amorphous materials Broadband Characterization Dielectric loss Dielectric loss measurement Dielectric losses Dielectric properties Dielectrics Frequencies Frequency measurement Frequency ranges Glass Loss measurement material metasurface Millimeter waves Sapphire Silicates Silicon compounds Substrates transparent Wave spectra
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!